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1 adation of cell membranes and thus premature device failure.
2 sulting in sensor performance compromise and device failure.
3 evolution of conduction channel and eventual device failure.
4 often hampered by specific complications and device failure.
5 aortic arch appear to be predictive of early device failure.
6 ic morphology was analyzed for predictors of device failure.
7 y malfunctions were the most common cause of device failure.
8 device malfunction and the likely effects of device failure.
9 most common reason for catheter exchange was device failure.
10 nsive, expensive, and burdensome sequelae of device failure.
11 rature rise and thermal stress, resulting in device failure.
12 esult in membrane delamination and, thereby, device failure.
13 e potential for bleeding, tissue damage, and device failure.
14 gnificantly contributes to complications and device failure.
15 r resulting in nanoscale hotspots leading to device failures.
16 nufacturers in identifying potentially fatal device failures.
17 ons [27.1%]) accounted for half of the total device failures.
18 q(3) as well as for crystallization-assisted device failures.
19 n a substrate which could cause catastrophic device failures.
21 521 [2.3%]; aHR, 0.42; 95% CI, 0.13-1.40) or device failure (40 of 675 [5.9%] vs 48 of 521 [9.2%]; aH
23 fe of batteries, which increases the risk of device failure and causes uncertainty among patients.
24 may be associated with a lower incidence of device failure and infection, but with more thromboembol
25 nts with BAV stenosis showed higher rates of device failure and periprocedural complications as compa
26 gher rate of complications, higher chance of device failure, and worse visual outcomes than observed
27 logistic regression identified only closure device failure as an independent predictor of a vascular
28 probability of survival free from stroke and device failure at 2 years as compared with a pulsatile d
31 thrombophlebitis, or exit site concerns) and device failure, defined as catheter removal following de
34 ral catheters (PICCs) may reduce the risk of device failure due to infectious, thrombotic, and cathet
35 ere referred for PICC placement, the risk of device failure due to noninfectious or infectious compli
36 crystal stress increased the probability of device failure from 6 to 20%, while an inhomogeneous car
39 nferior to the BGI with regard to time until device failure (hazard ratio [HR], 0.83; confidence inte
40 risk, 1.58 [95%CI: 0.91-2.73], P=0.133) and device failure in 4.7% versus 5.4% (relative risk, 0.86,
43 owever, BCP interlayers has shown to lead to device failure, mainly due to the clustering of BCP mole
46 examine the life expectancy, breakdown, and device failure of engineered skeletal muscle bio-bots as
53 epends primarily on the advisory's estimated device failure rate and the likely effects of device fai
54 to a low, but potentially life-threatening, device failure rate found during postoperative testing.
55 For pacemaker-dependent patients, advisory device failure rates exceeding 0.3% warrant device repla
56 in the study group had device malfunction or device failure requiring replacement (16.2% vs. 8.8%), a
57 ing contacts leads to energy dissipation and device failure, resulting in massive economic and enviro
59 fibrillator (ICD) shocks are associated with device failure, significant morbidity, and increased mor
63 ndard-polyurethane group, the odds ratio for device failure was 0.96 (95% CI, 0.51 to 1.78), and in t
64 minutes [IQR, 1.0-2.0]; P <.001) and closure device failure was also significantly lower among those
68 ntion has been given to predicting premature device failure where the device fails within several hun
70 so discusses strategies for managing closure device failure, with the goal of minimizing vascular com