ライフサイエンスコーパス: XPS

1 XPS also revealed a nitrogen-containing product adsorbed

2 XPS analysis also revealed that, in the presence of wate

3 XPS analysis and rigorous control experiments confirm co

4 XPS analysis indicated more organically bound Br and les

5 XPS analysis indicates S(2-), S(2)(2-), and S (n)(2-) sp

6 XPS analysis of the magnetite electrodes polarized in ur

7 XPS analysis revealed that the binding energy for Ni 2p(

8 XPS analysis revealed the presence of doping N atoms.

9 XPS analysis showed that 23-31% and 77-69% of sorbed Hg

10 XPS and Ag K-edge XANES analysis revealed that the impre

11 XPS and TRPL measurements were performed to identify sor

12 XPS and XANES measurements confirmed the assigned oxidat

13 XPS characterization studies of Pd-NZVI show Fe(0) oxida

14 XPS data demonstrate the dependence of the N 1s binding

15 XPS indicated the presence of both W(6+) and W(4+) in th

16 XPS indicates that the metals are in the following oxida

17 XPS is shown to be an important analytical tool to inves

18 XPS is used to assess the chemical composition of the fi

19 XPS measurements indicated that nearly 50% of Ce atoms a

20 XPS of N-CDs shows a peak at 285.3eV corresponds to the

21 XPS showed a clear gradient in surface coverage along th

22 XPS showed Cl(-) and Fe(III) species with significant Fe

23 XPS spectra showed the formation of TcS(x) at pH 10.00 +

24 ed CHx or C species are detected in the C 1s XPS region.

25 Fitting of C 1s XPS spectra suggests an increase in the number of aromat

26 N 1s XPS and XAS signatures for (phen(2)N(2))Fe are remarkabl

27 the relative proportion of a 405.1 eV N 1s (XPS binding energy) species in the nanosheets.

28 n, and recombination using SCLC, GIXRD, AFM, XPS, NEXAFS, R-SoXS, TEM, STEM, fs/ns TA spectroscopy, 2

29 Pd/Au electrode was characterized by AFM and XPS as well as multiple electrochemical techniques inclu

30 From analyses carried out with AFM and XPS, the final samples exhibited a flat morphology and h

31 substrate temperature of 350 degrees C, and XPS results show the deposited silicon chloride layer sa

32 substrate temperature of 250 degrees C, and XPS results show the deposited silicon hydride layer sat

33 vis, TGA, N2-adsorption, SEM, TEM, EDAX, and XPS.

34 cess and characterized by XRD, TEM, EDS, and XPS.

35 Ingestion of EPS and XPS has been documented for a variety of marine animals,

36 ch allows quantification by fluorescence and XPS on one and the same sample.

37 We found that fluorescence and XPS signals correlate over at least 1 order of magnitude

38 Combined FTIR and XPS analyses demonstrated that the redox activity of bio

39 d N-doped carbon were confirmed by HRTEM and XPS.

40 TEM, STEM, FESEM, XRD, RAMAN, EDX, ICP, and XPS confirmed the formation of 1T phase and defective si

41 hniques (CP/MAS (13)C NMR, Raman, FT-IR, and XPS) and high-resolution transmission electron microscop

42 ctionalized precursors and FT-IR, Raman, and XPS analyses of the resulting GNRs.

43 re confirmed by CP/MAS (13)C NMR, Raman, and XPS spectroscopy.

44 Cu-NPs to the membrane surface with SEM and XPS after exposing the membrane to bath sonication.

45 SEM and XPS analysis are employed to characterize the electrodes

46 e art techniques including XRD, TEM, SEM and XPS.

47 y a variety of tools, e.g., TEM, UV/vis, and XPS spectroscopies.

48 x 10(13) molecules/cm(2) by voltammetric and XPS analyses.

49 More intriguingly, XANES and XPS results revealed complex redox transformation of the

50 haracterization techniques such as XANES and XPS, we were able to demonstrate that 10 nm Co NPs canno

51 nalysis by X-ray crystallography, XANES, and XPS.

52 XAS and XPS confirm that the regulated chemical interface optimi

53 yers on UO2 were characterized using XAS and XPS.

54 UV/Vis., FTIR spectroscopy, powder XRD, and XPS techniques.

55 In situ XRD-PDF, XAFS and AP-XPS structural studies reveal that the inverse ZrO(2)/Cu

56 Combining the newly constructed AP-XPS system, "dip &pull" approach, with a "tender" X-ray

57 ressure X-ray photoelectron spectroscopy (AP-XPS) experiments demonstrated that oxidized platinum Pt-

58 ressure X-ray photoelectron spectroscopy (AP-XPS), we studied the adsorption and reactions of CO2 and

59 ressure X-ray photoelectron spectroscopy (AP-XPS).

60 hin-film approach and the use of "tender" AP-XPS highlighted in this study is an innovative new appro

61 An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kineti

62 Furthermore, ER/AR-XPS is shown to facilitate the determination of areic de

63 mentary energy and angle-resolved XPS (ER/AR-XPS) in the Si 2p core-level region was used to analyze

64 us phase protein in the feed emulsion and by XPS measurements from the powder surface.

65 ng structure on the BDD surface, assessed by XPS.

66 as well as the membrane characterization by XPS, water uptake, permselectivities, and electrical res

67 functionalized surface was characterized by XPS, electrochemistry, AFM, and STM.

68 lacing with Si-H termination as confirmed by XPS, and STS results confirm the saturated Si-Hx bilayer

69 lk electrolysis experiments was confirmed by XPS.

70 ty of Tc is Tc(IV), which is corroborated by XPS measurements.

71 ) is demonstrated to be hardly detectable by XPS measurements because of the short extent of the spac

72 fter reaction with triclosan was detected by XPS survey scans, while no Cl was detected in MnOx-pheno

73 centration of Ni on the surface evidenced by XPS and microcalorimetry.

74 u(I) and more Au(0), as is also evidenced by XPS.

75 ation reaction has also been investigated by XPS and showed components related to the carboxylic grou

76 si-equilibrium surface densities measured by XPS corroborates the hypothesis that surface interaction

77 h results in domain fracture, is revealed by XPS analysis and ozone-dosing experiments.

78 Cr XPS analysis indicates reduction to Cr(III) and the form

79 of these experiments, revealed by cryogenic XPS, provides further evidence that CIP oxidation procee

80 ) state, including by X-ray crystallography, XPS, and DFT calculations, all of which confirm metal-ce

81 Sputter-down XPS demonstrates survival of surface C-Si-O-Si groups in

82 The HRSEM/EDS/XPS analysis confirmed successful immobilization of clay

83 characterized with SEM, XRD, TEM, SAED, EDX, XPS, UV-visible spectroscopy, and open-circuit potential

84 measurements, FT-IR spectroscopy, SEM, EDX, XPS, and TEM.

85 lectrochemical impedance spectroscopy (EIS), XPS, and PM-IRRAS measurements as well as by AFM imaging

86 fully characterized using electrochemistry, XPS, and AFM, and switching between open and closed form

87 By employing XPS, UPS and UV-Vis diffuse reflectance spectroscopy for

88 ch as SESSA, when combined with experimental XPS and STEM measurements, advances the ability to quant

89 at may be either expanded (EPS) or extruded (XPS) is a rigid, lightweight insulating thermoplastic th

90 FTIR, XPS, and the surface charge distribution were performed

91 The grafting yields obtained by FTIR, XPS, and elemental analysis for core shell LiFePO4-C are

92 Product characterization by FTIR, XPS, Raman Spectroscopy, TEM, XRD, TOC, collectively dem

93 rized by several techniques including: FTIR, XPS, TGA, XRD, and XANES to probe their integrity.

94 ation was further studied with ESI-MS, FTIR, XPS and XANES characterizations.

95 characterization, including (13)C NMR, FTIR, XPS, UV-vis, DLS, and TEM.

96 Characterization based on FTIR, XPS, XRD, Raman spectroscopy, FE-SEM, HR-TEM, AFM, UV-Vi

97 sing a suite of spectroscopic (UV-vis, FTIR, XPS) and microscopic (AFM, SEM, and TEM) techniques.

98 mposite was characterized by TEM, XRD, FTIR, XPS, TGA, BET, and CV using the redox couples [Fe(CN)6](

99 by demonstrated by combined PEEM and imaging XPS investigation of neutrophils and their activation pr

100 In addition, use of visible light-induced XPS for chemically resolved electrical measurements (CRE

101 A nanoparticles were characterized by FT-IR, XPS, TEM, and SEM.

102 ce lifetime imaging, Raman, FTIR, TGA, KPFM, XPS, NMR and EPR clearly show that the properties of C(3

103 Employment of synchrotron-based methods (XPS; reference-free total reflection X-ray fluorescence,

104 Moreover, XPS analysis demonstrated that Zr(IV) interacts with oxa

105 The ICP-MS, XPS and FTIR data indicated that the P content on the Y-

106 ion and surface sensitivity of lab-based NAP-XPS, which affect precision and accuracy of the quantita

107 essure X-ray photoelectron spectroscopy (NAP-XPS) and CO temperature-programmed reduction (CO-TPR) sh

108 essure X-ray photoelectron spectroscopy (NAP-XPS) is a promising method to close the "pressure gap",

109 essure X-ray photoelectron spectroscopy (NAP-XPS) we show that a time scale of hours (t>/=4 h) is req

110 essure X-ray photoelectron spectroscopy (NAP-XPS).

111 ction (TPSR), near-ambient pressure XPS (NAP-XPS), and inelastic neutron scattering (INS)) were appli

112 techniques, including ATR FT-IR, HRMAS NMR, XPS, and EDX spectroscopy.

113 med by an array of techniques including NMR, XPS, and Raman spectroscopy, X-ray pair distribution fun

114 , but did not fully account for the observed XPS signal from the Au-core.

115 Analyses of XPS high-resolution spectra suggest that the Mn(III) con

116 The results of XPS studies reveal that sufficient O-C=O groups present

117 id-phase products using X-ray photoelectron (XPS) and absorption spectroscopies (XAS) show that the a

118 Postreaction XPS showed that the majority of adsorbed arsenic existed

119 othesis is not generally valid by presenting XPS spectra and a consistent model of atomic processes o

120 An ambient pressure XPS (AP-XPS) endstation that is capable of detecting hig

121 rface reaction (TPSR), near-ambient pressure XPS (NAP-XPS), and inelastic neutron scattering (INS)) w

122 Experiments of ambient pressure XPS indicate that methane dissociates on Ni/CeO2 at temp

123 s observed, which was characterized by PXRD, XPS, and TEM techniques.

124 AlO)3Si(OH) sites are characterized by PXRD, XPS, DRIFTS of adsorbed NH3, CO, and pyridine, and (29)S

125 spectroscopy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of 10-100 nm thick PEDOT(PSS) film

126 ing conditions by fitting of high-resolution XPS U 4f spectra.

127 Complementary energy and angle-resolved XPS (ER/AR-XPS) in the Si 2p core-level region was used

128 using XANES, EXAFS, TEM, and depth-resolved XPS.

129 ite and ball with optical profilometry, SEM, XPS and Auger spectroscopy.

130 s were thoroughly characterized by TEM, SEM, XPS, FTIR, and nitrogen-adsorption surface area analysis

131 d phosphorus, and characterized by XRD, SEM, XPS, XRF, SAED and TEM measurements.

132 Ex situ XPS and XRD both show significant oxidation of the irrad

133 In situ XPS confirms the contribution of the heteropoly acid sup

134 The in situ XPS data and DFT calculations show that the chemical ori

135 oxidation of Pt nanoparticles using in situ XPS.

136 Both X-ray photoelectron spectrometry (XPS) and UV-vis results suggest that Con A binding with

137 X-ray photoelectron spectroscopic (XPS) analysis of C and N binding energies throughout the

138 Spectroscopy (XPS and XANES) solid analyses identified U (VI), As (-I

139 X-ray Photo Electron Spectroscopy (XPS) and Quartz Crystal Microbalance with Dissipation (Q

140 maging and X-ray photoelectric spectroscopy (XPS).

141 eatment by X-ray photoelectron spectroscopy (XPS) also evidencing the correlation between MIP chemica

142 d (IR) and X-ray photoelectron spectroscopy (XPS) analyses indicate citrate anions are adsorbed on Au

143 -SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicated binding of thiol- and amine-cont

144 emical and X-ray photoelectron spectroscopy (XPS) analyses of the reduced platinum evidence the prese

145 X-ray photoelectron spectroscopy (XPS) analysis results showed a decrease in Cr content on

146 X-ray photoelectron spectroscopy (XPS) analysis revealed that HDEHP was highly concentrate

147 e that our x-ray photoelectron spectroscopy (XPS) analysis was affected by the presence of formate sp

148 bined with X-ray photoelectron spectroscopy (XPS) analysis.

149 opy (XAS), X-ray photoelectron spectroscopy (XPS) and atomic multiplet cluster calculations, we have

150 X-ray photoelectron spectroscopy (XPS) and attenuated total reflectance Fourier transform

151 lysis with X-ray photoelectron spectroscopy (XPS) and attenuated total reflectance fourier transform

152 (AFM), and X-ray photoelectron spectroscopy (XPS) and compared with a protein/lectin microarray.

153 nfirmed by X-ray photoelectron spectroscopy (XPS) and dynamic light scattering (DLS) experiments, whi

154 X-ray photoelectron spectroscopy (XPS) and electrochemical impedance spectroscopy (EIS) we

155 n terms of X-ray photoelectron spectroscopy (XPS) and electrochemical measurements.

156 ing to the X-ray photoelectron spectroscopy (XPS) and electrochemical measurements.

157 X-ray photoelectron spectroscopy (XPS) and electron microprobe analysis revealed a complex

158 (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-transform infrared spectroscopy (FTIR)

159 echniques [X-ray photoelectron spectroscopy (XPS) and near edge X-ray adsorption fine structure spect

160 samples by X-ray photoelectron spectroscopy (XPS) and optimization of the RIMS setup for this purpose

161 results of X-ray photoelectron spectroscopy (XPS) and reflection-absorption infrared spectroscopy (RA

162 s based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of

163 ed through X-ray photoelectron spectroscopy (XPS) and the spatial distribution of copper within the n

164 ized using X-ray photoelectron spectroscopy (XPS) and the ultra-high frequency electromagnetic piezoe

165 X-ray photoelectron spectroscopy (XPS) and valence band studies were also used for the fir

166 with both X-ray photoelectron spectroscopy (XPS) and XUV-RA the existence of Fe(III) at the surface

167 ion (XRD), X-ray photoelectron spectroscopy (XPS) and zeta potential measurements.

168 resolution X-ray photoelectron spectroscopy (XPS) C 1s and O 1s spectra.

169 E-SEM) and X-ray photoelectron spectroscopy (XPS) characterization results showed the presence of the

170 X-ray photoelectron spectroscopy (XPS) characterized a transient surface Fe(III) species d

171 ix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that they exist in the zero valent oxidat

172 X-ray photoelectron spectroscopy (XPS) confirmed the formation of the anchored ligands as

173 -FTIR) and X-ray photoelectron spectroscopy (XPS) confirmed the role of phosphates and carboxylate gr

174 (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate formation of self-terminating organic m

175 (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate the covalent modification of the nanopa

176 uction and X-ray photoelectron spectroscopy (XPS) experiments confirmed covalent immobilization of LO

177 We use X-ray photoelectron spectroscopy (XPS) for characterization of voltage drop variations of

178 by in situ X-ray photoelectron spectroscopy (XPS) for the concentration of Ce(3+) (the reactive speci

179 ity and by X-ray photoelectron spectroscopy (XPS) for the first time; MoB2 and beta-MoB show excellen

180 ation with X-ray Photoelectron spectroscopy (XPS) has been utilized to characterize the network struc

181 nd imaging X-ray photoelectron spectroscopy (XPS) have over the years been powerful tools in classica

182 easured by X-ray photoelectron spectroscopy (XPS) in ultrahigh vacuum at room temperature.

183 Our X-ray photoelectron spectroscopy (XPS) investigation revealed a distinctive atomic structu

184 X-ray photoelectron spectroscopy (XPS) is one of the most used methods in a diverse field

185 metry, and X-ray photoelectron spectroscopy (XPS) label allows estimation of the labeling ratio, i.e.

186 X-ray photoelectron spectroscopy (XPS) measurements confirms n-doping of the films by BV m

187 CP-MS) and X-ray photoelectron spectroscopy (XPS) measurements, which were also used to estimate thic

188 s shown by X-ray photoelectron spectroscopy (XPS) measurements.

189 of SPR and X-ray photoelectron spectroscopy (XPS) measurements.

190 Ex situ X-ray photoelectron spectroscopy (XPS) of the 2-ABT modified electrodes suggests that surf

191 Raman and X-Ray photoelectron spectroscopy (XPS) revealed that the synthesized few-layer WS(2) films

192 T-IR), and X-ray photoelectron spectroscopy (XPS) showed that the nanowires had Si3N4@SiOx core-shell

193 tion using X-ray photoelectron spectroscopy (XPS) showed the presence of Pd(0), Pd(II), Ru(III) and R

194 FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy confirmed alkoxy-terminated surfaces a

195 X-ray photoelectron spectroscopy (XPS) studies confirm that at the sample surface nitrogen

196 oscopy and X-ray photoelectron spectroscopy (XPS) support the presence of thin graphitic edges and re

197 ability of X-ray photoelectron spectroscopy (XPS) to differentiate rice macromolecules and to calcula

198 (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for lignin-free model biomass samples

199 ements and X-ray photoelectron spectroscopy (XPS) were used to analyse the silicon nitride surface fo

200 -FTIR) and X-ray photoelectron spectroscopy (XPS) were used to characterize foulants on membrane surf

201 (XAS), and X-ray photoelectron spectroscopy (XPS) were used to determine the composition of the adsor

202 ofiling by X-ray photoelectron spectroscopy (XPS) with detailed modeling and simulation of the optica

203 (TOF-SIMS, X-ray photoelectron spectroscopy (XPS)) were used in combination with simulations (density

204 opy (EDS), X-ray photoelectron spectroscopy (XPS), and (10)B and (11)B solid-state nuclear magnetic r

205 y (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angles of water.

206 (SEM-EDX), X-ray photoelectron spectroscopy (XPS), and Fourier transform infrared (FTIR) analysis of

207 opy (TEM), X-ray Photoelectron Spectroscopy (XPS), and Nanoparticle Size Analyzer.

208 si in situ X-ray photoelectron spectroscopy (XPS), and operando X-ray absorption near-edge structure

209 ADF-STEM), X-ray photoelectron spectroscopy (XPS), and powder X-ray diffraction (PXRD).

210 opy (XAS), X-ray photoelectron spectroscopy (XPS), and Raman microscopy.

211 an spectroscopy, photoelectron spectroscopy (XPS), and SQUID magnetometry to gain information on its

212 y (FT-IR), X-ray photoelectron spectroscopy (XPS), and x-ray diffraction (XRD).

213 tored with X-ray photoelectron spectroscopy (XPS), as manifested by a negative shift of the binding e

214 ive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total reflectance Fourier transform inf

215 s, such as X-ray photoelectron spectroscopy (XPS), confirmed the occurrence of both sulfur functional

216 terized by X-ray photoelectron spectroscopy (XPS), dynamic light scattering (DLS), and infrared spect

217 ence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), at

218 ion (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbauer spectroscopy, and magnetization

219 detection, X-ray photoelectron spectroscopy (XPS), infrared spectra (FT-IR), and pH influence studies

220 ynchrotron X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure (NEXAFS)

221 matograph, X-ray photoelectron spectroscopy (XPS), particle size analysis, and fluorescence spectrum

222 ents using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and aqueous chemistry measurem

223 opy (TEM), X-ray photoelectron spectroscopy (XPS), Re K-edge X-ray absorption near-edge structure (XA

224 terized by X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM), quartz crystal

225 ation with X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and in situ X-

226 y (FT-IR), X-ray photoelectron spectroscopy (XPS), thermogravimetric analysis (TGA), and transmission

227 ed through X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), energy dis

228 xamined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visible diffuse reflectance spectra (U

229 opy (TEM), X-ray photoelectron spectroscopy (XPS), UV-vis diffuse reflectance spectroscopy (DRS), pho

230 sis (XRD), X-ray photoelectron spectroscopy (XPS), UV-Vis-NIR spectroscopy and Fourier transform infr

231 including X-ray photoelectron spectroscopy (XPS), V and S X-ray absorption near-edge spectroscopy (X

232 terized by X-ray photoelectron spectroscopy (XPS), water contact angle, ellipsometry, and atomic forc

233 (CV), and X-ray photoelectron spectroscopy (XPS), we demonstrate that histamine oxidation requires a

234 M-EDS) and X-ray photoelectron spectroscopy (XPS), whereas the precise quantitative measurement of th

235 ored using X-ray photoelectron spectroscopy (XPS), while the binding of cocaine to surface-attached M

236 opy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and UV-Vis diffuse reflec

237 and Fe 2p X-ray photoelectron spectroscopy (XPS).

238 (XRD), and X-ray photoelectron spectroscopy (XPS).

239 (SPR) and X-ray photoelectron spectroscopy (XPS).

240 (TEM), and X-ray photoelectron spectroscopy (XPS).

241 t-pressure X-ray photoelectron spectroscopy (XPS).

242 (TEM) and X-ray photoelectron spectroscopy (XPS).

243 sessed via X-ray photoelectron spectroscopy (XPS).

244 try and by X-ray photoelectron spectroscopy (XPS).

245 (BET) and X-ray Photoelectron Spectroscopy (XPS).

246 (XAS) and X-ray photoelectron spectroscopy (XPS).

247 oscopy and X-ray photoelectron spectroscopy (XPS).

248 (TXRF) and X-ray photoelectron spectroscopy (XPS).

249 scopy, and X-ray photoelectron spectroscopy (XPS).

250 y means of X-ray photoelectron spectroscopy (XPS).

251 y (MS) and X-ray photoelectron spectroscopy (XPS).

252 ermined by X-ray photoelectron spectroscopy (XPS).

253 (FTIR) and X-ray photoelectron spectroscopy (XPS).

254 metry, and X-ray photoelectron spectroscopy (XPS).

255 (FTIR) and X-ray photoelectron spectroscopy (XPS).

256 (PXRD) and X-ray photoelectron spectroscopy (XPS).

257 (OEMS) and X-ray photoelectron spectroscopy (XPS).

258 nfirmed by X-ray photoelectron spectroscopy (XPS).

259 si in situ X-ray photoelectron spectroscopy (XPS).

260 (CD), and X-ray photoelectron spectroscopy (XPS).

261 action (XRD), x-ray photo-electron spectrum (XPS), electrochemical impedance spectroscopy (EIS) and c

262 diation-X-ray photoelectron spectroscopy (SR-XPS) were used to elucidate the mechanism of the POT thi

263 copy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of 10-100 nm thick PEDOT(PSS) films.

264 phologies (SEM), porosities (BET), surfaces (XPS, O2-TPD/MS), and electrochemical properties (Tafel a

265 from ab initio calculations and synchrotron XPS measurements emphasize the importance of complementa

266 According to depth profile synchrotron XPS and X-ray diffraction (XRD) analysis, metallic ruthe

267 Characterization by TEM, XPS, and UV-vis spectroscopy shows that Au and Cu are al

268 was characterised by UV-vis, XRD, FTIR, TEM, XPS and Raman spectroscopy techniques.

269 The results of the study showed that XPS was able to differentiate rice polysaccharides (main

270 TIR spectra for the C = N and C-N bonds, the XPS spectra for the Li-N bonds from nMOF-867, and a visu

271 imprinted polymer (MIP) was confirmed by the XPS analysis.

272 (CLS) are determined and interpreted in the XPS.

273 Lately, the XPS/PEEM based elemental analysis and characterization i

274 ated elemental compositions that matched the XPS elemental compositions.

275 escape depth ( approximately 3-4 nm) of the XPS and NEXAFS photoelectrons used for analysis at 413 K

276 ic marker are obtained by calibration of the XPS methods with reference-free TXRF.

277 An analysis of the XPS results obtained after exposing zinc oxide/copper (1

278 ual sites in the experiments, we predict the XPS binding energy shift and CO vibrational frequency fo

279 ons are proposed during CMP according to the XPS and electrochemical measurements.

280 e molecules can be determined when using the XPS component intensity of the silane's silicon atom.

281 microbalance experiments, correlate with the XPS surface concentration, which provides unique evidenc

282 he label on the surface is available through XPS and photometry, a novel method to quantitatively acc

283 According to XPS and Raman, the positive charge is proposed to transf

284 ing of quantitative fluorescence analysis to XPS quantification.

285 to covalent coupling, as corroborated by TP-XPS of C 1s core levels.

286 grammed X-ray photoelectron spectroscopy (TP-XPS) experiments are performed for a prototypical model

287 within these hosts have been achieved using XPS, TGA-MS, high resolution synchrotron X-ray diffracti

288 The NPs were characterized using XPS and scanning transmission electron microscopy (STEM)

289 e of NPSi and metal ions immersed-NPSi using XPS characterization.

290 H-SiC vertical heterostructure studied using XPS and UV-Vis-NIR spectroscopy.

291 ed by increasing Al and O concentrations via XPS and intense C( horizontal line O)O(-) stretching ban

292 ficant mass loss from the brush layer, while XPS studies confirm that exposure to UV radiation produc

293 lowing catalyst separation, which along with XPS characterization supports the fact that the effects

294 n details using FT-IR, UV/vis., FESEM, XEDS, XPS, TEM, and XRD techniques.

295 XRD, XPS, and ESR suggested the Na2Mo4O13/alpha-MoO3 hybrid c

296 aphene oxide according to the SEM, EDS, XRD, XPS, Raman and TGA results.

297 FESEM, XRD, XPS, EDS and ATR analysis were employed to characterize

298 FTIR, XRD, XPS, and HRTEM measurements corroborate the formation of

299 With the aid of XRD, XPS, and GC-MS analysis, we confirm DMTS could undergo a

300 were characterized by TEM, SEM, UV-Vis, XRD, XPS, EIS, fluorescence, and photoelectrochemical method