ライフサイエンスコーパス: ellipsometry

1 uced membrane fluidity (measured by infrared ellipsometry).

2 were evaluated by total internal reflection ellipsometry.

3 olipid bilayers using neutron reflection and ellipsometry.

4 n microscopy, epifluorescence microscopy and ellipsometry.

5 (2) as determined via infrared spectroscopic ellipsometry.

6 c force microscopy, UV-vis spectroscopy, and ellipsometry.

7 ion, as well as Raman, IR, and spectroscopic ellipsometry.

8 s environments by employing in situ infrared ellipsometry.

9 elength range 190-850 nm using spectroscopic ellipsometry.

10 ymers, as confirmed by FTIR spectroscopy and ellipsometry.

11 ures up to 800 degrees C using spectroscopic ellipsometry.

12 osphatidylserine monolayers was estimated by ellipsometry.

13 dielectric function (<epsiloni>) obtained in ellipsometry.

14 properties are evaluated with spectroscopic ellipsometry.

15 er transform spectroscopy, and spectroscopic ellipsometry.

16 nied change in bilayer thickness detected by ellipsometry.

17 immunoreactions in total internal reflection ellipsometry.

18 ntal data from microslit electrokinetics and ellipsometry.

19 total reflection infrared spectroscopy, and ellipsometry.

20 plasmon resonance (SPR) imaging and imaging ellipsometry.

21 electrochemical impedance spectroscopy, and ellipsometry.

22 lled carbon nanotubes (CNT) by spectroscopic ellipsometry.

23 is differentiable from the background using ellipsometry.

24 om IR absorbance values are substantiated by ellipsometry.

25 events on the grating were also confirmed by ellipsometry.

26 consistent with the results of spectroscopic ellipsometry, a standard surface technique.

27 sonance energy through in situ spectroscopic ellipsometry allowed the nanoparticles to be easily cont

28 le Mass spectrometry (QMS) and spectroscopic ellipsometry analyses to evaluate the residence time of

29 The ellipsometry analysis showed that both the real and imag

30 ness was evaluated by using a combination of ellipsometry and AFM height profiling, accompanied by se

31 We therefore used the techniques of ellipsometry and atomic force microscopy (AFM) to invest

32 Ellipsometry and Fourier transform-infrared (FT-IR) data

33 iodooctane directly after spin-coating using ellipsometry and ion beam analysis, while using small an

34 al activity and LPS binding as observed from ellipsometry and isothermal titration calorimetry.

35 (GSH), has been developed by combination of ellipsometry and Kretschmann surface plasmon resonance (

36 Here we report far-infrared ellipsometry and low-frequency dielectric measurements i

37 After transfer to a gold surface, ellipsometry and PM IRRAS yield tilt angles of 29 +/- 4

38 In this study, we used ellipsometry and quartz-crystal microbalance with dissip

39 angle measurements, atomic force microscopy, ellipsometry and scanning electron microscopy were used

40 of the multilayer structure was verified by ellipsometry and sensor function characterized electroch

41 Ellipsometry and surface plasmon resonance spectroscopy

42 on these surfaces was characterized by using ellipsometry and the orientational behavior of liquid cr

43 knesses of the membranes were measured using ellipsometry and were in good agreement with the values

44 surfaces were characterized by spectroscopic ellipsometry and wetting.

45 Reflection-absorption infrared spectroscopy, ellipsometry and X-ray photoelectron spectroscopy were u

46 the optical layer thickness (determined with ellipsometry) and the acoustic layer thickness (determin

47 ron spectroscopy (XPS), water contact angle, ellipsometry, and atomic force microscopy (AFM).

48 c voltammetry, scanning electron microscopy, ellipsometry, and atomic force microscopy were used to c

49 using atomic force microscopy, spectroscopic ellipsometry, and reflection-absorption infrared spectro

50 cular dichroism spectroscopy, Mueller matrix ellipsometry, and simulation using theoretical scatterin

51 terized by water contact angle measurements, ellipsometry, and X-ray photoelectron spectroscopy.

52 ansform infrared spectroscopy, spectroscopic ellipsometry, and X-ray photoemission spectroscopy shows

53 and characterized comprehensively by RAIRS, ellipsometry, and XPS.

54 Raman spectroscopy and ellipsometry are also consistent with the "In-P-Ge3" bui

55 These findings establish spectroscopic ellipsometry as a powerful technique for optimizing mate

56 h modification step was monitored by imaging ellipsometry as the thickness increased with each modifi

57 Here we present ellipsometry-based measurements and models of the intera

58 ilized SAv is quantified using spectroscopic ellipsometry by monitoring binding of biotinylated probe

59 ere characterized by ultraviolet absorption, ellipsometry, circular dichroism, and polarized Fourier

60 py, X-ray and UV photoelectron spectroscopy, ellipsometry, contact angle goniometry, differential pul

61 The monolayers were characterized by ellipsometry, contact angle goniometry, polarization mod

62 s characterized using infrared spectroscopy, ellipsometry, contact angle measurements, and atomic for

63 n spectroscopy, quartz crystal microbalance, ellipsometry, contact angle measurements, atomic force m

64 of the OTMS SAMs and characterization using ellipsometry, contact angle, atomic force microscopy (AF

65 We have applied surface-enhanced ellipsometry contrast (SEEC) imaging for time-resolved l

66 ped a unique technique, wet-surface enhanced ellipsometry contrast (Wet-SEEC), which magnifies the co

67 urface characterization techniques including ellipsometry, cyclic voltammetry (CV), and X-ray photoel

68 model for analysis of in-situ spectroscopic ellipsometry data in the photon energy range of 0.7-3.4

69 sufficient to explain in-situ spectroscopic ellipsometry data measured within and across multiple cy

70 data linearly correlated with spectroscopic ellipsometry data on the same samples with a scatter of

71 The use of the limited Lifshitz theory and ellipsometry data would seem to provide a suitable best

72 The RAIR spectra, ellipsometry data, and wetting properties show that the

73 ished by fluorescence microscopy and imaging ellipsometry data.

74 ncluding: UV-vis spectroscopy, spectroscopic ellipsometry, electrochemistry, synchrotron X-ray reflec

75 uartz Crystal Microbalance with Dissipation, Ellipsometry, Force Spectroscopy and Neutron Reflectomet

76 GSL and antibody films were confirmed using ellipsometry, Fourier transform infrared spectroscopy (F

77 (XPS), electron microprobe microscopy (EMP), ellipsometry, Fourier transform infrared spectroscopy (F

78 nd dry polymer brushes were analyzed by AFM, ellipsometry, FT-IRRAS, and surface plasmon resonance (S

79 s carried out by sessile drop contact angle, ellipsometry, grazing angle FT-IR spectroscopy, and elec

80 ntages make the technique of optical imaging ellipsometry (IE) highly suitable for quantitative chara

81 plasmon resonance imaging (SPRI) and imaging ellipsometry (IE) measurements are realized with a singl

82 bly, both X-ray scattering and spectroscopic ellipsometry indicate that the substrate exerts a neglig

83 ntial grafting of initiator and polymer, and ellipsometry indicated the formation of polymer coatings

84 ained by atomic force microscopy and imaging ellipsometry indicating continuous transport and deposit

85 for the validation of the porosity results, ellipsometry, interference fringes method (IFM), and foc

86 We perform generalized spectroscopic ellipsometry measurements and finite element method comp

87 crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneo

88 during electrodeposition with spectroscopic ellipsometry measurements in order to ensure accurate in

89 quartz crystal microbalance-dissipation and ellipsometry measurements in order to investigate how a

90 Using spectroscopic ellipsometry measurements on GaP(1-x)Bi(x)/GaP epitaxial

91 troscopy, Raman microscopy and spectroscopic ellipsometry measurements on hBN confirm the formation o

92 rrent-voltage and simultaneous spectroscopic ellipsometry measurements on structures of the kind Al/M

93 Spectroscopic ellipsometry measurements reveal a 40-50% reduction in t

94 Ellipsometry measurements show that the films are highly

95 monolayers using epifluorescence and imaging ellipsometry measurements.

96 by combined quartz crystal microbalance and ellipsometry measurements.

97 e material was determined from spectroscopic ellipsometry measurements.

98 Nonlinear optical null ellipsometry (NONE) measurements of chiral interfaces al

99 nabled simultaneous nonlinear optical Stokes ellipsometry (NOSE) and polarized laser transmittance im

100 The application of nonlinear optical Stokes ellipsometry (NOSE) coupled with principal component ana

101 Mid-infrared (IR) ellipsometry of thin films and molecule layers at solid-

102 e absolute thicknesses determined by XPS and ellipsometry on dried films and quartz crystal microbala

103 eatures were characterized by contact angle, ellipsometry, optical, and atomic force microscopies.

104 ron and X-ray reflectivity and spectroscopic ellipsometry over a wide range of relative humidity (RH)

105 eement with the responses predicted from SHG ellipsometry polarization measurements.

106 In this work, we demonstrate how operando ellipsometry provides detailed insights into charge stor

107 was confirmed by corroborating evidence from ellipsometry, reflectance FTIR, XPS, cyclic voltammetry,

108 udied by contact angle measurements, optical ellipsometry, reflection absorption infrared spectroscop

109 ay photoelectron spectroscopy, spectroscopic ellipsometry, reflection-absorption infrared spectroscop

110 Spectral ellipsometry revealed that all tested sauces led to the

111 Spectroscopic ellipsometry reveals optical absorption onsets around 2

112 lectrochemical impedance spectroscopy (EIS), ellipsometry, scanning electron microscopy (SEM), atomic

113 toelectron spectroscopy (XPS), spectroscopic ellipsometry (SE), and high-resolution electron energy l

114 lipsometric parameter, Psi, of spectroscopic ellipsometry (SE), for the rapid, simultaneous identific

115 ) as well as physFN ones using spectroscopic ellipsometry (SE), Fourier transform infrared spectrosco

116 Infrared spectroscopy (IRS), spectroscopic ellipsometry (SE), water contact angle (CA), and X-ray p

117 hin films are characterized by spectroscopic ellipsometry (SE), X-ray photoelectron spectroscopy, tra

118 results strongly indicate that PAS1-modified ellipsometry sensor can provide a high fidelity system f

119 Resonance Raman and ellipsometry spectra indicate a band-gap reduction relat

120 teristics with applications in spectroscopic ellipsometry, spectropolarimetry, communications, imagin

121 tion, for surface plasmon resonance enhanced ellipsometry (SPREE) studies and assess the reactive coa

122 Spectroscopic ellipsometry, surface plasmon resonance, and AIR were th

123 Total internal reflection ellipsometry (TIRE) has been applied for the investigati

124 tion method called total internal reflection ellipsometry (TIRE).

125 and quantified by total internal reflection ellipsometry (TIRE).

126 were detected via total internal reflection ellipsometry (TIRE).

127 optical method of total internal reflection ellipsometry (TIRE).

128 tron scattering rates measured with infrared ellipsometry to infrared ultrafast pump-probe measuremen

129 erot enhanced terahertz (THz) Mueller matrix ellipsometry to measure an electromagnon excitation in m

130 with ice between 243 and 186 K by using (i) ellipsometry to monitor the ice surface and (ii) coated-

131 tical conductivity measured by spectroscopic ellipsometry to prior predictions from dynamical mean-fi

132 Here, we use ellipsometry to quantify specific interactions of recept

133 photoelectron spectroscopy and spectroscopic ellipsometry to show that the metallic phase produced by

134 situ combination of QCM-D with spectroscopic ellipsometry unambiguously demonstrates that the conform

135 wavelength dispersion measured by reflection ellipsometry (using a Teng-Man apparatus) and attenuated

136 ce microscopy, scanning electron microscopy, ellipsometry, UV, and laser desorption ionization MS (LD

137 combination of variable angle spectroscopic ellipsometry (VASE), quartz crystal microbalance with di

138 In situ potentiometry and null ellipsometry was combined and used as a tool to follow t

139 Spectroscopic ellipsometry was used to measure optical and surface pro

140 Spectroscopic ellipsometry was utilized to follow in situ photodegrada

141 Using ellipsometry, we found that antiphospholipid IgGs reduce

142 Using high-speed ellipsometry, we further demonstrate that the evaporatio

143 Via spectroscopic ellipsometry, we observe red shifting of the optical mod

144 anning electron microscopy and spectroscopic ellipsometry were used to characterize the surface morph

145 Kerr spectroscopies along with spectroscopic ellipsometry were used to deduce the complete permittivi

146 Reflectance FT-IR spectroscopy and ellipsometry were used to determine the amount of protei

147 u pyroelectric calorimetry and spectroscopic ellipsometry were used to investigate surface reactions

148 Combining spectroscopic ellipsometry, x-ray absorption spectroscopy, and optical

149 the MIP film were unraveled by spectroscopic ellipsometry, XPS, IRRAS, and DPV.