ライフサイエンスコーパス: XPS

1 XPS analysis indicated more organically bound Br and les

2 XPS analysis of the magnetite electrodes polarized in ur

3 XPS analysis showed that 23-31% and 77-69% of sorbed Hg

4 XPS and Ag K-edge XANES analysis revealed that the impre

5 XPS and XANES measurements confirmed the assigned oxidat

6 XPS characterization studies of Pd-NZVI show Fe(0) oxida

7 XPS data demonstrate the dependence of the N 1s binding

8 XPS indicated that structurally incorporated U(VI) was r

9 XPS indicated the presence of both W(6+) and W(4+) in th

10 XPS is shown to be an important analytical tool to inves

11 XPS is used to assess the chemical composition of the fi

12 XPS measurements indicated that nearly 50% of Ce atoms a

13 XPS measurements of C16 COOH-SAMs on flat gold surfaces

14 XPS of N-CDs shows a peak at 285.3eV corresponds to the

15 XPS results showed that in chlorine treated FA PA membra

16 XPS showed a clear gradient in surface coverage along th

17 XPS shows significant degradation of the azide upon adso

18 ed CHx or C species are detected in the C 1s XPS region.

19 C 1s XPS spectra indicate that the Pt-SWNTs store hydrogen by

20 Fitting of C 1s XPS spectra suggests an increase in the number of aromat

21 the relative proportion of a 405.1 eV N 1s (XPS binding energy) species in the nanosheets.

22 tion in CdSe/CdS/ZnS QDs, we first develop a XPS signal subtraction technique capable of separating t

23 =150 degrees C and are characterized by AFM, XPS, X-ray reflectivity (2.3 nm repeat spacing), X-ray f

24 s STEM microscopy imaging with EDX analysis, XPS analysis, and SQUID magnetometry analysis of catalyt

25 Bond length analysis and XPS studies of Ce(33)Fe(13)B(18)C(34) indicate the ceriu

26 n was further confirmed by contact angle and XPS measurements.

27 substrate temperature of 350 degrees C, and XPS results show the deposited silicon chloride layer sa

28 substrate temperature of 250 degrees C, and XPS results show the deposited silicon hydride layer sat

29 vis, TGA, N2-adsorption, SEM, TEM, EDAX, and XPS.

30 cess and characterized by XRD, TEM, EDS, and XPS.

31 An extrapolation of the electrochemical and XPS data indicates the optimal behavior of this binary f

32 enerated from the thermal cutting of EPS and XPS were 13 times and 15 times higher than the concentra

33 ch allows quantification by fluorescence and XPS on one and the same sample.

34 We found that fluorescence and XPS signals correlate over at least 1 order of magnitude

35 city was quantified on the basis of FTIR and XPS analysis, which was consistent with F(-) uptake from

36 d N-doped carbon were confirmed by HRTEM and XPS.

37 hniques (CP/MAS (13)C NMR, Raman, FT-IR, and XPS) and high-resolution transmission electron microscop

38 -ray crystallography, (31)P NMR, CSI-MS, and XPS.

39 Merging data from MSI and XPS imaging exhibited that areas, where iron-fluorine bo

40 ctionalized precursors and FT-IR, Raman, and XPS analyses of the resulting GNRs.

41 Cu-NPs to the membrane surface with SEM and XPS after exposing the membrane to bath sonication.

42 l technique and was characterized by SEM and XPS.

43 e art techniques including XRD, TEM, SEM and XPS.

44 On the basis of the SERS and XPS results, BPE molecules are found to interact with th

45 improve the agreement between the SESSA and XPS results.

46 y a variety of tools, e.g., TEM, UV/vis, and XPS spectroscopies.

47 x 10(13) molecules/cm(2) by voltammetric and XPS analyses.

48 experiments based on cyclic voltammetry and XPS were carried out to follow the occurrence of the gra

49 More intriguingly, XANES and XPS results revealed complex redox transformation of the

50 haracterization techniques such as XANES and XPS, we were able to demonstrate that 10 nm Co NPs canno

51 nalysis by X-ray crystallography, XANES, and XPS.

52 yers on UO2 were characterized using XAS and XPS.

53 UV/Vis., FTIR spectroscopy, powder XRD, and XPS techniques.

54 Combining the newly constructed AP-XPS system, "dip &pull" approach, with a "tender" X-ray

55 ressure X-ray photoelectron spectroscopy (AP-XPS) experiments demonstrated that oxidized platinum Pt-

56 ressure X-ray photoelectron spectroscopy (AP-XPS), and environmental TEM.

57 ressure X-ray photoelectron spectroscopy (AP-XPS), we studied the adsorption and reactions of CO2 and

58 ressure X-ray photoelectron spectroscopy (AP-XPS).

59 hin-film approach and the use of "tender" AP-XPS highlighted in this study is an innovative new appro

60 An ambient pressure XPS (AP-XPS) endstation that is capable of detecting high kineti

61 AR-XPS profiles after electrochemical measurements in 0.1 M

62 Furthermore, ER/AR-XPS is shown to facilitate the determination of areic de

63 mentary energy and angle-resolved XPS (ER/AR-XPS) in the Si 2p core-level region was used to analyze

64 esolved X-ray photoelectron spectroscopy (AR-XPS), and density functional theory calculations.

65 esolved X-ray photoelectron spectroscopy (AR-XPS).

66 Furthermore, after comparing the AR-XPS spectra of finger arrays preclosed before exposure t

67 Recent work has now brought XPS into a new domain with the direct monitoring of bulk

68 us phase protein in the feed emulsion and by XPS measurements from the powder surface.

69 modification has been chemically assessed by XPS at each functionalization step.

70 ng structure on the BDD surface, assessed by XPS.

71 Resulting materials were characterized by XPS and low temperature nitrogen adsorption/desorption.

72 functionalized surface was characterized by XPS, electrochemistry, AFM, and STM.

73 lacing with Si-H termination as confirmed by XPS, and STS results confirm the saturated Si-Hx bilayer

74 lk electrolysis experiments was confirmed by XPS.

75 ty of Tc is Tc(IV), which is corroborated by XPS measurements.

76 ) is demonstrated to be hardly detectable by XPS measurements because of the short extent of the spac

77 fter reaction with triclosan was detected by XPS survey scans, while no Cl was detected in MnOx-pheno

78 es in the absolute thicknesses determined by XPS and ellipsometry on dried films and quartz crystal m

79 u(I) and more Au(0), as is also evidenced by XPS.

80 ation reaction has also been investigated by XPS and showed components related to the carboxylic grou

81 si-equilibrium surface densities measured by XPS corroborates the hypothesis that surface interaction

82 orbed on the catalyst surface as observed by XPS and EDX.

83 h results in domain fracture, is revealed by XPS analysis and ozone-dosing experiments.

84 f modified electronic structure, as shown by XPS, and ensemble effects, which facilitate the steps of

85 Cr XPS analysis indicates reduction to Cr(III) and the form

86 of these experiments, revealed by cryogenic XPS, provides further evidence that CIP oxidation procee

87 ) state, including by X-ray crystallography, XPS, and DFT calculations, all of which confirm metal-ce

88 characterized with SEM, XRD, TEM, SAED, EDX, XPS, UV-visible spectroscopy, and open-circuit potential

89 measurements, FT-IR spectroscopy, SEM, EDX, XPS, and TEM.

90 nce of well-defined Ir-cations, and TEM-EDX, XPS, (17)O NMR, and resonance-Raman spectroscopy data ar

91 lectrochemical impedance spectroscopy (EIS), XPS, and PM-IRRAS measurements as well as by AFM imaging

92 ere unraveled by spectroscopic ellipsometry, XPS, IRRAS, and DPV.

93 ded the best agreement with the experimental XPS data.

94 ch as SESSA, when combined with experimental XPS and STEM measurements, advances the ability to quant

95 ne foam (EPS) and extruded polystyrene foam (XPS).

96 we have shown that thicknesses derived from XPS data linearly correlated with spectroscopic ellipsom

97 o convert the concentration of nitrogen from XPS into an equivalent thickness of a protein film is pr

98 position and bonding chemistry obtained from XPS and ATR-FTIR revealed the impacts of two competing m

99 FTIR, XPS, and the surface charge distribution were performed

100 The grafting yields obtained by FTIR, XPS, and elemental analysis for core shell LiFePO4-C are

101 Product characterization by FTIR, XPS, Raman Spectroscopy, TEM, XRD, TOC, collectively dem

102 rized by several techniques including: FTIR, XPS, TGA, XRD, and XANES to probe their integrity.

103 ation was further studied with ESI-MS, FTIR, XPS and XANES characterizations.

104 characterization, including (13)C NMR, FTIR, XPS, UV-vis, DLS, and TEM.

105 sing a suite of spectroscopic (UV-vis, FTIR, XPS) and microscopic (AFM, SEM, and TEM) techniques.

106 mposite was characterized by TEM, XRD, FTIR, XPS, TGA, BET, and CV using the redox couples [Fe(CN)6](

107 ifferent synchrotron facilities and in-house XPS (1486.6 eV).

108 A nanoparticles were characterized by FT-IR, XPS, TEM, and SEM.

109 Employment of synchrotron-based methods (XPS; reference-free total reflection X-ray fluorescence,

110 Moreover, XPS analysis demonstrated that Zr(IV) interacts with oxa

111 The ICP-MS, XPS and FTIR data indicated that the P content on the Y-

112 ion and surface sensitivity of lab-based NAP-XPS, which affect precision and accuracy of the quantita

113 essure X-ray photoelectron spectroscopy (NAP-XPS) is a promising method to close the "pressure gap",

114 essure X-ray photoelectron spectroscopy (NAP-XPS) we show that a time scale of hours (t>/=4 h) is req

115 essure X-ray photoelectron spectroscopy (NAP-XPS).

116 techniques, including ATR FT-IR, HRMAS NMR, XPS, and EDX spectroscopy.

117 , but did not fully account for the observed XPS signal from the Au-core.

118 Analyses of XPS high-resolution spectra suggest that the Mn(III) con

119 The results of XPS and NanoSIMS analyses indicate that a fluoridated su

120 The results of XPS studies reveal that sufficient O-C=O groups present

121 Postreaction XPS showed that the majority of adsorbed arsenic existed

122 An ambient pressure XPS (AP-XPS) endstation that is capable of detecting hig

123 Experiments of ambient pressure XPS indicate that methane dissociates on Ni/CeO2 at temp

124 ytical techniques including ambient pressure XPS, ambient pressure STM, X-ray absorption spectroscopy

125 AlO)3Si(OH) sites are characterized by PXRD, XPS, DRIFTS of adsorbed NH3, CO, and pyridine, and (29)S

126 spectroscopy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of 10-100 nm thick PEDOT(PSS) film

127 This new way of data gathering reintroduces XPS as a major analytical tool for extracting electrical

128 High resolution XPS data support that chlorination increased the number

129 High-resolution XPS spectra revealed the formation of metal carbides on

130 Complementary energy and angle-resolved XPS (ER/AR-XPS) in the Si 2p core-level region was used

131 using XANES, EXAFS, TEM, and depth-resolved XPS.

132 ite and ball with optical profilometry, SEM, XPS and Auger spectroscopy.

133 The films were characterized by TEM, SEM, XPS, UV/vis, and AFM.

134 d phosphorus, and characterized by XRD, SEM, XPS, XRF, SAED and TEM measurements.

135 Ex situ XPS and XRD both show significant oxidation of the irrad

136 The in situ XPS data and DFT calculations show that the chemical ori

137 materials, X-ray photoelectron spectrometry (XPS) and secondary ion mass spectrometry (SIMS) were use

138 Both X-ray photoelectron spectrometry (XPS) and UV-vis results suggest that Con A binding with

139 X-ray photoelectron spectroscopic (XPS) analysis of C and N binding energies throughout the

140 Spectroscopy (XPS and XANES) solid analyses identified U (VI), As (-I

141 investigated by photoelectron spectroscopy (XPS or PES).

142 eatment by X-ray photoelectron spectroscopy (XPS) also evidencing the correlation between MIP chemica

143 scopy, and X-ray photoelectron spectroscopy (XPS) analyses evidence that both methods are suitable fo

144 d (IR) and X-ray photoelectron spectroscopy (XPS) analyses indicate citrate anions are adsorbed on Au

145 -SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicated binding of thiol- and amine-cont

146 emical and X-ray photoelectron spectroscopy (XPS) analyses of the reduced platinum evidence the prese

147 ve limited X-ray photoelectron spectroscopy (XPS) analysis of electrochemical cells to ex situ invest

148 X-ray photoelectron spectroscopy (XPS) analysis results showed a decrease in Cr content on

149 e that our x-ray photoelectron spectroscopy (XPS) analysis was affected by the presence of formate sp

150 bined with X-ray photoelectron spectroscopy (XPS) analysis.

151 lysis with X-ray photoelectron spectroscopy (XPS) and attenuated total reflectance fourier transform

152 (AFM), and X-ray photoelectron spectroscopy (XPS) and compared with a protein/lectin microarray.

153 nfirmed by X-ray photoelectron spectroscopy (XPS) and dynamic light scattering (DLS) experiments, whi

154 X-ray photoelectron spectroscopy (XPS) and electrochemical impedance spectroscopy (EIS) we

155 n terms of X-ray photoelectron spectroscopy (XPS) and electrochemical measurements.

156 ing to the X-ray photoelectron spectroscopy (XPS) and electrochemical measurements.

157 X-ray photoelectron spectroscopy (XPS) and electron microprobe analysis revealed a complex

158 nalyzed by X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared (FTIR).

159 (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-transform infrared spectroscopy (FTIR)

160 ized using X-ray photoelectron spectroscopy (XPS) and monitored with fluorescence microscopy at each

161 echniques [X-ray photoelectron spectroscopy (XPS) and near edge X-ray adsorption fine structure spect

162 samples by X-ray photoelectron spectroscopy (XPS) and optimization of the RIMS setup for this purpose

163 results of X-ray photoelectron spectroscopy (XPS) and reflection-absorption infrared spectroscopy (RA

164 s based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of

165 ized using X-ray photoelectron spectroscopy (XPS) and the ultra-high frequency electromagnetic piezoe

166 X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectroscopy

167 nd ex situ X-ray photoelectron spectroscopy (XPS) and using the Mn(II) oxygenation on hematite (alpha

168 X-ray photoelectron spectroscopy (XPS) and valence band studies were also used for the fir

169 as well as X-ray photoelectron spectroscopy (XPS) and X-ray absorption near edge structure spectrosco

170 E-SEM) and X-ray photoelectron spectroscopy (XPS) characterization results showed the presence of the

171 X-ray photoelectron spectroscopy (XPS) characterized a transient surface Fe(III) species d

172 ix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that they exist in the zero valent oxidat

173 X-ray photoelectron spectroscopy (XPS) confirmed the formation of the anchored ligands as

174 ftware and X-ray photoelectron spectroscopy (XPS) experimental measurements.

175 uction and X-ray photoelectron spectroscopy (XPS) experiments confirmed covalent immobilization of LO

176 We use X-ray photoelectron spectroscopy (XPS) for characterization of voltage drop variations of

177 by in situ X-ray photoelectron spectroscopy (XPS) for the concentration of Ce(3+) (the reactive speci

178 ity and by X-ray photoelectron spectroscopy (XPS) for the first time; MoB2 and beta-MoB show excellen

179 until now, X-ray photoelectron spectroscopy (XPS) has been predominantly applied to the investigation

180 btained by X-ray photoelectron spectroscopy (XPS) imaging not only enabling the determination of elem

181 easured by X-ray photoelectron spectroscopy (XPS) in ultrahigh vacuum at room temperature.

182 Our X-ray photoelectron spectroscopy (XPS) investigation revealed a distinctive atomic structu

183 X-ray photoelectron spectroscopy (XPS) is able to provide a straightforward quantitative a

184 metry, and X-ray photoelectron spectroscopy (XPS) label allows estimation of the labeling ratio, i.e.

185 etected by X-ray photoelectron spectroscopy (XPS) line width measurements, for radii of the QDs, R >

186 plementary X-ray photoelectron spectroscopy (XPS) measurements of the wood surfaces.

187 nd ex situ X-ray photoelectron spectroscopy (XPS) measurements, we have examined how the hydrogen upt

188 s shown by X-ray photoelectron spectroscopy (XPS) measurements.

189 of SPR and X-ray photoelectron spectroscopy (XPS) measurements.

190 T-IR), and X-ray photoelectron spectroscopy (XPS) showed that the nanowires had Si3N4@SiOx core-shell

191 X-ray photoelectron spectroscopy (XPS) shows that upon exposure to nitrogen dioxide the su

192 FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy confirmed alkoxy-terminated surfaces a

193 X-ray photoelectron spectroscopy (XPS) studies confirm that at the sample surface nitrogen

194 (EPR) and X-ray photoelectron spectroscopy (XPS) studies.

195 oscopy and X-ray photoelectron spectroscopy (XPS) support the presence of thin graphitic edges and re

196 easurement X-ray photoelectron spectroscopy (XPS) technique is performed to investigate a CdS-based p

197 oscopy and X-ray photoelectron spectroscopy (XPS) to bulk materials is relatively straightforward; ho

198 ability of X-ray photoelectron spectroscopy (XPS) to differentiate rice macromolecules and to calcula

199 (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for lignin-free model biomass samples

200 -FTIR) and X-ray photoelectron spectroscopy (XPS) were used to characterize foulants on membrane surf

201 (XAS), and X-ray photoelectron spectroscopy (XPS) were used to determine the composition of the adsor

202 ofiling by X-ray photoelectron spectroscopy (XPS) with detailed modeling and simulation of the optica

203 FT-IR, and X-ray photoelectron spectroscopy (XPS)) suggests that structural changes and loss of condu

204 (TOF-SIMS, X-ray photoelectron spectroscopy (XPS)) were used in combination with simulations (density

205 y (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angles of water.

206 (SEM-EDX), X-ray photoelectron spectroscopy (XPS), and Fourier transform infrared (FTIR) analysis of

207 py (FTIR), X-ray Photoelectron Spectroscopy (XPS), and Nano Secondary Ion Mass Spectroscopy (NanoSIMS

208 h as SIMS, X-ray photoelectron spectroscopy (XPS), and other spatially resolved mass spectrometric te

209 opy (AFM), X-ray photoelectron spectroscopy (XPS), and scanning transmission electron microscopy (STE

210 an spectroscopy, photoelectron spectroscopy (XPS), and SQUID magnetometry to gain information on its

211 y (FT-IR), X-ray photoelectron spectroscopy (XPS), and x-ray diffraction (XRD).

212 tored with X-ray photoelectron spectroscopy (XPS), as manifested by a negative shift of the binding e

213 ive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total reflectance Fourier transform inf

214 terized by X-ray photoelectron spectroscopy (XPS), dynamic light scattering (DLS), and infrared spect

215 ) imaging, X-ray photoelectron spectroscopy (XPS), fluorescence microscopy, and near edge X-ray absor

216 ized using X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FT-IR), s

217 ence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), at

218 echniques: X-ray photoelectron spectroscopy (XPS), Fourier transform-infrared (FT-IR) spectroscopy, h

219 ion (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbauer spectroscopy, and magnetization

220 ents using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and aqueous chemistry measurem

221 opy (TEM), X-ray photoelectron spectroscopy (XPS), Re K-edge X-ray absorption near-edge structure (XA

222 terized by X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM), quartz crystal

223 ation with X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and in situ X-

224 y (FT-IR), X-ray photoelectron spectroscopy (XPS), thermogravimetric analysis (TGA), and transmission

225 ed through X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), energy dis

226 xamined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visible diffuse reflectance spectra (U

227 opy (TEM), X-ray photoelectron spectroscopy (XPS), UV-vis diffuse reflectance spectroscopy (DRS), pho

228 terized by X-ray photoelectron spectroscopy (XPS), water contact angle, ellipsometry, and atomic forc

229 M-EDS) and X-ray photoelectron spectroscopy (XPS), whereas the precise quantitative measurement of th

230 ored using X-ray photoelectron spectroscopy (XPS), while the binding of cocaine to surface-attached M

231 opy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS), electron para

232 opy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and UV-Vis diffuse reflec

233 (CD), and X-ray photoelectron spectroscopy (XPS).

234 (XAS) and X-ray photoelectron spectroscopy (XPS).

235 oscopy and X-ray photoelectron spectroscopy (XPS).

236 (TXRF) and X-ray photoelectron spectroscopy (XPS).

237 scopy, and X-ray photoelectron spectroscopy (XPS).

238 y means of X-ray photoelectron spectroscopy (XPS).

239 y (MS) and X-ray photoelectron spectroscopy (XPS).

240 ermined by X-ray photoelectron spectroscopy (XPS).

241 (FTIR) and X-ray photoelectron spectroscopy (XPS).

242 and Fe 2p X-ray photoelectron spectroscopy (XPS).

243 (XRD), and X-ray photoelectron spectroscopy (XPS).

244 metry, and X-ray photoelectron spectroscopy (XPS).

245 nalyzed by X-ray photoelectron spectroscopy (XPS).

246 (AFM), and X-ray photoelectron spectroscopy (XPS).

247 (SPR) and X-ray photoelectron spectroscopy (XPS).

248 ectrons by X-ray photoelectron spectroscopy (XPS).

249 (TEM), and X-ray photoelectron spectroscopy (XPS).

250 t-pressure X-ray photoelectron spectroscopy (XPS).

251 (TEM) and X-ray photoelectron spectroscopy (XPS).

252 sessed via X-ray photoelectron spectroscopy (XPS).

253 try and by X-ray photoelectron spectroscopy (XPS).

254 determined using X-ray photon spectroscopy (XPS).

255 action (XRD), x-ray photo-electron spectrum (XPS), electrochemical impedance spectroscopy (EIS) and c

256 During C(60)(+) sputtering, XPS spectra indicated that the degrees of carbon deposit

257 diation-X-ray photoelectron spectroscopy (SR-XPS) were used to elucidate the mechanism of the POT thi

258 diation-X-ray photoelectron spectroscopy (SR-XPS), near edge X-ray absorption fine structure (NEXAFS)

259 copy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of 10-100 nm thick PEDOT(PSS) films.

260 phologies (SEM), porosities (BET), surfaces (XPS, O2-TPD/MS), and electrochemical properties (Tafel a

261 Characterization by TEM, XPS, and UV-vis spectroscopy shows that Au and Cu are al

262 was characterised by UV-vis, XRD, FTIR, TEM, XPS and Raman spectroscopy techniques.

263 The results of the study showed that XPS was able to differentiate rice polysaccharides (main

264 TIR spectra for the C = N and C-N bonds, the XPS spectra for the Li-N bonds from nMOF-867, and a visu

265 after extraction, respectively, of both the XPS peak of the N 1s electrons of the NT nitro groups an

266 imprinted polymer (MIP) was confirmed by the XPS analysis.

267 ent with the N-chlorination suggested by the XPS results.

268 re, while the use of a TPD device inside the XPS setup enabled the determination of the functional gr

269 ated elemental compositions that matched the XPS elemental compositions.

270 escape depth ( approximately 3-4 nm) of the XPS and NEXAFS photoelectrons used for analysis at 413 K

271 urface potential variations as shifts of the XPS Cd 3d(5/2) peak position without and under photoillu

272 ic marker are obtained by calibration of the XPS methods with reference-free TXRF.

273 An analysis of the XPS results obtained after exposing zinc oxide/copper (1

274 the deconvolution of the O1s envelope of the XPS spectra.

275 ons are proposed during CMP according to the XPS and electrochemical measurements.

276 Then we apply a correction formula to the XPS data and determine that the 2 nm stoichiometric CdSe

277 e molecules can be determined when using the XPS component intensity of the silane's silicon atom.

278 microbalance experiments, correlate with the XPS surface concentration, which provides unique evidenc

279 he label on the surface is available through XPS and photometry, a novel method to quantitatively acc

280 not chemisorb oxygen and were, according to XPS analysis, saturated by sulfide species.

281 According to XPS and Raman, the positive charge is proposed to transf

282 ing of quantitative fluorescence analysis to XPS quantification.

283 Many of the problems known to XPS depth profiling using laboratory equipment are there

284 troscopy with an in situ heating device (TPD-XPS) were combined in order to improve the characterizat

285 within these hosts have been achieved using XPS, TGA-MS, high resolution synchrotron X-ray diffracti

286 The NPs were characterized using XPS and scanning transmission electron microscopy (STEM)

287 e of NPSi and metal ions immersed-NPSi using XPS characterization.

288 H-SiC vertical heterostructure studied using XPS and UV-Vis-NIR spectroscopy.

289 ed by increasing Al and O concentrations via XPS and intense C( horizontal line O)O(-) stretching ban

290 While XPS is commonly employed to assess qualitatively the amo

291 ficant mass loss from the brush layer, while XPS studies confirm that exposure to UV radiation produc

292 lowing catalyst separation, which along with XPS characterization supports the fact that the effects

293 acking surface-localized fluorine atoms with XPS, by monitoring changes in carbon surface morphology

294 n- and solid-state NMR studies combined with XPS were used to probe, at the molecular scale, the comp

295 n details using FT-IR, UV/vis., FESEM, XEDS, XPS, TEM, and XRD techniques.

296 XRD, XPS, and ESR suggested the Na2Mo4O13/alpha-MoO3 hybrid c

297 aphene oxide according to the SEM, EDS, XRD, XPS, Raman and TGA results.

298 FTIR, XRD, XPS, and HRTEM measurements corroborate the formation of

299 With the aid of XRD, XPS, and GC-MS analysis, we confirm DMTS could undergo a

300 were characterized by TEM, SEM, UV-Vis, XRD, XPS, EIS, fluorescence, and photoelectrochemical method