ライフサイエンスコーパス: transmission electron microscope

1 energy-loss spectroscopy in an environmental transmission electron microscope.

2 le, realize wavelength-scale resolution in a transmission electron microscope.

3 after creation using an aberration-corrected transmission electron microscope.

4 g stage in the aberration corrected scanning transmission electron microscope.

5 r graphene by in situ Joule-heating inside a transmission electron microscope.

6 images obtained in the tilted-beam mode of a transmission electron microscope.

7 ior to immunolabeling and observation in the transmission electron microscope.

8 to collect low-dose data using an FEI Tecnai transmission electron microscope.

9 alloy particles during in situ heating in a transmission electron microscope.

10 bon to make a replica for examination in the transmission electron microscope.

11 ing in situ nanoindentation experiments in a transmission electron microscope.

12 at sub-angstrom resolution in a mid-voltage transmission electron microscope.

13 in has an apparent diameter of 9-12 A in the transmission electron microscope.

14 lectron irradiation at high temperature in a transmission electron microscope.

15 tilevered, multiwalled carbon nanotubes in a transmission electron microscope.

16 ted electron energy loss spectroscopy in the transmission electron microscope.

17 oroid bombardment of sulfide minerals in the transmission electron microscope.

18 e by monitoring stable crack growth inside a transmission electron microscope.

19 asing, and spectroscopic analysis within the transmission electron microscope.

20 rential phase-contrast imaging in a scanning transmission electron microscope.

21 which have been characterized via cryogenic transmission electron microscope.

22 structures and phosphine in an environmental transmission electron microscope.

23 ydride (PdH(x)) synthesized in a liquid cell transmission electron microscope.

24 the fabricated heterostructure in a scanning transmission electron microscope.

25 ucture of damaged HCECs by MXF was imaged by transmission electron microscope.

26 o prepare individual nanostructures inside a transmission electron microscope.

27 MOF nanocrystals under compression within a transmission electron microscope.

28 on electron interferometer in a conventional transmission electron microscope.

29 n and imaged at cryogenic temperature in the transmission electron microscope.

30 ach-Zehnder geometry in an unmodified 200 kV transmission electron microscope.

31 ectrometry, scanning electron microscopy and transmission electron microscope.

32 ate plasmonic nanostructures in a (scanning) transmission electron microscope.

33 ctron energy loss spectroscopy in a scanning transmission electron microscope.

34 and electron diffraction in an environmental transmission electron microscope.

35 10T high magnetic field were analysed by the transmission electron microscope.

36 stern blot, flow cytometry, and confocal and transmission electron microscope.

37 itu heating metallic glass nanorods inside a transmission electron microscope.

38 ing annular dark field imaging in a scanning transmission electron microscope.

39 six Sprague-Dawley rats were acquired with a transmission electron microscope.

40 obtained at 80 kV in an aberration-corrected transmission electron microscope.

41 ting from the incident electron beam using a transmission electron microscope.

42 and Auger microprobes as well as scanning or transmission electron microscopes.

43 men support fully compatible with modern-day transmission electron microscopes.

44 side-entry specimen holders common on modern transmission electron microscopes.

45 g both conventional and aberration corrected transmission electron microscopes.

46 f the latest generation aberration-corrected transmission electron microscopes allow the vast majorit

47 in situ biasing technique within a scanning transmission electron microscope, an unconventional laye

48 ased on in situ nanoindentation studies in a transmission electron microscope and corresponding molec

49 With a scanning transmission electron microscope and electron energy los

50 Transmission electron microscope and extended X-ray abso

51 ion of quantitative in situ compression in a transmission electron microscope and finite-element anal

52 simple in-situ electrochemical cell for the transmission electron microscope and use it to track lit

53 canning electron microscope, high resolution transmission electron microscope and vibrating sample ma

54 ACNT/PVC composites were characterized using transmission electron microscope and X-ray diffraction,

55 Combining transmission electron microscopes and density functional

56 Images taken by transmission electron microscopes are usually affected b

57 a 2-terminal TaS(2) device within a scanning transmission electron microscope at cryogenic temperatur

58 ow, by using in situ Kr ion irradiation in a transmission electron microscope at room temperature, th

59 during the straining of molybdenum inside a transmission electron microscope at room temperature.

60 tunities for, increasing the impact that the transmission electron microscope can have on molecular s

61 he superior spatial resolution of a scanning transmission electron microscope combined with electron

62 a nanoscale electrochemical device inside a transmission electron microscope--consisting of a single

63 ryo-EM) requires costly 200- to 300-keV cryo-transmission electron microscopes (cryo-TEMs) with field

64 High-resolution transmission electron microscope data indicate there are

65 Study with transmission electron microscope demonstrated significan

66 ngineered nanotubes inside a high-resolution transmission electron microscope demonstrated the antici

67 nition for the depth resolution for scanning transmission electron microscope depth sectioning and pr

68 s formation to its decay, using an ultrafast transmission electron microscope driven by femtosecond m

69 s been in-situ observed experimentally using transmission electron microscope during studies of their

70 gle annular dark field imaging in a scanning transmission electron microscope, elemental analysis, ce

71 We used a transmission electron microscope equipped with an in sit

72 e have used the novel environmental scanning transmission electron microscope (ESTEM) with 0.1 nm res

73 retical prediction is confirmed by real-time transmission electron microscope experimental observatio

74 ctron microscope (FE-SEM) and field emission transmission electron microscope (FE-TEM) respectively.

75 d Spectroscopy, UV-visible (UV-Vis) spectra, Transmission Electron Microscope, Field Emission Scannin

76 rom a single-crystal silicon cantilever on a transmission electron microscope grid by gallium focused

77 technique removes the excess solution from a transmission electron microscope grid by pressing absorb

78 Particles were collected on transmission electron microscope grids fitted on the las

79 rom the ion beam of a mass spectrometer onto transmission electron microscope grids for cryo-electron

80 Photomicrographs of transmission electron microscope grids from the impactor

81 w that Z-contrast tomography in the scanning transmission electron microscope has been developed to d

82 s review describes the contribution that the transmission electron microscope has made to the field o

83 ctron energy-loss spectroscopy (EELS) in the transmission electron microscope have been investigated

84 itative mechanical tests in an environmental transmission electron microscope, here we demonstrate th

85 We show, using ultra-high-resolution transmission electron microscope (HRTEM) images of natur

86 tron microscope (FE-SEM) and high-resolution transmission electron microscope (HRTEM) images, respect

87 n on nano-twinned Ag under a high resolution transmission electron microscope (HRTEM) reveals the dyn

88 er an electron beam within a high-resolution transmission electron microscope (HRTEM).

89 lectron microscope (SEM) and high-resolution transmission electron microscope (HRTEM).

90 Scanning tunnelling and transmission electron microscope images of monolayer-pro

91 combination with single particle analysis of transmission electron microscope images of negative-stai

92 Transmission electron microscope images of thin films fr

93 -ray diffraction spectra and high resolution transmission electron microscope images prove the high e

94 Transmission electron microscope images revealed that th

95 Transmission electron microscope images were obtained of

96 minima in fibril width in negatively stained transmission electron microscope images).

97 gh-resolution, high-angle annular dark-field transmission electron microscope images, thanks to the d

98 ar dynamics of polymeric film systems, using transmission electron microscope imaging (TEM) and nucle

99 the tumor samples together with TUNEL assay, transmission electron microscope imaging and Western blo

100 dy, a thermophoretic sampling and subsequent transmission electron microscope imaging were applied to

101 orce microscopy, lattice-resolution scanning transmission electron microscope imaging, and energy dis

102 tomic force microscope with an environmental transmission electron microscope in a novel experimental

103 A thorough characterization by scanning transmission electron microscope in high angle annular d

104 Analysis of leaf sections using a transmission electron microscope indicated a 2-fold decr

105 Spatially-resolved nanodiffraction in a transmission electron microscope is combined with a self

106 experiments in an atomic resolution scanning transmission electron microscope, it is found that stack

107 he spatial resolution and flexibility of the transmission electron microscope, it would open up the s

108 ion of in situ fracture experiments inside a transmission electron microscope, large-scale atomistic

109 angle-resolved vibrational spectroscopy in a transmission electron microscope makes it possible to ma

110 device, we conduct in situ, ultrahigh vacuum transmission electron microscope measurements of crystal

111 Scanning transmission electron microscope measurements of mass-pe

112 We demonstrate, using in situ transmission electron microscope mechanical testing, tha

113 Transmission electron microscope micrographs have confir

114 Here we report, by using an in situ transmission electron microscope nanoindentation tool, t

115 ollowed by monodansylcadaverine staining and transmission electron microscope observation.

116 We report in situ dynamic transmission electron microscope observations of nanocry

117 However, transmission electron microscope observations of numerou

118 Transmission electron microscope observations of the All

119 Transmission electron microscope observations showed tha

120 We report transmission electron microscope observations that provi

121 We performed in situ indentation in a transmission electron microscope on Al-TiN multilayers w

122 Under a transmission electron microscope, only the M1 layer of t

123 that the capabilities of a state-of-the-art transmission electron microscope open the door to the di

124 specimens amassing less than 100 kDa using a transmission electron microscope operating at 200 keV co

125 imaging in an aberration-corrected scanning transmission electron microscope optimized for low volta

126 by using in situ heavy ion irradiation in a transmission electron microscope, pre-introduced nanovoi

127 ns of the probe-forming lens in the scanning transmission electron microscope provides not only a sig

128 }Al/AlN/TiN multilayers in a high-resolution transmission electron microscope revealed the z-AlN to w

129 itative in situ nanocompression testing in a transmission electron microscope reveals that the streng

130 carried out while imaging within an in situ transmission electron microscope show that the electric

131 situ tensile experiments inside scanning and transmission electron microscopes show that penta-twinne

132 ere, we introduce an ultracold liquid helium transmission electron microscope side-entry specimen hol

133 Within this arsenal, the transmission electron microscope stands out for its uniq

134 imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direc

135 The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a

136 ectron microscope (SEM) imaging and scanning transmission electron microscope (STEM) tomography.

137 tron ptychography in an uncorrected scanning transmission electron microscope (STEM) with deep subang

138 dark-field (HAADF) imaging within a scanning transmission electron microscope (STEM).

139 berration-corrected high-resolution scanning transmission electron microscope (STEM).

140 cells were imaged in liquid with a scanning transmission electron microscope (STEM).

141 d out using an aberration-corrected scanning transmission electron microscope (STEM).

142 nergy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM).

143 graphic tilt series acquired in the scanning transmission electron microscope (STEM).

144 u nanomechanical tests conducted in scanning/transmission electron microscopes (STEM/TEM) provide a c

145 Transmission electron microscope studies showed clear ch

146 ake of these nanoparticles were confirmed by transmission electron microscope study.

147 secondary electron (SE) emission in scanning transmission electron microscopes suggest that material'

148 High-resolution transmission electron microscope (TEM) and scanning TEM

149 often too fast to observe in a conventional transmission electron microscope (TEM) and too slow for

150 ation between a SERRS/fluorescence map and a transmission electron microscope (TEM) collage of the sa

151 Here, using transmission electron microscope (TEM) double immunogold

152 displacement measurement capabilities in the transmission electron microscope (TEM) for in situ quant

153 terials interactions at the nanoscale in the transmission electron microscope (TEM) has been demonstr

154 st a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited

155 QDHSC) using a custom-designed photoelectric transmission electron microscope (TEM) holder.

156 ver nanoparticles using aberration-corrected transmission electron microscope (TEM) imaging and monoc

157 The transmission electron microscope (TEM) imaging, UV-vis s

158 idence from both scattering measurements and transmission electron microscope (TEM) measurements sugg

159 Transmission electron microscope (TEM) observation revea

160 Transmission electron microscope (TEM) results showed pr

161 Measurements with a transmission electron microscope (TEM) show that nano-Se

162 Scanning electron microscope (SEM) and transmission electron microscope (TEM) showed cell membr

163 A systematic transmission electron microscope (TEM) study revealed a

164 XRD), scanning electron microscopy (SEM) and transmission electron microscope (TEM) techniques were u

165 Here, we describe how to use Transmission Electron Microscope (TEM) to obtain Electro

166 n scanning electron microscope (FE-SEM), and transmission electron microscope (TEM) with EDAX.

167 with scanning electron microscope (SEM) and transmission electron microscope (TEM), as well as the n

168 Observed with the transmission electron microscope (TEM), CLDIs were bound

169 ultrathin, freeze-substituted sections in a transmission electron microscope (TEM), combined with co

170 ies using in situ compression testing in the transmission electron microscope (TEM), combined with mo

171 ission scanning electron microscopy (FESEM), transmission electron microscope (TEM), energy dispersiv

172 omic force microscopy (AFM), High-resolution transmission electron microscope (TEM), Fourier-transfor

173 roscopy, scanning electron microscope (SEM), transmission electron microscope (TEM), ultraviolet-visi

174 Scanning electron microscope (SEM), transmission electron microscope (TEM), x-ray diffractio

175 such as scanning electron microscope (SEM), transmission electron microscope (TEM), x-ray diffractio

176 (PXRD), scanning electron microscopy (SEM), Transmission Electron Microscope (TEM), X-ray photoelect

177 terized by UV-visible (UV-Vis) spectroscopy, Transmission Electron Microscope (TEM), zeta potential,

178 nyltetrazolium chloride (TTC) staining and a transmission electron microscope (TEM).

179 ghts, were comparable to those determined by transmission electron microscope (TEM).

180 tail of around 18.8 nm, as indicated by the transmission electron microscope (TEM).

181 ts and through ultrastructure analysis using transmission electron microscope (TEM).

182 ed by Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM).

183 nce of lycopene crystals when observed under Transmission Electron Microscope (TEM).

184 ectly observed using an aberration-corrected transmission electron microscope (TEM).

185 ent drive cycles, have been characterized by transmission-electron-microscope (TEM) image analysis.

186 Tested on four different transmission electron microscopes (TEMs), it consistentl

187 esolution have been determined using 300-keV transmission electron microscopes (TEMs).

188 In situ scanning electron microscope and transmission electron microscope testing of the smooth a

189 to collect cryo-EM data using an FEI Tecnai transmission electron microscope that can subsequently b

190 was systematically studied using analytical transmission electron microscope that together with outc

191 have built a parallel imaging pipeline using transmission electron microscopes that scales this techn

192 Under a transmission electron microscope, the NP-RNA complex app

193 situ indentation of TiN in a high-resolution transmission electron microscope, the nucleation of full

194 At the sizes visible within transmission electron microscope they appear nearly immo

195 am dark-field images can be obtained on many transmission electron microscopes, this work should faci

196 ctron energy loss spectroscopy in a scanning transmission electron microscope to around ten millielec

197 amic light scattering (DLS) and confirmed by transmission electron microscope to be about 400 nm.

198 persive spectroscopy mapping with a scanning transmission electron microscope to confirm the transiti

199 ctron energy-loss spectroscopy in a scanning transmission electron microscope to directly resolve car

200 Here we use in situ heating in a scanning transmission electron microscope to observe the transfor

201 lamella fabrication process, validated with transmission electron microscope tomogram reconstruction

202 Finally, we show by electron tomography [3D transmission electron microscope tomography (3D TEM)] th

203 Transmission electron microscopes typically have round b

204 using a 300-keV Xe ion beam in situ within a transmission electron microscope up to 40 displacements

205 Transmission electron microscopes use electrons with wav

206 Off-axis electron holography in the transmission electron microscope was used to correlate t

207 in situ nanocompression experiments inside a transmission electron microscope we can directly observe

208 ctron energy loss spectroscopy in a scanning transmission electron microscope, we demonstrate that ul

209 Using a transmission electron microscope, we detected a 5.7-elec

210 icles during in situ annealing in a scanning transmission electron microscope, we directly discern fi

211 imaging in an aberration-corrected scanning transmission electron microscope, we find that a single

212 nanomechanical testing under high-resolution transmission electron microscope, we find that the diffu

213 situ electron energy loss spectroscopy in a transmission electron microscope, we map the spectral an

214 By growing III-V nanowires in a transmission electron microscope, we measured the local

215 ing the electron energy-loss spectrum in the transmission electron microscope, we quantified the opti

216 in situ straining in an aberration-corrected transmission electron microscope, we report on the salie

217 ctron energy-loss spectroscopy in a scanning transmission electron microscope, we report the experime

218 Here, by using an aberration-corrected transmission electron microscope, we report the fabricat

219 ctron energy-loss spectroscopy in a scanning transmission electron microscope, we reveal momentum-tra

220 current with in situ electrical biasing in a transmission electron microscope, we show that electroni

221 drogenated aluminium inside an environmental transmission electron microscope, we show that hydrogen

222 ng in situ Kr ion irradiation technique in a transmission electron microscope, we show that nanoporou

223 loaded Pt thin films under a high-resolution transmission electron microscope, we show that the plast

224 ing tomographic and holographic methods in a transmission electron microscope, we show that the three

225 Optical, scanning, and transmission electron microscopes were used to examine t

226 d aberration correction system in a scanning transmission electron microscope, which is less sensitiv

227 a fifth-order aberration-corrected scanning transmission electron microscope, which provides a facto

228 ed the attosecond temporal resolution in the transmission electron microscope, which we coined "attom

229 ed using the electron beam of a conventional transmission electron microscope; which can strip away m

230 stals are approximately 3 nm, as measured by transmission electron microscope, with optical propertie