ライフサイエンスコーパス: ellipsometry

1 uced membrane fluidity (measured by infrared ellipsometry).

2 s environments by employing in situ infrared ellipsometry.

3 c force microscopy, UV-vis spectroscopy, and ellipsometry.

4 ion, as well as Raman, IR, and spectroscopic ellipsometry.

5 osphatidylserine monolayers was estimated by ellipsometry.

6 dielectric function (<epsiloni>) obtained in ellipsometry.

7 properties are evaluated with spectroscopic ellipsometry.

8 er transform spectroscopy, and spectroscopic ellipsometry.

9 nied change in bilayer thickness detected by ellipsometry.

10 immunoreactions in total internal reflection ellipsometry.

11 ymers, as confirmed by FTIR spectroscopy and ellipsometry.

12 ntal data from microslit electrokinetics and ellipsometry.

13 total reflection infrared spectroscopy, and ellipsometry.

14 plasmon resonance (SPR) imaging and imaging ellipsometry.

15 electrochemical impedance spectroscopy, and ellipsometry.

16 lled carbon nanotubes (CNT) by spectroscopic ellipsometry.

17 is differentiable from the background using ellipsometry.

18 om IR absorbance values are substantiated by ellipsometry.

19 events on the grating were also confirmed by ellipsometry.

20 olipid bilayers using neutron reflection and ellipsometry.

21 n microscopy, epifluorescence microscopy and ellipsometry.

22 sonance energy through in situ spectroscopic ellipsometry allowed the nanoparticles to be easily cont

23 The ellipsometry analysis showed that both the real and imag

24 ness was evaluated by using a combination of ellipsometry and AFM height profiling, accompanied by se

25 We therefore used the techniques of ellipsometry and atomic force microscopy (AFM) to invest

26 Ellipsometry and Fourier transform-infrared (FT-IR) data

27 iodooctane directly after spin-coating using ellipsometry and ion beam analysis, while using small an

28 al activity and LPS binding as observed from ellipsometry and isothermal titration calorimetry.

29 (GSH), has been developed by combination of ellipsometry and Kretschmann surface plasmon resonance (

30 Here we report far-infrared ellipsometry and low-frequency dielectric measurements i

31 After transfer to a gold surface, ellipsometry and PM IRRAS yield tilt angles of 29 +/- 4

32 of the multilayer structure was verified by ellipsometry and sensor function characterized electroch

33 Ellipsometry and surface plasmon resonance spectroscopy

34 on these surfaces was characterized by using ellipsometry and the orientational behavior of liquid cr

35 surfaces were characterized by spectroscopic ellipsometry and wetting.

36 Reflection-absorption infrared spectroscopy, ellipsometry and X-ray photoelectron spectroscopy were u

37 the optical layer thickness (determined with ellipsometry) and the acoustic layer thickness (determin

38 ron spectroscopy (XPS), water contact angle, ellipsometry, and atomic force microscopy (AFM).

39 c voltammetry, scanning electron microscopy, ellipsometry, and atomic force microscopy were used to c

40 using atomic force microscopy, spectroscopic ellipsometry, and reflection-absorption infrared spectro

41 terized by water contact angle measurements, ellipsometry, and X-ray photoelectron spectroscopy.

42 ansform infrared spectroscopy, spectroscopic ellipsometry, and X-ray photoemission spectroscopy shows

43 and characterized comprehensively by RAIRS, ellipsometry, and XPS.

44 Raman spectroscopy and ellipsometry are also consistent with the "In-P-Ge3" bui

45 h modification step was monitored by imaging ellipsometry as the thickness increased with each modifi

46 ilized SAv is quantified using spectroscopic ellipsometry by monitoring binding of biotinylated probe

47 ere characterized by ultraviolet absorption, ellipsometry, circular dichroism, and polarized Fourier

48 py, X-ray and UV photoelectron spectroscopy, ellipsometry, contact angle goniometry, differential pul

49 The monolayers were characterized by ellipsometry, contact angle goniometry, polarization mod

50 s characterized using infrared spectroscopy, ellipsometry, contact angle measurements, and atomic for

51 n spectroscopy, quartz crystal microbalance, ellipsometry, contact angle measurements, atomic force m

52 of the OTMS SAMs and characterization using ellipsometry, contact angle, atomic force microscopy (AF

53 We have applied surface-enhanced ellipsometry contrast (SEEC) imaging for time-resolved l

54 ped a unique technique, wet-surface enhanced ellipsometry contrast (Wet-SEEC), which magnifies the co

55 urface characterization techniques including ellipsometry, cyclic voltammetry (CV), and X-ray photoel

56 data linearly correlated with spectroscopic ellipsometry data on the same samples with a scatter of

57 The RAIR spectra, ellipsometry data, and wetting properties show that the

58 ished by fluorescence microscopy and imaging ellipsometry data.

59 ncluding: UV-vis spectroscopy, spectroscopic ellipsometry, electrochemistry, synchrotron X-ray reflec

60 GSL and antibody films were confirmed using ellipsometry, Fourier transform infrared spectroscopy (F

61 nd dry polymer brushes were analyzed by AFM, ellipsometry, FT-IRRAS, and surface plasmon resonance (S

62 s carried out by sessile drop contact angle, ellipsometry, grazing angle FT-IR spectroscopy, and elec

63 ntages make the technique of optical imaging ellipsometry (IE) highly suitable for quantitative chara

64 plasmon resonance imaging (SPRI) and imaging ellipsometry (IE) measurements are realized with a singl

65 ntial grafting of initiator and polymer, and ellipsometry indicated the formation of polymer coatings

66 ained by atomic force microscopy and imaging ellipsometry indicating continuous transport and deposit

67 for the validation of the porosity results, ellipsometry, interference fringes method (IFM), and foc

68 crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneo

69 during electrodeposition with spectroscopic ellipsometry measurements in order to ensure accurate in

70 quartz crystal microbalance-dissipation and ellipsometry measurements in order to investigate how a

71 troscopy, Raman microscopy and spectroscopic ellipsometry measurements on hBN confirm the formation o

72 Spectroscopic ellipsometry measurements reveal a 40-50% reduction in t

73 Ellipsometry measurements show that the films are highly

74 by combined quartz crystal microbalance and ellipsometry measurements.

75 e material was determined from spectroscopic ellipsometry measurements.

76 monolayers using epifluorescence and imaging ellipsometry measurements.

77 Nonlinear optical null ellipsometry (NONE) measurements of chiral interfaces al

78 nabled simultaneous nonlinear optical Stokes ellipsometry (NOSE) and polarized laser transmittance im

79 The application of nonlinear optical Stokes ellipsometry (NOSE) coupled with principal component ana

80 e absolute thicknesses determined by XPS and ellipsometry on dried films and quartz crystal microbala

81 eatures were characterized by contact angle, ellipsometry, optical, and atomic force microscopies.

82 ron and X-ray reflectivity and spectroscopic ellipsometry over a wide range of relative humidity (RH)

83 eement with the responses predicted from SHG ellipsometry polarization measurements.

84 was confirmed by corroborating evidence from ellipsometry, reflectance FTIR, XPS, cyclic voltammetry,

85 udied by contact angle measurements, optical ellipsometry, reflection absorption infrared spectroscop

86 ay photoelectron spectroscopy, spectroscopic ellipsometry, reflection-absorption infrared spectroscop

87 Spectral ellipsometry revealed that all tested sauces led to the

88 lectrochemical impedance spectroscopy (EIS), ellipsometry, scanning electron microscopy (SEM), atomic

89 toelectron spectroscopy (XPS), spectroscopic ellipsometry (SE), and high-resolution electron energy l

90 lipsometric parameter, Psi, of spectroscopic ellipsometry (SE), for the rapid, simultaneous identific

91 ) as well as physFN ones using spectroscopic ellipsometry (SE), Fourier transform infrared spectrosco

92 Infrared spectroscopy (IRS), spectroscopic ellipsometry (SE), water contact angle (CA), and X-ray p

93 Resonance Raman and ellipsometry spectra indicate a band-gap reduction relat

94 teristics with applications in spectroscopic ellipsometry, spectropolarimetry, communications, imagin

95 tion, for surface plasmon resonance enhanced ellipsometry (SPREE) studies and assess the reactive coa

96 Spectroscopic ellipsometry, surface plasmon resonance, and AIR were th

97 Total internal reflection ellipsometry (TIRE) has been applied for the investigati

98 tion method called total internal reflection ellipsometry (TIRE).

99 and quantified by total internal reflection ellipsometry (TIRE).

100 were detected via total internal reflection ellipsometry (TIRE).

101 optical method of total internal reflection ellipsometry (TIRE).

102 with ice between 243 and 186 K by using (i) ellipsometry to monitor the ice surface and (ii) coated-

103 Here, we use ellipsometry to quantify specific interactions of recept

104 photoelectron spectroscopy and spectroscopic ellipsometry to show that the metallic phase produced by

105 situ combination of QCM-D with spectroscopic ellipsometry unambiguously demonstrates that the conform

106 wavelength dispersion measured by reflection ellipsometry (using a Teng-Man apparatus) and attenuated

107 ce microscopy, scanning electron microscopy, ellipsometry, UV, and laser desorption ionization MS (LD

108 In situ potentiometry and null ellipsometry was combined and used as a tool to follow t

109 Spectroscopic ellipsometry was used to measure optical and surface pro

110 Spectroscopic ellipsometry was utilized to follow in situ photodegrada

111 Using ellipsometry, we found that antiphospholipid IgGs reduce

112 anning electron microscopy and spectroscopic ellipsometry were used to characterize the surface morph

113 Kerr spectroscopies along with spectroscopic ellipsometry were used to deduce the complete permittivi

114 Reflectance FT-IR spectroscopy and ellipsometry were used to determine the amount of protei

115 the MIP film were unraveled by spectroscopic ellipsometry, XPS, IRRAS, and DPV.