ライフサイエンスコーパス: X-ray photoelectron spectroscopy

1 btained by means of diffraction, optical and X-ray photoelectron spectroscopy.

2 omalous decrease of Mn valence measured from X-ray photoelectron spectroscopy.

3 itu using synchrotron-based ambient pressure X-ray photoelectron spectroscopy.

4 2 is characterized by Raman spectroscopy and X-ray photoelectron spectroscopy.

5 Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy.

6 try of the tethered catalysts, determined by X-ray photoelectron spectroscopy.

7 O was confirmed using elemental analysis and X-ray photoelectron spectroscopy.

8 ition potential of -0.75 V, as observed from X-ray photoelectron spectroscopy.

9 measurements, optical/solvent exposures, and X-ray photoelectron spectroscopy.

10 elation between Au and ZnO was manifested by X-ray photoelectron spectroscopy.

11 e was determined using X-ray diffraction and X-ray photoelectron spectroscopy.

12 racterized by contact angle measurements and X-ray photoelectron spectroscopy.

13 eory, temperature-programmed desorption, and X-ray photoelectron spectroscopy.

14 acquired by quite different methods such as X-ray photoelectron spectroscopy.

15 nterface, which was probed by angle-resolved X-ray photoelectron spectroscopy.

16 rmed by transmission electron microscopy and X-ray photoelectron spectroscopy.

17 the bis-pyridinyltetrazine, as determined by X-ray photoelectron spectroscopy.

18 dance spectroscopy, fluorescence imaging and X-ray photoelectron spectroscopy.

19 by cyclic voltammetry as well as UV/Vis and X-ray photoelectron spectroscopy.

20 f the NiO(x) membrane, which is confirmed by X-ray photoelectron spectroscopy.

21 ulations, and synchrotron-based near ambient X-ray photoelectron spectroscopy.

22 hemical strain microscopy and sputter-etched X-ray photoelectron spectroscopy.

23 ersive spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy.

24 form an iron-deficient sulfide, according to X-ray photoelectron spectroscopy.

25 thods including XRD, electron microscopy and X-ray photoelectron spectroscopy.

26 als on silicon substrate, as demonstrated by X-ray photoelectron spectroscopy.

27 ron microscopy, X-ray diffraction, Raman and X-ray photoelectron spectroscopy.

28 the films using photoluminescence, Raman and x-ray photoelectron spectroscopies.

29 Nuclear magnetic resonance(11), X-ray photoelectron spectroscopy(12) and cryogenic trans

30 Angle-resolved X-ray photoelectron spectroscopy analyses indicate that

31 Evidence from high resolution X-ray photoelectron spectroscopy analyses indicated that

32 X-ray photoelectron spectroscopy analysis confirmed the

33 The X-ray photoelectron spectroscopy analysis confirms the p

34 X-ray photoelectron spectroscopy analysis of ABP and ACP

35 A probable adsorption mechanism based on X-ray photoelectron spectroscopy analysis was also propo

36 According to X-ray photoelectron spectroscopy analysis, the Pd cluste

37 theory calculations and further confirmed by X-ray photoelectron spectroscopy analysis.

38 favored the reduction of Cr(VI) according to X-ray photoelectron spectroscopy analysis.

39 Both x-ray photoelectron spectroscopy and (1)H NMR data confi

40 ique degradation mechanism of GaS(0.87) with X-ray photoelectron spectroscopy and annular dark-field

41 ious gating voltage regions, as confirmed by X-ray photoelectron spectroscopy and atomic force micros

42 by Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy and atomic force micros

43 of this hydrophobic ligand was confirmed by X-ray photoelectron spectroscopy and contact angle gonio

44 X-ray photoelectron spectroscopy and electrochemistry co

45 olysulfides has been evaluated by conducting X-ray photoelectron spectroscopy and electron microscopy

46 entration of oxygen defects as determined by X-ray photoelectron spectroscopy and electron paramagnet

47 Using X-ray photoelectron spectroscopy and Fourier transform i

48 In the present study, we employed X-ray photoelectron spectroscopy and Fourier-transform i

49 Using operando ambient pressure X-ray photoelectron spectroscopy and high pressure scann

50 ugh initial CO loss as determined by in situ X-ray photoelectron spectroscopy and mass spectrometry.

51 Furthermore, valence band analysis by X-ray photoelectron spectroscopy and photoluminescence s

52 We have used X-ray photoelectron spectroscopy and polarization-resolv

53 shed by infrared, electronic absorption, and X-ray photoelectron spectroscopy and revealed formation

54 controlled electron-impact irradiation with X-ray photoelectron spectroscopy and scanning electron m

55 X-ray photoelectron spectroscopy and scanning electron m

56 and characterized using Raman spectroscopy, X-ray photoelectron spectroscopy and scanning tunneling

57 ion metal dichalcogenides by using microbeam X-ray photoelectron spectroscopy and scanning tunnelling

58 ly insulating films of WO3 Here, we use hard X-ray photoelectron spectroscopy and spectroscopic ellip

59 spectroscopy, scanning electron microscopy, X-ray photoelectron spectroscopy and transmission electr

60 y spectroscopy, powdered X-ray spectroscopy, X-ray photoelectron spectroscopy and UV-Vis diffused ref

61 aracteristics were assessed by TEM, SEM-EDX, X-ray photoelectron spectroscopy and vibrating sample ma

62 We applied cryogenic X-ray Photoelectron Spectroscopy and wet chemical analys

63 bility to bind with mercury as determined by X-ray photoelectron spectroscopy and X-ray absorption fi

64 Adsorption mechanisms were assessed using X-ray photoelectron spectroscopy and X-ray absorption sp

65 es by structural and transport measurements, X-ray photoelectron spectroscopy, and ab initio calculat

66 onfirmed by scanning tunneling spectroscopy, X-ray photoelectron spectroscopy, and complementary dens

67 ated using in situ, time- and depth-resolved X-ray photoelectron spectroscopy, and complementary gran

68 -temperature scanning tunnelling microscopy, X-ray photoelectron spectroscopy, and density functional

69 lated IR reflection absorption spectroscopy, X-ray photoelectron spectroscopy, and electrochemical im

70 roscopy, grazing incident X-ray diffraction, X-ray photoelectron spectroscopy, and Fourier transform

71 nitored using a quartz crystal microbalance, X-ray photoelectron spectroscopy, and infrared spectrosc

72 Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and ion-exchange measu

73 shington, by IR and Raman spectroscopy, XRD, X-ray photoelectron spectroscopy, and Mossbauer spectros

74 rsive X-ray spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and nitrogen adsorptio

75 ble in O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation

76 ion electron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existenc

77 and their intermediate phases of borophene; X-ray photoelectron spectroscopy, and scanning tunneling

78 infrared reflection/absorption spectroscopy, X-ray photoelectron spectroscopy, and surface plasmon re

79 rier transform infrared (FTIR) spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight sec

80 n included size, surface charge, morphology, X-ray photoelectron spectroscopy, and transmission Fouri

81 c resonance spectroscopy, mass spectrometry, X-ray photoelectron spectroscopy, and X-ray absorption s

82 microscopic images before and after growth, x-ray photoelectron spectroscopy, and x-ray diffraction

83 lectron microscopy, ultra violet-visible and X-ray photoelectron spectroscopy, and Zeta-potential.

84 In situ atmospheric-pressure X-ray photoelectron spectroscopy (AP-XPS) experiments de

85 Using ambient-pressure X-ray photoelectron spectroscopy (AP-XPS), we studied th

86 nce (LIF) spectrometry, and ambient-pressure X-ray photoelectron spectroscopy (AP-XPS).

87 Ambient-pressure X-ray photoelectron spectroscopy (APXPS) and high-pressu

88 quantum mechanics (QM) and ambient-pressure X-ray photoelectron spectroscopy (APXPS) experiments.

89 Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventi

90 strates was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transf

91 Advanced in situ electron microscopy and X-ray photoelectron spectroscopy are used to demonstrate

92 uding (23)Na solid-state NMR, Mossbauer, and X-ray photoelectron spectroscopies, are employed as prob

93 ilizing the PbS(111) facets, consistent with x-ray photoelectron spectroscopy as well as other spectr

94 tron micrographs, x-ray diffraction spectra, x-ray photoelectron spectroscopy, as well as TFT output

95 From near-ambient pressure X-ray photoelectron spectroscopy at 0.9 mbar CO2, the am

96 rface immobilization, which was confirmed by X-ray Photoelectron Spectroscopy, Atomic Force Microscop

97 face-bound molecules through high-resolution X-ray photoelectron spectroscopy, atomic force microscop

98 by X-ray diffraction, magnetic measurements, X-ray photoelectron spectroscopy, cyclic voltammetry, an

99 Temperature-programmed desorption and X-ray photoelectron spectroscopy data provide informatio

100 Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy data reveal that carbox

101 We employed microwave conductivity, X-ray photoelectron spectroscopy, diffuse reflectance sp

102 X-ray photoelectron spectroscopy, EPR, and magnetometry

103 UV-Vis, far-IR, and X-ray photoelectron spectroscopies evidence the reductio

104 X-ray diffraction and X-ray photoelectron spectroscopy experiments were used t

105 The exposed samples were investigated using X-ray photoelectron spectroscopy, Fourier transform infr

106 s of the trade include near-ambient-pressure X-ray photoelectron spectroscopy, high-pressure scanning

107 and fully studied by X-ray crystallography, X-ray photoelectron spectroscopy, hydrogen evolution exp

108 cally reduced and characterized by Raman and X-ray photoelectron spectroscopies in addition to micros

109 lyst by forming the Mo Se bond, confirmed by X-ray photoelectron spectroscopy, in which the formed Mo

110 Experiments using ambient pressure X-ray photoelectron spectroscopy indicate that methane d

111 X-ray photoelectron spectroscopy indicated that the pred

112 Cyclic voltammetry and angle resolved X-ray photoelectron spectroscopy indicated that the SAMs

113 n also altered N-CNT surface chemistry, with X-ray photoelectron spectroscopy indicating addition of

114 nfirmed by transmission electron microscopy, X-ray photoelectron spectroscopy, infrared spectra, ultr

115 Using ambient pressure X-ray photoelectron spectroscopy interpreted with quantu

116 X-ray photoelectron spectroscopy invariably detected ele

117 perties of the foam were characterized using X-ray photoelectron spectroscopy, inverse gas chromatogr

118 Combined with in situ ambient-pressure X-ray photoelectron spectroscopy, IR, and Raman spectros

119 Hard-x-ray photoelectron spectroscopy is a valuable source of

120 Finally, X-ray photoelectron spectroscopy is used to characterize

121 Here we report liquid jet X-ray photoelectron spectroscopy measurements that provi

122 A combination of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) and CO temper

123 Near ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) is a promisin

124 Using near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) we show that

125 al spectroscopy and by near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS).

126 ectroelectrochemistry, synchrotron radiation-X-ray photoelectron spectroscopy, near edge X-ray absorp

127 (57)Fe Mossbauer spectroscopy, X-ray photoelectron spectroscopy, neutron activation ana

128 ecules in the AuNP suspensions, as judged by X-ray photoelectron spectroscopy, nuclear magnetic reson

129 X-ray photoelectron spectroscopy of C 1s and Br 3d core

130 X-ray photoelectron spectroscopy of these electrochemica

131 d infrared spectroscopy, and high resolution X-ray photoelectron spectroscopy of TPI-carbons to eluci

132 In situ, depth-resolved X-ray photoelectron spectroscopy of various graphene-coa

133 Raman and X-ray photoelectron spectroscopy on BN films show no sig

134 on Si by means of operando ambient-pressure X-ray photoelectron spectroscopy performed at the solid/

135 of zero charge by means of ambient pressure X-ray photoelectron spectroscopy performed under polariz

136 X-ray photoelectron spectroscopy, Raman microscopy and s

137 X-ray photoelectron spectroscopy, Raman spectroscopy, to

138 DFT calculations, X-ray photoelectron spectroscopy, Raman, and FTIR show t

139 X-ray photoelectron spectroscopy recommends the chemical

140 The SAMs were characterized using X-ray photoelectron spectroscopy, reflection-absorption

141 The X-ray photoelectron spectroscopy results indicated that

142 X-ray photoelectron spectroscopy results show ferrate re

143 Moreover, the X-ray photoelectron spectroscopy results show that the v

144 drying and predominated the powder surface (X-ray photoelectron spectroscopy results) in both camel

145 tu X-ray absorption spectroscopy and ex situ X-ray photoelectron spectroscopy reveal that PbO(2) is u

146 spectroscopy together with ex situ Raman and X-ray photoelectron spectroscopy reveal the reversibilit

147 X-ray photoelectron spectroscopy revealed significant co

148 X-ray photoelectron spectroscopy revealed that an effect

149 X-ray photoelectron spectroscopy revealed that the hydro

150 X-ray photoelectron spectroscopy reveals that, at pH </=

151 EM) coupled with atomic force microscopy and X-ray photoelectron spectroscopy reveals the architectur

152 In situ ambient pressure X-ray photoelectron spectroscopy reveals up to a fourfol

153 The formation of the SAM was confirmed by X-ray photoelectron spectroscopy, scanning electron micr

154 by Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, scanning electron micr

155 defects formation are elucidated by means of X-Ray photoelectron spectroscopy, scanning transmission

156 uding X-ray diffraction and ambient-pressure X-ray photoelectron spectroscopy showed that the crystal

157 catalyst during the reaction, quasi in situ X-ray photoelectron spectroscopy showed that the surface

158 Ambient-pressure x-ray photoelectron spectroscopy showed that water added

159 via Rutherford backscattering spectrometry, X-ray photoelectron spectroscopy, spectroscopic ellipsom

160 microscopy (AFM), and synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) were used to e

161 with grazing incidence x-ray diffraction and x-ray photoelectron spectroscopy studies indicating that

162 X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of SNNO/LSMO he

163 tron paramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggest that th

164 tron paramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggested that

165 UV-vis spectroscopy and X-ray photoelectron spectroscopy suggest that a substitu

166 lography, X-ray absorption spectroscopy, and X-ray photoelectron spectroscopy suggest that reduction

167 X-ray photoelectron spectroscopy suggests that NaCu(4)Se

168 alues and surface oxygen concentrations from X-ray photoelectron spectroscopy suggests that surface s

169 determined using a novel approach combining X-ray photoelectron spectroscopy, surface tension measur

170 , electrochemical impedance spectroscopy and X-ray photoelectron spectroscopy techniques.

171 Through X-ray diffraction and X-ray photoelectron spectroscopy, the as-grown tungsten(

172 bly because of a P-based coating detected by X-ray photoelectron spectroscopy, the zeta potential of

173 g electrospray ionization mass spectrometry, X-ray photoelectron spectroscopy, thermogravimetric anal

174 We overcame this limitation by applying soft x-ray photoelectron spectroscopy to characterize excess

175 hotoionization aerosol mass spectrometry and X-ray photoelectron spectroscopy to confirm these predic

176 We employed ambient pressure X-ray photoelectron spectroscopy to investigate the elec

177 ron and X-ray diffraction, and Mossbauer and X-ray photoelectron spectroscopy to investigate their mo

178 ion with temperature, temperature-programmed X-ray photoelectron spectroscopy (TP-XPS) experiments ar

179 Scanning electron microscopy, X-ray photoelectron spectroscopy, transmission electron

180 erature scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy, transmission infrared

181 ibrational spectroscopy and ambient pressure X-ray photoelectron spectroscopy under catalytically rel

182 ) at ambient conditions and (ii) contactless X-ray photoelectron spectroscopy under ultrahigh vacuum.

183 copy, X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, UV-vis absorption spec

184 X-ray photoelectron spectroscopy was used to characteriz

185 X-ray photoelectron spectroscopy was utilized to determi

186 Chemical derivatization coupled to X-ray photoelectron spectroscopy was utilized to quantif

187 rgy for the metallic glasses, measured using X-ray photoelectron spectroscopy, was higher by 0.2 eV t

188 scattering beyond the dipole limit and hard X-ray photoelectron spectroscopy we establish the dual n

189 netic circular dichroism, combined with hard X-ray photoelectron spectroscopy, we derived a complete

190 f the LTS reaction, as well as complementary X-ray photoelectron spectroscopy, we observed the activa

191 ron microscopy, X-ray diffraction, Raman and X-ray photoelectron spectroscopy were employed to charac

192 tion infrared spectroscopy, ellipsometry and X-ray photoelectron spectroscopy were used to follow the

193 scopy, transmission electron microscopy, and X-ray photoelectron spectroscopy were used to understand

194 g this method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensi

195 oxide layer on the surface, as determined by X-ray photoelectron spectroscopy, which likely prevented

196 Here we combine ambient pressure X-ray photoelectron spectroscopy with quantum mechanics

197 In situ techniques (X-ray photoelectron spectroscopy, X-ray absorption spect

198 y a combination of powder X-ray diffraction, X-ray photoelectron spectroscopy, X-ray fluorescence spe

199 MIP films before and after the treatment by X-ray photoelectron spectroscopy (XPS) also evidencing t

200 condary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicate

201 X-ray photoelectron spectroscopy (XPS) analysis results

202 X-ray photoelectron spectroscopy (XPS) analysis revealed

203 recent Report, Nakamura et al argue that our x-ray photoelectron spectroscopy (XPS) analysis was affe

204 serve as a valuable tool when combined with X-ray photoelectron spectroscopy (XPS) analysis.

205 pendent X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS) and atomic multip

206 X-ray photoelectron spectroscopy (XPS) and attenuated to

207 content and aggregate size, as confirmed by X-ray photoelectron spectroscopy (XPS) and dynamic light

208 X-ray photoelectron spectroscopy (XPS) and electrochemic

209 mechanisms are also investigated in terms of X-ray photoelectron spectroscopy (XPS) and electrochemic

210 hanisms of CMP are proposed according to the X-ray photoelectron spectroscopy (XPS) and electrochemic

211 X-ray photoelectron spectroscopy (XPS) and electron micr

212 y coupled plasma-mass spectrometry (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-trans

213 tron and adsorption spectroscopy techniques [X-ray photoelectron spectroscopy (XPS) and near edge X-r

214 characterization of the prepared samples by X-ray photoelectron spectroscopy (XPS) and optimization

215 The results of X-ray photoelectron spectroscopy (XPS) and reflection-ab

216 th the substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron r

217 The system performance is validated through X-ray photoelectron spectroscopy (XPS) and the spatial d

218 The biosensor surfaces were optimized using X-ray photoelectron spectroscopy (XPS) and the ultra-hig

219 a solution interface, and observe with both X-ray photoelectron spectroscopy (XPS) and XUV-RA the ex

220 pectroscopy (FTIR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and zeta potentia

221 ere identified by fitting of high-resolution X-ray photoelectron spectroscopy (XPS) C 1s and O 1s spe

222 on scanning electron microscopy (FE-SEM) and X-ray photoelectron spectroscopy (XPS) characterization

223 X-ray photoelectron spectroscopy (XPS) characterized a t

224 ) embedded within the polymer matrix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that th

225 Infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS) confirmed the rol

226 Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate forma

227 Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate the c

228 SWCNT during the biosensor construction and X-ray photoelectron spectroscopy (XPS) experiments confi

229 pressure published data obtained by in situ X-ray photoelectron spectroscopy (XPS) for the concentra

230 s were studied for their HER activity and by X-ray photoelectron spectroscopy (XPS) for the first tim

231 nneling Microscopy (STM) in combination with X-ray Photoelectron spectroscopy (XPS) has been utilized

232 ssion electron microscopy (PEEM) and imaging X-ray photoelectron spectroscopy (XPS) have over the yea

233 (BSA) and fibronectin (FN) were measured by X-ray photoelectron spectroscopy (XPS) in ultrahigh vacu

234 X-ray photoelectron spectroscopy (XPS) is one of the mos

235 de BODIPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows esti

236 X-ray photoelectron spectroscopy (XPS) measurements conf

237 led Plasma-Mass Spectrometry (LA-ICP-MS) and X-ray photoelectron spectroscopy (XPS) measurements, whi

238 r|glassy carbon electrode (GCE), as shown by X-ray photoelectron spectroscopy (XPS) measurements.

239 termined here using a combination of SPR and X-ray photoelectron spectroscopy (XPS) measurements.

240 Ex situ X-ray photoelectron spectroscopy (XPS) of the 2-ABT modi

241 Raman and X-Ray photoelectron spectroscopy (XPS) revealed that the

242 transform infrared spectroscopy (FT-IR), and X-ray photoelectron spectroscopy (XPS) showed that the n

243 RuO(2.) While surface characterization using X-ray photoelectron spectroscopy (XPS) showed the presen

244 NMR), Fourier transform infrared (FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy conf

245 characterizations by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) support the prese

246 f this study were to evaluate the ability of X-ray photoelectron spectroscopy (XPS) to differentiate

247 ) spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for

248 Zeta potential measurements and X-ray photoelectron spectroscopy (XPS) were used to anal

249 R), X-ray absorption spectroscopy (XAS), and X-ray photoelectron spectroscopy (XPS) were used to dete

250 Comparing elemental depth-profiling by X-ray photoelectron spectroscopy (XPS) with detailed mod

251 energy-dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and (10)B and (1

252 reflection absorption spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angl

253 EM), Transmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS), and Nanoparticle

254 sive X-ray spectroscopy (EDS), quasi in situ X-ray photoelectron spectroscopy (XPS), and operando X-r

255 ansmission electron microscopy (HAADF-STEM), X-ray photoelectron spectroscopy (XPS), and powder X-ray

256 oscopy, X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS), and Raman micros

257 cules by the MIP cavities was monitored with X-ray photoelectron spectroscopy (XPS), as manifested by

258 c analysis, UV-vis, energy-dispersive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total

259 Various techniques, such as X-ray photoelectron spectroscopy (XPS), confirmed the oc

260 This new nanoparticle was characterized by X-ray photoelectron spectroscopy (XPS), dynamic light sc

261 Raman spectroscopy, photoluminescence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transfor

262 ique combination of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbau

263 Fluorescence detection, X-ray photoelectron spectroscopy (XPS), infrared spectra

264 articles have been determined by synchrotron X-ray photoelectron spectroscopy (XPS), near-edge X-ray

265 functional theory (DFT), ion chromatograph, X-ray photoelectron spectroscopy (XPS), particle size an

266 ne, and triclosan in batch experiments using X-ray photoelectron spectroscopy (XPS), Raman spectrosco

267 thermochemical exposure in combination with X-ray photoelectron spectroscopy (XPS), scanning electro

268 -BSA modified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), scanning electro

269 lver mirrors and AgNPs was confirmed through X-ray photoelectron spectroscopy (XPS), transmission ele

270 ultivariate MOFs (MTV-MOFs) were examined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visi

271 EM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), UV-vis diffuse r

272 ctroscopy, X-ray diffraction analysis (XRD), X-ray photoelectron spectroscopy (XPS), UV-Vis-NIR spect

273 structure characterization methods including X-ray photoelectron spectroscopy (XPS), V and S X-ray ab

274 ng amperometry, cyclic voltammetry (CV), and X-ray photoelectron spectroscopy (XPS), we demonstrate t

275 energy dispersive spectroscopy (SEM-EDS) and X-ray photoelectron spectroscopy (XPS), whereas the prec

276 on of the sensor surface was monitored using X-ray photoelectron spectroscopy (XPS), while the bindin

277 EM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffractio

278 cterized by UV, circular dichroism (CD), and X-ray photoelectron spectroscopy (XPS).

279 scanning electron microscopy (SEM) and Fe 2p X-ray photoelectron spectroscopy (XPS).

280 etometer (VSM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS).

281 e (QCM), surface plasmon resonance (SPR) and X-ray photoelectron spectroscopy (XPS).

282 transmission electron microscopy (TEM), and X-ray photoelectron spectroscopy (XPS).

283 ytic TiO2 powder using near-ambient-pressure X-ray photoelectron spectroscopy (XPS).

284 , transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS).

285 uniformly modified columns were assessed via X-ray photoelectron spectroscopy (XPS).

286 ere characterized by electrochemistry and by X-ray photoelectron spectroscopy (XPS).

287 ased X-ray absorption spectroscopy (XAS) and X-ray photoelectron spectroscopy (XPS).

288 ng tunneling microscopy and spectroscopy and X-ray photoelectron spectroscopy (XPS).

289 tal reflection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS).

290 reflection (GA-ATR) FT-IR spectroscopy, and X-ray photoelectron spectroscopy (XPS).

291 e and in the presence of liquids by means of X-ray photoelectron spectroscopy (XPS).

292 raction and Brunauer Emmett-Teller (BET) and X-ray Photoelectron Spectroscopy (XPS).

293 ionization (LDI) mass spectrometry (MS) and X-ray photoelectron spectroscopy (XPS).

294 the overlayer is independently determined by X-ray photoelectron spectroscopy (XPS).

295 ments, Fourier transform infrared (FTIR) and X-ray photoelectron spectroscopy (XPS).

296 r-transform infrared spectroscopy (FTIR) and X-ray photoelectron spectroscopy (XPS).

297 py (EM), powder X-ray diffraction (PXRD) and X-ray photoelectron spectroscopy (XPS).

298 electrochemical mass spectrometry (OEMS) and X-ray photoelectron spectroscopy (XPS).

299 enrichment on the compacts was confirmed by X-ray photoelectron spectroscopy (XPS).

300 leaching was observed based on quasi in situ X-ray photoelectron spectroscopy (XPS).