ライフサイエンスコーパス: X-ray photoelectron spectroscopy

1 measurements, optical/solvent exposures, and X-ray photoelectron spectroscopy.

2 elation between Au and ZnO was manifested by X-ray photoelectron spectroscopy.

3 e was determined using X-ray diffraction and X-ray photoelectron spectroscopy.

4 racterized by contact angle measurements and X-ray photoelectron spectroscopy.

5 eory, temperature-programmed desorption, and X-ray photoelectron spectroscopy.

6 acquired by quite different methods such as X-ray photoelectron spectroscopy.

7 nterface, which was probed by angle-resolved X-ray photoelectron spectroscopy.

8 rmed by transmission electron microscopy and X-ray photoelectron spectroscopy.

9 the bis-pyridinyltetrazine, as determined by X-ray photoelectron spectroscopy.

10 dance spectroscopy, fluorescence imaging and X-ray photoelectron spectroscopy.

11 by cyclic voltammetry as well as UV/Vis and X-ray photoelectron spectroscopy.

12 omalous decrease of Mn valence measured from X-ray photoelectron spectroscopy.

13 hiocarbamates, with Cu(+) ions elucidated by X-ray photoelectron spectroscopy.

14 tions was probed in situ by ambient-pressure X-ray photoelectron spectroscopy.

15 copy plus energy dispersive spectroscopy and X-ray photoelectron spectroscopy.

16 itu using synchrotron-based ambient pressure X-ray photoelectron spectroscopy.

17 th in situ scanning tunneling microscopy and X-ray photoelectron spectroscopy.

18 he surface was characterized by ATR-FTIR and X-ray photoelectron spectroscopy.

19 ized by transmission electron microscopy and X-ray photoelectron spectroscopy.

20 rface composition was determined by means of X-ray photoelectron spectroscopy.

21 2 is characterized by Raman spectroscopy and X-ray photoelectron spectroscopy.

22 Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy.

23 try of the tethered catalysts, determined by X-ray photoelectron spectroscopy.

24 O was confirmed using elemental analysis and X-ray photoelectron spectroscopy.

25 ition potential of -0.75 V, as observed from X-ray photoelectron spectroscopy.

26 the films using photoluminescence, Raman and x-ray photoelectron spectroscopies.

27 Angle-resolved X-ray photoelectron spectroscopy analyses indicate that

28 X-ray photoelectron spectroscopy analysis indicated the

29 X-ray photoelectron spectroscopy analysis of ABP and ACP

30 X-ray photoelectron spectroscopy analysis revealed a hig

31 According to X-ray photoelectron spectroscopy analysis, the Pd cluste

32 favored the reduction of Cr(VI) according to X-ray photoelectron spectroscopy analysis.

33 theory calculations and further confirmed by X-ray photoelectron spectroscopy analysis.

34 Both x-ray photoelectron spectroscopy and (1)H NMR data confi

35 Clear experimental evidence from X-ray photoelectron spectroscopy and (31)P NMR spectrosc

36 by Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy and atomic force micros

37 ious gating voltage regions, as confirmed by X-ray photoelectron spectroscopy and atomic force micros

38 to the functionalized SWCNTs was analyzed by X-ray photoelectron spectroscopy and confirmed by (31)P

39 of this hydrophobic ligand was confirmed by X-ray photoelectron spectroscopy and contact angle gonio

40 In addition, X-ray photoelectron spectroscopy and electrochemical imp

41 X-ray photoelectron spectroscopy and electrochemistry co

42 X-ray photoelectron spectroscopy and electrochemistry co

43 olysulfides has been evaluated by conducting X-ray photoelectron spectroscopy and electron microscopy

44 functionalized surface was characterized by X-ray photoelectron spectroscopy and Fourier transform I

45 High-resolution X-ray photoelectron spectroscopy and in-field (57)Fe Mos

46 to the {Pu38} motif and was characterized by X-ray photoelectron spectroscopy and magnetic analyses.

47 ugh initial CO loss as determined by in situ X-ray photoelectron spectroscopy and mass spectrometry.

48 We have used X-ray photoelectron spectroscopy and polarization-resolv

49 X-ray photoelectron spectroscopy and Raman spectroscopy

50 X-ray photoelectron spectroscopy and scanning electron m

51 controlled electron-impact irradiation with X-ray photoelectron spectroscopy and scanning electron m

52 and characterized using Raman spectroscopy, X-ray photoelectron spectroscopy and scanning tunneling

53 ion metal dichalcogenides by using microbeam X-ray photoelectron spectroscopy and scanning tunnelling

54 ly insulating films of WO3 Here, we use hard X-ray photoelectron spectroscopy and spectroscopic ellip

55 (haematite) that combining ambient-pressure X-ray photoelectron spectroscopy and standing-wave photo

56 ned by a combination of techniques including X-ray photoelectron spectroscopy and synchrotron radiati

57 Based on X-ray photoelectron spectroscopy and thermogravimetric a

58 On the basis of X-ray photoelectron spectroscopy and transmission electr

59 spectroscopy, scanning electron microscopy, X-ray photoelectron spectroscopy and transmission electr

60 We applied cryogenic X-ray Photoelectron Spectroscopy and wet chemical analys

61 bility to bind with mercury as determined by X-ray photoelectron spectroscopy and X-ray absorption fi

62 Adsorption mechanisms were assessed using X-ray photoelectron spectroscopy and X-ray absorption sp

63 performed via scanning tunneling microscopy, X-ray-photoelectron spectroscopy and density functional

64 ated using in situ, time- and depth-resolved X-ray photoelectron spectroscopy, and complementary gran

65 -temperature scanning tunnelling microscopy, X-ray photoelectron spectroscopy, and density functional

66 lated IR reflection absorption spectroscopy, X-ray photoelectron spectroscopy, and electrochemical im

67 roscopy, grazing incident X-ray diffraction, X-ray photoelectron spectroscopy, and Fourier transform

68 Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and ion-exchange measu

69 queous and acetonitrile electrolytes, UV and X-ray photoelectron spectroscopy, and Kelvin force micro

70 shington, by IR and Raman spectroscopy, XRD, X-ray photoelectron spectroscopy, and Mossbauer spectros

71 rsive X-ray spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and nitrogen adsorptio

72 ble in O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation

73 X-ray diffraction, atomic force microscopy, X-ray photoelectron spectroscopy, and optical transmissi

74 ion electron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existenc

75 nchrotron X-ray reflectivity, angle-resolved X-ray photoelectron spectroscopy, and spectroelectrochem

76 infrared reflection/absorption spectroscopy, X-ray photoelectron spectroscopy, and surface plasmon re

77 rier transform infrared (FTIR) spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight sec

78 n included size, surface charge, morphology, X-ray photoelectron spectroscopy, and transmission Fouri

79 c resonance spectroscopy, mass spectrometry, X-ray photoelectron spectroscopy, and X-ray absorption s

80 lectron microscopy, ultra violet-visible and X-ray photoelectron spectroscopy, and Zeta-potential.

81 In situ atmospheric-pressure X-ray photoelectron spectroscopy (AP-XPS) experiments de

82 ay absorption spectroscopy, ambient pressure X-ray photoelectron spectroscopy (AP-XPS), and environme

83 Using ambient-pressure X-ray photoelectron spectroscopy (AP-XPS), we studied th

84 nce (LIF) spectrometry, and ambient-pressure X-ray photoelectron spectroscopy (AP-XPS).

85 Through the use of ambient pressure X-ray photoelectron spectroscopy (APXPS) and a single-si

86 Ambient-pressure X-ray photoelectron spectroscopy (APXPS) and high-pressu

87 Ambient pressure X-ray photoelectron spectroscopy (APXPS) is a valuable t

88 fine structure (NEXAFS) and ambient-pressure X-ray photoelectron spectroscopy (APXPS) under catalytic

89 Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventi

90 strates was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transf

91 rr of oxygen pressure using ambient pressure X-ray photoelectron spectroscopy (APXPS).

92 electrochemical measurements, angle-resolved X-ray photoelectron spectroscopy (AR-XPS), and density f

93 Advanced in situ electron microscopy and X-ray photoelectron spectroscopy are used to demonstrate

94 -energy secondary ion mass spectrometry, and X-ray photoelectron spectroscopy are used to target endo

95 ilizing the PbS(111) facets, consistent with x-ray photoelectron spectroscopy as well as other spectr

96 tron micrographs, x-ray diffraction spectra, x-ray photoelectron spectroscopy, as well as TFT output

97 From near-ambient pressure X-ray photoelectron spectroscopy at 0.9 mbar CO2, the am

98 rface immobilization, which was confirmed by X-ray Photoelectron Spectroscopy, Atomic Force Microscop

99 by energy-dispersive X-ray spectroscopy and X-ray photoelectron spectroscopy confirmed excellent sto

100 X-ray photoelectron spectroscopy data indicate that the

101 Temperature-programmed desorption and X-ray photoelectron spectroscopy data provide informatio

102 Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy data reveal that carbox

103 racterized using atomic force microscopy and X-ray photoelectron spectroscopy, demonstrating the pres

104 We employed microwave conductivity, X-ray photoelectron spectroscopy, diffuse reflectance sp

105 X-ray photoelectron spectroscopy, EPR, and magnetometry

106 tinct layers of TPA and NaCl, angle resolved X-ray photoelectron spectroscopy experiments indicate a

107 X-ray diffraction and X-ray photoelectron spectroscopy experiments were used t

108 ctively coupled plasma mass spectrometry and X-ray photoelectron spectroscopy for quantitative analys

109 s of the trade include near-ambient-pressure X-ray photoelectron spectroscopy, high-pressure scanning

110 Experiments using ambient pressure X-ray photoelectron spectroscopy indicate that methane d

111 X-ray photoelectron spectroscopy indicated that the pred

112 Cyclic voltammetry and angle resolved X-ray photoelectron spectroscopy indicated that the SAMs

113 n also altered N-CNT surface chemistry, with X-ray photoelectron spectroscopy indicating addition of

114 Electron microscopy, X-ray photoelectron spectroscopy, inductively coupled pl

115 cterized by low-energy electron diffraction, X-ray photoelectron spectroscopy, infrared reflection-ab

116 nfirmed by transmission electron microscopy, X-ray photoelectron spectroscopy, infrared spectra, ultr

117 Using ambient pressure X-ray photoelectron spectroscopy interpreted with quantu

118 X-ray photoelectron spectroscopy invariably detected ele

119 perties of the foam were characterized using X-ray photoelectron spectroscopy, inverse gas chromatogr

120 Combined with in situ ambient-pressure X-ray photoelectron spectroscopy, IR, and Raman spectros

121 Finally, X-ray photoelectron spectroscopy is used to characterize

122 X-ray photoelectron spectroscopy measurements demonstrat

123 X-ray photoelectron spectroscopy measurements show the p

124 Here we report liquid jet X-ray photoelectron spectroscopy measurements that provi

125 Near ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) is a promisin

126 Using near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) we show that

127 al spectroscopy and by near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS).

128 (57)Fe Mossbauer spectroscopy, X-ray photoelectron spectroscopy, neutron activation ana

129 ecules in the AuNP suspensions, as judged by X-ray photoelectron spectroscopy, nuclear magnetic reson

130 X-ray photoelectron spectroscopy of C 1s and Br 3d core

131 X-ray photoelectron spectroscopy of Cu 2p3/2 and Os 4f s

132 X-ray photoelectron spectroscopy of these electrochemica

133 d infrared spectroscopy, and high resolution X-ray photoelectron spectroscopy of TPI-carbons to eluci

134 In situ, depth-resolved X-ray photoelectron spectroscopy of various graphene-coa

135 X-ray photoelectron spectroscopy paired with C60(+) clus

136 on Si by means of operando ambient-pressure X-ray photoelectron spectroscopy performed at the solid/

137 of zero charge by means of ambient pressure X-ray photoelectron spectroscopy performed under polariz

138 extinction spectroscopy, zeta potential, and X-ray photoelectron spectroscopy prior to use in capilla

139 aracterized by numerous techniques including X-ray photoelectron spectroscopy, quartz crystal microba

140 X-ray photoelectron spectroscopy, Raman microscopy and s

141 X-ray photoelectron spectroscopy, Raman spectroscopy, to

142 The SAMs were characterized using X-ray photoelectron spectroscopy, reflection-absorption

143 new (C16)2DDP SAMs were characterized using X-ray photoelectron spectroscopy, reflection-absorption

144 ata and binding energy shifts as observed by X-ray photoelectron spectroscopy, respectively.

145 The X-ray photoelectron spectroscopy results indicated that

146 X-ray photoelectron spectroscopy results show ferrate re

147 Moreover, the X-ray photoelectron spectroscopy results show that the v

148 X-ray photoelectron spectroscopy results showed that bot

149 X-ray photoelectron spectroscopy revealed significant co

150 X-ray photoelectron spectroscopy revealed that an effect

151 X-ray photoelectron spectroscopy revealed that the hydro

152 X-ray photoelectron spectroscopy reveals that, at pH </=

153 EM) coupled with atomic force microscopy and X-ray photoelectron spectroscopy reveals the architectur

154 In situ ambient pressure X-ray photoelectron spectroscopy reveals up to a fourfol

155 gated in detail by X-ray powder diffraction, X-ray photoelectron spectroscopy, scanning electron micr

156 The formation of the SAM was confirmed by X-ray photoelectron spectroscopy, scanning electron micr

157 uding X-ray diffraction and ambient-pressure X-ray photoelectron spectroscopy showed that the crystal

158 catalyst during the reaction, quasi in situ X-ray photoelectron spectroscopy showed that the surface

159 X-ray photoelectron spectroscopy shows that Cu(+) is alr

160 via Rutherford backscattering spectrometry, X-ray photoelectron spectroscopy, spectroscopic ellipsom

161 microscopy (AFM), and synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) were used to e

162 has been studied using synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS), near edge X-r

163 We present a new synchrotron X-ray photoelectron spectroscopy strategy for surface ch

164 with grazing incidence x-ray diffraction and x-ray photoelectron spectroscopy studies indicating that

165 X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of SNNO/LSMO he

166 tructive characterization techniques such as X-ray photoelectron spectroscopy suffer from sensitivity

167 lography, X-ray absorption spectroscopy, and X-ray photoelectron spectroscopy suggest that reduction

168 py, IR spectroscopy, cyclic voltammetry, and X-ray photoelectron spectroscopy suggests that C-H activ

169 alues and surface oxygen concentrations from X-ray photoelectron spectroscopy suggests that surface s

170 determined using a novel approach combining X-ray photoelectron spectroscopy, surface tension measur

171 n spectroscopy, X-ray emission spectroscopy, X-ray photoelectron spectroscopy, synchrotron radiation

172 Moreover, a microscopic X-ray photoelectron spectroscopy technique was employed

173 , electrochemical impedance spectroscopy and X-ray photoelectron spectroscopy techniques.

174 , electrochemical impedance spectroscopy and X-ray photoelectron spectroscopy techniques.

175 Through X-ray diffraction and X-ray photoelectron spectroscopy, the as-grown tungsten(

176 bly because of a P-based coating detected by X-ray photoelectron spectroscopy, the zeta potential of

177 g electrospray ionization mass spectrometry, X-ray photoelectron spectroscopy, thermogravimetric anal

178 cterization of the new phase is presented by X-ray photoelectron spectroscopy, thermogravimetry, zeta

179 hotoionization aerosol mass spectrometry and X-ray photoelectron spectroscopy to confirm these predic

180 We employed ambient pressure X-ray photoelectron spectroscopy to investigate the elec

181 erature scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy, transmission infrared

182 tact angle measurements, X-ray reflectivity, X-ray photoelectron spectroscopy, ultraviolet photoelect

183 ibrational spectroscopy and ambient pressure X-ray photoelectron spectroscopy under catalytically rel

184 ) at ambient conditions and (ii) contactless X-ray photoelectron spectroscopy under ultrahigh vacuum.

185 copy, X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, UV-vis absorption spec

186 X-ray photoelectron spectroscopy was used to analyze sor

187 X-ray photoelectron spectroscopy was utilized to determi

188 Chemical derivatization coupled to X-ray photoelectron spectroscopy was utilized to quantif

189 By using infrared spectroscopy and X-ray photoelectron spectroscopy we demonstrate that air

190 netic circular dichroism, combined with hard X-ray photoelectron spectroscopy, we derived a complete

191 f the LTS reaction, as well as complementary X-ray photoelectron spectroscopy, we observed the activa

192 tion infrared spectroscopy, ellipsometry and X-ray photoelectron spectroscopy were used to follow the

193 g this method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensi

194 oxide layer on the surface, as determined by X-ray photoelectron spectroscopy, which likely prevented

195 with mass spectrometry analysis (TPD-MS) and X-ray photoelectron spectroscopy with an in situ heating

196 In situ techniques (X-ray photoelectron spectroscopy, X-ray absorption spect

197 y a combination of powder X-ray diffraction, X-ray photoelectron spectroscopy, X-ray fluorescence spe

198 odified electrode surface is demonstrated by X-ray photoelectron spectroscopy, X-ray reflectometry, c

199 MIP films before and after the treatment by X-ray photoelectron spectroscopy (XPS) also evidencing t

200 trochemical, infrared (IR) spectroscopy, and X-ray photoelectron spectroscopy (XPS) analyses evidence

201 Infrared (IR) and X-ray photoelectron spectroscopy (XPS) analyses indicate

202 condary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicate

203 The electrochemical and X-ray photoelectron spectroscopy (XPS) analyses of the r

204 X-ray photoelectron spectroscopy (XPS) analysis results

205 recent Report, Nakamura et al argue that our x-ray photoelectron spectroscopy (XPS) analysis was affe

206 serve as a valuable tool when combined with X-ray photoelectron spectroscopy (XPS) analysis.

207 Chemical analysis with X-ray photoelectron spectroscopy (XPS) and attenuated to

208 troscopy, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) and compared with

209 content and aggregate size, as confirmed by X-ray photoelectron spectroscopy (XPS) and dynamic light

210 X-ray photoelectron spectroscopy (XPS) and electrochemic

211 mechanisms are also investigated in terms of X-ray photoelectron spectroscopy (XPS) and electrochemic

212 hanisms of CMP are proposed according to the X-ray photoelectron spectroscopy (XPS) and electrochemic

213 X-ray photoelectron spectroscopy (XPS) and electron micr

214 d with hypochlorite solution and analyzed by X-ray photoelectron spectroscopy (XPS) and Fourier trans

215 y coupled plasma-mass spectrometry (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-trans

216 tionalized surfaces were characterized using X-ray photoelectron spectroscopy (XPS) and monitored wit

217 tron and adsorption spectroscopy techniques [X-ray photoelectron spectroscopy (XPS) and near edge X-r

218 characterization of the prepared samples by X-ray photoelectron spectroscopy (XPS) and optimization

219 The results of X-ray photoelectron spectroscopy (XPS) and reflection-ab

220 th the substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron r

221 The biosensor surfaces were optimized using X-ray photoelectron spectroscopy (XPS) and the ultra-hig

222 X-ray photoelectron spectroscopy (XPS) and time-of-fligh

223 X-ray photoelectron spectroscopy (XPS) and valence band

224 des associated with the catalyst, as well as X-ray photoelectron spectroscopy (XPS) and X-ray absorpt

225 on scanning electron microscopy (FE-SEM) and X-ray photoelectron spectroscopy (XPS) characterization

226 X-ray photoelectron spectroscopy (XPS) characterized a t

227 ) embedded within the polymer matrix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that th

228 X-ray photoelectron spectroscopy (XPS) confirmed the for

229 SWCNT during the biosensor construction and X-ray photoelectron spectroscopy (XPS) experiments confi

230 We use X-ray photoelectron spectroscopy (XPS) for characterizat

231 pressure published data obtained by in situ X-ray photoelectron spectroscopy (XPS) for the concentra

232 s were studied for their HER activity and by X-ray photoelectron spectroscopy (XPS) for the first tim

233 In the swim: until now, X-ray photoelectron spectroscopy (XPS) has been predomin

234 ta of identical wear tracks were obtained by X-ray photoelectron spectroscopy (XPS) imaging not only

235 (BSA) and fibronectin (FN) were measured by X-ray photoelectron spectroscopy (XPS) in ultrahigh vacu

236 Our X-ray photoelectron spectroscopy (XPS) investigation rev

237 de BODIPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows esti

238 ements of sugar release and by complementary X-ray photoelectron spectroscopy (XPS) measurements of t

239 termined here using a combination of SPR and X-ray photoelectron spectroscopy (XPS) measurements.

240 r|glassy carbon electrode (GCE), as shown by X-ray photoelectron spectroscopy (XPS) measurements.

241 transform infrared spectroscopy (FT-IR), and X-ray photoelectron spectroscopy (XPS) showed that the n

242 X-ray photoelectron spectroscopy (XPS) shows that upon e

243 NMR), Fourier transform infrared (FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy conf

244 X-ray photoelectron spectroscopy (XPS) studies confirm t

245 by electron paramagnetic resonance (EPR) and X-ray photoelectron spectroscopy (XPS) studies.

246 characterizations by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) support the prese

247 ncontact chemical and electrical measurement X-ray photoelectron spectroscopy (XPS) technique is perf

248 f this study were to evaluate the ability of X-ray photoelectron spectroscopy (XPS) to differentiate

249 ) spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for

250 ansform infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS) were used to char

251 R), X-ray absorption spectroscopy (XAS), and X-ray photoelectron spectroscopy (XPS) were used to dete

252 Comparing elemental depth-profiling by X-ray photoelectron spectroscopy (XPS) with detailed mod

253 Spectroscopic evidence (UV-vis, FT-IR, and X-ray photoelectron spectroscopy (XPS)) suggests that st

254 Experimental methods (TOF-SIMS, X-ray photoelectron spectroscopy (XPS)) were used in com

255 reflection absorption spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angl

256 icroscopy-energy dispersive X-ray (SEM-EDX), X-ray photoelectron spectroscopy (XPS), and Fourier tran

257 rier Transform Infrared Spectroscopy (FTIR), X-ray Photoelectron Spectroscopy (XPS), and Nano Seconda

258 lar depth profiling techniques such as SIMS, X-ray photoelectron spectroscopy (XPS), and other spatia

259 ion (GIAXRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and scanning tra

260 ier transform infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS), and x-ray diffra

261 cules by the MIP cavities was monitored with X-ray photoelectron spectroscopy (XPS), as manifested by

262 c analysis, UV-vis, energy-dispersive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total

263 This new nanoparticle was characterized by X-ray photoelectron spectroscopy (XPS), dynamic light sc

264 Raman spectroscopy, photoluminescence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transfor

265 WCNTs electrode has been characterized using X-ray photoelectron spectroscopy (XPS), Fourier transfor

266 racterized by the use of several techniques: X-ray photoelectron spectroscopy (XPS), Fourier transfor

267 ique combination of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbau

268 ne, and triclosan in batch experiments using X-ray photoelectron spectroscopy (XPS), Raman spectrosco

269 Transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Re K-edge X-ray

270 thermochemical exposure in combination with X-ray photoelectron spectroscopy (XPS), scanning electro

271 -BSA modified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), scanning electro

272 ier transform infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS), thermogravimetri

273 lver mirrors and AgNPs was confirmed through X-ray photoelectron spectroscopy (XPS), transmission ele

274 ultivariate MOFs (MTV-MOFs) were examined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visi

275 EM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), UV-vis diffuse r

276 e soft copolymer layer were characterized by X-ray photoelectron spectroscopy (XPS), water contact an

277 energy dispersive spectroscopy (SEM-EDS) and X-ray photoelectron spectroscopy (XPS), whereas the prec

278 on of the sensor surface was monitored using X-ray photoelectron spectroscopy (XPS), while the bindin

279 with transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray absorption

280 EM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffractio

281 ere characterized by electrochemistry and by X-ray photoelectron spectroscopy (XPS).

282 ased X-ray absorption spectroscopy (XAS) and X-ray photoelectron spectroscopy (XPS).

283 ng tunneling microscopy and spectroscopy and X-ray photoelectron spectroscopy (XPS).

284 tal reflection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS).

285 reflection (GA-ATR) FT-IR spectroscopy, and X-ray photoelectron spectroscopy (XPS).

286 e and in the presence of liquids by means of X-ray photoelectron spectroscopy (XPS).

287 ionization (LDI) mass spectrometry (MS) and X-ray photoelectron spectroscopy (XPS).

288 the overlayer is independently determined by X-ray photoelectron spectroscopy (XPS).

289 ments, Fourier transform infrared (FTIR) and X-ray photoelectron spectroscopy (XPS).

290 cterized by UV, circular dichroism (CD), and X-ray photoelectron spectroscopy (XPS).

291 oscopy, secondary ion mass spectrometry, and X-ray photoelectron spectroscopy (XPS).

292 ry structure, was quantitatively analyzed by X-ray photoelectron spectroscopy (XPS).

293 try (CV), atomic force microscope (AFM), and X-ray photoelectron spectroscopy (XPS).

294 scanning electron microscopy (SEM) and Fe 2p X-ray photoelectron spectroscopy (XPS).

295 etometer (VSM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS).

296 e (QCM), surface plasmon resonance (SPR) and X-ray photoelectron spectroscopy (XPS).

297 transmission electron microscopy (TEM), and X-ray photoelectron spectroscopy (XPS).

298 ytic TiO2 powder using near-ambient-pressure X-ray photoelectron spectroscopy (XPS).

299 , transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS).

300 uniformly modified columns were assessed via X-ray photoelectron spectroscopy (XPS).