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1 rom the inelastic scattering of the outgoing photoelectron.
2 ly 20 eV) significantly less than low-energy photoelectrons.
3 eading to better harvesting of the generated photoelectrons.
4 luster packing on both supports, while x-ray photoelectron and absorption spectroscopy demonstrate a
5 ess this, we utilized a combination of X-ray photoelectron and absorption spectroscopy to identify al
6 tetracyanobenzene anion (TCNB(-)) using both photoelectron and photodetachment spectroscopies of cryo
7 this review, recent experimental advances in photoelectron and photoelectron-photofragment coincidenc
8 We provide evidence via complementary X-ray photoelectron and Raman spectroscopy that sputter deposi
9 ke important contributions to the low-energy photoelectron and secondary electron spectrum from many
10 These interactions between spin-polarized photoelectrons and chiral molecules are physically manif
11 We continuously control the energy of the photoelectrons and introduce an asymmetry in their emiss
13 rferences of pathways can be observed in the photoelectron angular distribution and in the past they
14 hat considers the Coulomb-laser coupling and photoelectron angular distribution in streaking trace ge
15 o show that screening influences high-energy photoelectrons ( approximately 20 eV) significantly less
17 sses owing to a greater yield of the trapped photoelectrons being extracted to the external circuit.
21 es, and show a full real-time picture of the photoelectron dynamics in the combined action of the las
22 spectra, which contain signatures of direct photoelectron emission as well as emission of thermalize
25 opy, whereby the kinetic energy and angle of photoelectrons emitted from a sample surface are measure
27 ere we use a combination of liquid-jet X-ray photoelectron experiments and molecular dynamics simulat
28 h photoemission we show that the lifetime of photoelectrons from the d band of Cu are longer by appro
31 instant of photoexcitation, energy-resolved photoelectron images revealed a highly non-equilibrium d
33 B(6)(-) and AlB(6)(-), using high-resolution photoelectron imaging and quantum chemical calculations.
36 range of wavelengths using a high-resolution photoelectron imaging spectrometer, which reveal both th
39 cular ionization cross sections arising from photoelectron impact, possibly resulting in spin-polariz
42 f the material band structure in determining photoelectron lifetimes and corresponding electron escap
43 anges to the rapid evolution of high-density photoelectron mediated secondary collisional ionization
44 aces was directly visualized by the scanning photoelectron microscopy (SPEM), in particular for the c
46 the time-energy relation in molecular-frame photoelectron momentum distributions shows the way of pr
47 t experimental advances in photoelectron and photoelectron-photofragment coincidence spectroscopy are
56 e to record both valence and core-level band photoelectron spectra using soft X-ray synchrotron radia
67 reduced and characterized by Raman and X-ray photoelectron spectroscopies in addition to microscopies
68 (23)Na solid-state NMR, Mossbauer, and X-ray photoelectron spectroscopies, are employed as probes of
72 Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventional X
73 s was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transform in
74 A combination of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) and CO temperature-
76 (-) anions were investigated by negative ion photoelectron spectroscopy (NIPES) along with high-resol
77 nvestigated in the gas phase by negative-ion photoelectron spectroscopy (NIPES), velocity-map imaging
78 scopy (AFM), and synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) were used to elucida
79 th temperature, temperature-programmed X-ray photoelectron spectroscopy (TP-XPS) experiments are perf
80 evel offset (epsilon(h)(UPS)) by ultraviolet photoelectron spectroscopy (UPS) for CnT and CnDT SAMs a
81 asurements of epsilon(h)(UPS) by ultraviolet photoelectron spectroscopy (UPS) for OPT n and OPD n SAM
82 lectrical conductors and exhibit ultraviolet-photoelectron spectroscopy (UPS) signatures expected of
83 soft X-ray scattering (R-SoXS); ultraviolet photoelectron spectroscopy (UPS); Fourier transform-infr
84 y ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicated bind
86 Report, Nakamura et al argue that our x-ray photoelectron spectroscopy (XPS) analysis was affected b
88 t X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS) and atomic multiplet cl
91 cterization of the prepared samples by X-ray photoelectron spectroscopy (XPS) and optimization of the
92 substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiati
93 ystem performance is validated through X-ray photoelectron spectroscopy (XPS) and the spatial distrib
94 ution interface, and observe with both X-ray photoelectron spectroscopy (XPS) and XUV-RA the existenc
95 scopy (FTIR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and zeta potential meas
96 entified by fitting of high-resolution X-ray photoelectron spectroscopy (XPS) C 1s and O 1s spectra.
97 nning electron microscopy (FE-SEM) and X-ray photoelectron spectroscopy (XPS) characterization result
99 dded within the polymer matrix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that they exi
100 Infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS) confirmed the role of p
101 Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate formation o
102 Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate the covalen
103 ure published data obtained by in situ X-ray photoelectron spectroscopy (XPS) for the concentration o
104 studied for their HER activity and by X-ray photoelectron spectroscopy (XPS) for the first time; MoB
105 g Microscopy (STM) in combination with X-ray Photoelectron spectroscopy (XPS) has been utilized to ch
106 electron microscopy (PEEM) and imaging X-ray photoelectron spectroscopy (XPS) have over the years bee
109 asma-Mass Spectrometry (LA-ICP-MS) and X-ray photoelectron spectroscopy (XPS) measurements, which wer
114 ) While surface characterization using X-ray photoelectron spectroscopy (XPS) showed the presence of
115 Fourier transform infrared (FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy confirmed
116 cterizations by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) support the presence of
118 y-dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and (10)B and (11)B so
119 ransmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS), and Nanoparticle Size
120 -ray spectroscopy (EDS), quasi in situ X-ray photoelectron spectroscopy (XPS), and operando X-ray abs
121 sion electron microscopy (HAADF-STEM), X-ray photoelectron spectroscopy (XPS), and powder X-ray diffr
122 , X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS), and Raman microscopy.
124 spectroscopy, photoluminescence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transform infr
126 es have been determined by synchrotron X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorp
127 ional theory (DFT), ion chromatograph, X-ray photoelectron spectroscopy (XPS), particle size analysis
128 ochemical exposure in combination with X-ray photoelectron spectroscopy (XPS), scanning electron micr
129 odified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), scanning electron micr
130 opy, X-ray diffraction analysis (XRD), X-ray photoelectron spectroscopy (XPS), UV-Vis-NIR spectroscop
131 ure characterization methods including X-ray photoelectron spectroscopy (XPS), V and S X-ray absorpti
132 erometry, cyclic voltammetry (CV), and X-ray photoelectron spectroscopy (XPS), we demonstrate that hi
133 ransmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD
152 probable adsorption mechanism based on X-ray photoelectron spectroscopy analysis was also proposed in
155 of a mixed B/Bi target and characterized by photoelectron spectroscopy and ab initio calculations.
156 we report the results obtained via combined photoelectron spectroscopy and ab initio studies of the
157 egradation mechanism of GaS(0.87) with X-ray photoelectron spectroscopy and annular dark-field scanni
158 ating voltage regions, as confirmed by X-ray photoelectron spectroscopy and atomic force microscopy e
159 and 8-hydroxyquinoline molecules using anion photoelectron spectroscopy and density functional theory
161 ion of oxygen defects as determined by X-ray photoelectron spectroscopy and electron paramagnetic res
162 ion, and characterized by a synergy of anion photoelectron spectroscopy and electronic structure calc
164 In the present study, we employed X-ray photoelectron spectroscopy and Fourier-transform infrare
167 Furthermore, valence band analysis by X-ray photoelectron spectroscopy and photoluminescence spectro
168 be H-Pt-CH(3) (-) by a synergy between anion photoelectron spectroscopy and quantum chemical calculat
169 C-Pt-H(CO(2))](-) by a synergy between anion photoelectron spectroscopy and quantum chemical calculat
171 (-) and ReB(2) O(-) and investigated them by photoelectron spectroscopy and quantum-chemical calculat
172 y infrared, electronic absorption, and X-ray photoelectron spectroscopy and revealed formation of a s
173 olled electron-impact irradiation with X-ray photoelectron spectroscopy and scanning electron microsc
174 haracterized using Raman spectroscopy, X-ray photoelectron spectroscopy and scanning tunneling micros
175 nd probed their structures and bonding using photoelectron spectroscopy and theoretical calculations.
176 rk, where temperature-dependent negative ion photoelectron spectroscopy and theoretical studies demon
177 r anions (Bn-) have allowed systematic joint photoelectron spectroscopy and theoretical studies, reve
178 roscopy, scanning electron microscopy, X-ray photoelectron spectroscopy and transmission electron mic
179 troscopy, powdered X-ray spectroscopy, X-ray photoelectron spectroscopy and UV-Vis diffused reflectan
180 ristics were assessed by TEM, SEM-EDX, X-ray photoelectron spectroscopy and vibrating sample magnetom
181 to bind with mercury as determined by X-ray photoelectron spectroscopy and X-ray absorption fine str
182 vanced in situ electron microscopy and X-ray photoelectron spectroscopy are used to demonstrate that
185 Temperature-programmed desorption and X-ray photoelectron spectroscopy data provide information abou
186 r at surfaces and interfaces, angle-resolved photoelectron spectroscopy has become a core technique i
187 Experiments using ambient pressure X-ray photoelectron spectroscopy indicate that methane dissoci
194 quantum state specificity by high-resolution photoelectron spectroscopy of the vinylidene anions H2CC
197 by means of operando ambient-pressure X-ray photoelectron spectroscopy performed at the solid/liquid
198 troscopy, scanning tunneling microscopy, and photoelectron spectroscopy provide unique information ab
201 g and predominated the powder surface (X-ray photoelectron spectroscopy results) in both camel and bo
202 ay absorption spectroscopy and ex situ X-ray photoelectron spectroscopy reveal that PbO(2) is unpertu
203 nctional theory calculations and ultraviolet photoelectron spectroscopy reveal that the effective wor
204 oscopy together with ex situ Raman and X-ray photoelectron spectroscopy reveal the reversibility of m
210 upled with atomic force microscopy and X-ray photoelectron spectroscopy reveals the architectures to
212 yst during the reaction, quasi in situ X-ray photoelectron spectroscopy showed that the surface is me
214 X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of SNNO/LSMO heterost
215 aramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggest that the chem
216 aramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggested that the ch
219 rcame this limitation by applying soft x-ray photoelectron spectroscopy to characterize excess electr
221 d X-ray diffraction, and Mossbauer and X-ray photoelectron spectroscopy to investigate their morpholo
222 8H8I2) produces m-C8H8 in gas phase; we used photoelectron spectroscopy to probe the first two electr
223 hanges in the physical properties of SAMs to photoelectron spectroscopy to unambiguously assign bindi
226 properties with degree of functionalization, photoelectron spectroscopy was used to map the occupied
227 ering beyond the dipole limit and hard X-ray photoelectron spectroscopy we establish the dual nature
228 croscopy, X-ray diffraction, Raman and X-ray photoelectron spectroscopy were employed to characterize
229 transmission electron microscopy, and X-ray photoelectron spectroscopy were used to understand the n
233 structural and transport measurements, X-ray photoelectron spectroscopy, and ab initio calculations a
234 ed by scanning tunneling spectroscopy, X-ray photoelectron spectroscopy, and complementary density fu
235 y, grazing incident X-ray diffraction, X-ray photoelectron spectroscopy, and Fourier transform infrar
236 d using a quartz crystal microbalance, X-ray photoelectron spectroscopy, and infrared spectroscopy, s
237 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and ion-exchange measurement
238 X-ray spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and nitrogen adsorption-deso
239 O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation of H
240 ectron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existence of v
241 heir intermediate phases of borophene; X-ray photoelectron spectroscopy, and scanning tunneling micro
242 ed reflection/absorption spectroscopy, X-ray photoelectron spectroscopy, and surface plasmon resonanc
243 scopic images before and after growth, x-ray photoelectron spectroscopy, and x-ray diffraction invest
245 immobilization, which was confirmed by X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and
246 ound molecules through high-resolution X-ray photoelectron spectroscopy, atomic force microscopy, and
247 ay diffraction, magnetic measurements, X-ray photoelectron spectroscopy, cyclic voltammetry, and dens
248 We employed microwave conductivity, X-ray photoelectron spectroscopy, diffuse reflectance spectros
249 eparation was directly proved by ultraviolet photoelectron spectroscopy, electrochemical impedance sp
250 xposed samples were investigated using X-ray photoelectron spectroscopy, Fourier transform infrared s
251 he trade include near-ambient-pressure X-ray photoelectron spectroscopy, high-pressure scanning tunne
252 ully studied by X-ray crystallography, X-ray photoelectron spectroscopy, hydrogen evolution experimen
253 y forming the Mo Se bond, confirmed by X-ray photoelectron spectroscopy, in which the formed MoSe(2)
254 d by transmission electron microscopy, X-ray photoelectron spectroscopy, infrared spectra, ultraviole
255 s of the foam were characterized using X-ray photoelectron spectroscopy, inverse gas chromatography,
256 Combined with in situ ambient-pressure X-ray photoelectron spectroscopy, IR, and Raman spectroscopic
257 lectrochemistry, synchrotron radiation-X-ray photoelectron spectroscopy, near edge X-ray absorption f
258 in the AuNP suspensions, as judged by X-ray photoelectron spectroscopy, nuclear magnetic resonance e
261 formation of the SAM was confirmed by X-ray photoelectron spectroscopy, scanning electron microscopy
262 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy, scanning electron microscopy
263 s formation are elucidated by means of X-Ray photoelectron spectroscopy, scanning transmission electr
266 X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, UV-vis absorption spectra, a
267 r the metallic glasses, measured using X-ray photoelectron spectroscopy, was higher by 0.2 eV to 0.4
268 LTS reaction, as well as complementary X-ray photoelectron spectroscopy, we observed the activation a
271 mbination of powder X-ray diffraction, X-ray photoelectron spectroscopy, X-ray fluorescence spectrosc
290 uble ionisation spectra resemble the valence photoelectron spectrum in form, and their main features
291 band for a quartet state is missing from the photoelectron spectrum indicating that the anion has a s
294 ting this radical isomerization pathway with photoelectron transfer agents allows us to override the
295 he target compounds, while commonly employed photoelectron transfer catalysts such as [Ru(bpy)3]Cl2 o
296 F + CH3OH --> HF + CH3O reaction using slow photoelectron velocity-map imaging spectroscopy of cryoc
297 ization potential of the adsorbed molecules, photoelectrons were collected that originated from both
299 rization of solid-phase products using X-ray photoelectron (XPS) and absorption spectroscopies (XAS)