ライフサイエンスコーパス: ion beam

1 spectra were obtained using a Bi3(+) primary ion beam.

2 copy on cross-sections prepared by a focused ion beam.

3 They are analyzed by a 500 eV Cs(+) primary ion beam.

4 or C60(2+) and, for comparison, an Ar2000(+) ion beam.

5 interrogated using a 40 keV C(60)(+) primary ion beam.

6 urfaces by TOF-SIMS using a Bi(3)(+) primary ion beam.

7 rs by removing the need to pulse the primary ion beam.

8 t transmission, and spot size of the primary ion beam.

9 film during its growth using a soft-landing ion beam.

10 glancing angles of incidence of the primary ion beam.

11 ion following continued bombardment with the ion beam.

12 te with a 1 eV hydronium (D(3)O(+)) or Cs(+) ion beam.

13 rface is induced by a directional low-energy ion beam.

14 edominantly parallel to the direction of the ion beam.

15 e repulsion between the positive ions in the ion beam.

16 to reduce the space charge repulsion in the ion beam.

17 vely focused and transmitted as a collimated ion beam.

18 e surface is in sputter equilibrium with the ion beam.

19 eam would be similar to that expected for an ion beam.

20 gressive removal of material using a focused ion beam.

21 stationary nuclei for nuclear reactions with ion beams.

22 reasing energy and, hence, efficiency of the ion beams.

23 during imaging experiments utilizing focused ion beams.

24 ment (SF5+) as compared to monatomic primary ion beams.

25 a function of depth by using cluster primary ion beams.

26 ow-energy (electronvolt range) mass-selected ion beams.

27 perturbation introduced by a focused lithium ion beam(12).

28 d by scanning EM images generated by focused ion beam ablation.

29 d, which is the major distinctive feature of ion beam activation.

30 lical path surrounding the laser-accelerated ion beams, addresses these shortcomings simultaneously.

31 Ion beam analysis (IBA) is a cluster of techniques inclu

32 FM), scanning electron microscopy (SEM), and ion beam analysis (IBA).

33 ion, an integrated study of ion irradiation, ion beam analysis and atomistic simulations are carried

34 at were analyzed for elemental content using ion beam analysis techniques.

35 ly after spin-coating using ellipsometry and ion beam analysis, while using small angle neutron scatt

36 e-of-the-art electron microanalysis (focused ion beam and aberration-corrected transmission electron

37 ined lesions after sectioning with a focused ion beam and found that the spherical particles are comp

38 Recent work has demonstrated that focused ion beam and layer-by-layer electron-beam lithography ca

39 lter, a bending quadrupole that deflects the ion beam and prevents neutral molecules originating in t

40 easing electrode tortuosity by using focused ion beam and scanning electron microscopy.

41 ter at these dimensions that uses low-energy ion beams and reveals surprising atomic transport phenom

42 ss spectrometric analysis (12 kV Ga+ primary ion beam), and through X-ray photoelectron spectroscopy

43 tudy of the suitability of argon gas cluster ion beams (Ar-GCIBs) of general composition Ar(n)(+), wh

44 erials that have been milled using a focused ion beam are presented.

45 High-energy ion beams are successfully used in cancer therapy and pr

46 depth profiles, especially the argon cluster ion beam, as it is characterized by a greater homogeneit

47 mination associated with thinning by focused ion beam, as well as those arising from gold fiducial ma

48 Uptake of MENPs was confirmed using focused-ion-beam assisted transmission electron microscopy (FIB-

49 nt responses over a wide spectrum by focused-ion-beam based patterning and folding of thin film nanos

50 Order is induced by exposure to an ion beam because unfavourably oriented rings of atoms ar

51 This approach eliminates defocusing of the ion beam by the ion-transfer optics as a function of ion

52 The focused ion beam can also be used as a sculpting tool to create

53 caused during the erosion of a surface by an ion beam can lead to the formation of self-organized pat

54 reat impetus to the practical improvement of ion-beam cancer therapy and the development of more effi

55 n funnel in the ESI interface, improving the ion beam characteristics in a quadrupole-electrostatic i

56 Ion beams create radiation damage efficiently without ma

57 The focused and scanned ion beam creates an opportunity to analyze very small vo

58 The development of cryo-focused ion beam (cryo-FIB) for the thinning of frozen-hydrated

59 For (10)Be analysis, the AMS ion beam current is most adversely affected by the prese

60 tensity was revealed by comparing continuous ion beam current with the amplitude of the pulsed ion cu

61 rse and longitudinal emittance, laser-driven ion beams currently have limitations in terms of peak io

62 onal Laboratories (LLNL) indicating that AMS ion beam currents are impacted by certain elemental impu

63 der to minimize impurities that suppress AMS ion beam currents, we evaluate, using inductively couple

64 turn limited by the intensity of AMS stable ion beam currents.

65 ed on milling of materials where sub-surface ion beam damage does not inhibit device performance.

66 h vacuum (10(-7) mbar) using an electrospray ion beam deposition (ES-IBD) setup.

67 e were prepared by soft-landing electrospray ion beam deposition, which allows chemical- and conforma

68 rge ratio selection in gas-phase, low-energy-ion-beam deposition into a (co-condensed) inert gas matr

69 tigated the photoionization of gas-phase and ion-beam desorbed dopamine using femtosecond laser pulse

70 f ion yields obtained for photoionization of ion-beam-desorbed dopamine at 267 nm to that for SIMS sh

71 Photoionization of ion-beam-desorbed dopamine exhibits a large degree of fr

72 re which determines the maximum instrumental ion beam diffusion under limited and controlled space ch

73 tection efficiency, detector saturation, and ion beam divergence account for the entirety of the obse

74 .3 pC/mum(2) shows a complex dependence upon ion beam dose.

75 ty amplifiers, (238)U(17)O2 and (238)U(18)O2 ion beams down to 1.6 fA have been monitored simultaneou

76 ii) the strong cell-killing effect of carbon-ion beams due to poor repair of carbon-ion beam-induced

77 Further we demonstrate that ion beams, due to their positive charging nature, may be

78 By incorporating the use of a focused ion beam during analysis, for the first time it is possi

79 progress in laser-driven quasi-monoenergetic ion beams enabled the production of uniformly heated war

80 Such ion beams exhibit unprecedented characteristics--short p

81 d by erosion of organic materials by cluster ion beams exhibits a strong dependence upon temperature.

82 ering system that provides fine control over ion beam exposure and sample temperature.

83 hy of Escherichia coli cells, that a focused ion beam (FIB) can be used to thin whole frozen-hydrated

84 terference fringes method (IFM), and focused ion beam (FIB) cross sectioning were employed as indepen

85 Focused ion beam (FIB) cutting of the apex of the ME was used to

86 milled into glass substrates with a focused ion beam (FIB) instrument, and the funnel design had a c

87 thylsiloxane (PDMS) upon exposure to focused ion beam (FIB) leading to ordered surface wrinkles.

88 le-stranded lambda-phage DNA through focused ion beam (FIB) milled nanochannels is described.

89 2)-10(3) cylindrical nanochannels by focused ion beam (FIB) milling and subsequently sandwiched betwe

90 >/=20 mum) microchannel features and focused ion beam (FIB) milling for smaller (</=10 mum) microwell

91 we describe a procedure, based upon focused ion beam (FIB) milling for the preparation of thin (200-

92 Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machi

93 pore radius (ra) were fabricated by focused ion beam (FIB) milling of silicon nitride (SiN) membrane

94 insulate a gold-coated nanopipet and focused ion beam (FIB) milling to precisely expose a UME at the

95 ve been fabricated by postinsulation focused ion beam (FIB) milling.

96 ray computed tomography (CT), plasma focused ion beam (FIB) scanning electron microscope (SEM) imagin

97 and distribution of nitrogen within focused ion beam (FIB) slices containing these nanoinclusions.

98 e of a solid-state nanopore inside a focused-ion beam (FIB) system.

99 ulled micropipet is milled using the focused ion beam (FIB) technique to be smoother, better aligned,

100 The focused ion beam (FIB) technique was employed to precisely fabri

101 particles are further analyzed with focused ion-beam (FIB) tomography, whereby a series of thin slic

102 canning (SEM) Electron Microscopy on Focused Ion Beam foils.

103 pectrometry (TOF-SIMS) imaging using a Au(+) ion beam for analysis in conjunction with a C(60)(+) ion

104 s illustrate the successful use of a cluster ion beam for greatly enhancing the high-mass fragment io

105 for analysis in conjunction with a C(60)(+) ion beam for sputter depth profiling.

106 Finally, the effectiveness of a C(60)(+) ion beam for use in 3D characterization of organic syste

107 r study shows feasibility to use high-energy ion beams for creation of cardiac lesions that chronical

108 the unique sputtering properties of cluster ion beams for molecular depth profiling.

109 nhance the yield and quality of laser-driven ion beams for practical applications.

110 Results showed that ion beams formed in wire sets, retained their shape with

111 d In(2)O(3)) created by direct-write focused ion beam (Ga(+)) implantation within an insulating oxide

112 -micron structures, an Ar2500(+)-gas cluster ion beam (GCIB) sputter was recently engineered.

113 onstrate the advantages of using gas cluster ion beams (GCIBs) in combination with trifluoracetic aci

114 S, through the implementation of gas cluster ion beams (GCIBs), now permit the analysis of higher mas

115 ion of new higher energy (40 kV) gas cluster ion beams (GCIBs), time-of-flight secondary ion mass spe

116 The instrument uses both helium and neon ion beams generated by a gas field ion source to irradia

117 due to space charge effects in the octapole ion beam guide following the ion funnel.

118 ediated reactions, a prototype water cluster ion beam has been developed using supersonic jet expansi

119 t decade, buckminsterfullerene (C(60))-based ion beams have been utilized in surface analysis instrum

120 Cluster ion beams have revolutionized the analysis of organic su

121 (Q1), potentially giving a quasi-continuous ion beam ideally suited to the oaTOF used for mass analy

122 Multiplexed ion beam imaging (MIBI) is capable of analyzing up to 10

123 act alignment process, which uses low-energy ion beams impinging at a glancing angle on amorphous ino

124 entres in diamond nanostructures via focused ion beam implantation with approximately 32 nm lateral p

125 s sputter deposited on silver using an argon ion beam in order to investigate these parameters and to

126 the ions from the two sources into a single ion beam in the intermediate region after ion extraction

127 mass analyzer employs the trapping of pulsed ion beams in an electrostatic quadro-logarithmic field.

128 n-depth primer to the application of focused ion beams in biology, including a guide to the practical

129 and angiotensin II) by water cluster primary ion beams in comparison to argon cluster beams over a ra

130 Although carbon contamination induced by ion beams in target materials is a well-known issue in s

131 overed the coexistence of two isomers in the ion beam, including the one with the Al=Al double bond.

132 h periodic structure was deposited by helium ion beam induced deposition (IBID) on the surface of FNW

133 arbon-ion beams due to poor repair of carbon-ion beam-induced DSBs regardless of EGFR mutation status

134 ionization efficiency and minimizing primary ion beam-induced fragmentation of analytes, ME-SIMS has

135 MRI and time-of-flight PET for staging, and ion beam-induced PET scanning and near-infrared fluoresc

136 nd samples may be relentlessly probed before ion-beam-induced molecular damage is observed.

137 directly in glass substrates with a focused ion beam instrument assisted by an electron flood gun.

138 e-pulse measurements, we have used a focused ion beam instrument to mill nanofluidic devices with 2,

139 closely spaced microchannels with a focused ion beam instrument, and the nanochannels had half-depth

140 In addition, low ion beam intensity counting statistics combined with Far

141 drift region, which modulates the continuous ion beam into spatially narrow packets.

142 ier transform mass spectrometer, followed by ion beam introduction.

143 olyimide, ion beam-irradiated polyimide, and ion beam-irradiated diamondlike carbon films-with the di

144 hree carbonaceous surfaces-rubbed polyimide, ion beam-irradiated polyimide, and ion beam-irradiated d

145 t magnetic properties using low-dose focused ion beam irradiation is demonstrated for bilayers of two

146 ere, we report the effects of focused helium ion beam irradiation on the structural, optical and elec

147 Accelerator-based ion beam irradiation techniques have been used to study

148 Here, using a combination of ion beam irradiation, transmission electron microscopy a

149 III-V semiconductors (particularly GaSb) via ion beam irradiation.

150 direction perpendicular to the direction of ion beam irradiation.

151 The ion beam is generated with a microwave plasma gun instal

152 Specifically, the primary ion beam is operated as a continuous rather than a pulse

153 In this study a C60(2+) ion beam is used to depth profile a polystyrene film.

154 Here a focused ion beam is used to pattern multiple light windows on a

155 thin films by erosion with energetic cluster ion beams is a unique aspect of secondary ion mass spect

156 By multiplexing the ion beam, it is possible to successfully obtain drift ti

157 oach relies on the development of a parallel ion beam lithographic technique, which assures the time-

158 By combining template stripping with focused ion beam lithography, a variety of aperture-based near-f

159 -induced dissociation techniques in a guided ion beam mass spectrometer, where M+ = Li+, Na+, and K+

160 Guided ion beam mass spectrometry (GIB-MS) employing a quadrupo

161 (adenine) with xenon is studied using guided ion beam mass spectrometry.

162 Evidence obtained by guided-ion-beam mass spectrometry experiments and density funct

163 Employing guided-ion-beam mass spectrometry, we identified a series of po

164 In addition, the C(60) ion beam may be focused to a spot of 1.5 microm in diame

165 nes, these results suggest that C60+ primary ion beams may improve the prospects for TOF-SIMS studies

166 rod arrays were fabricated using the focused ion beam method (denoted as fibAu_NR).

167 Here, we use a pulsed ion beam method to study defect dynamics in Si bombarded

168 Here, we use a pulsed-ion-beam method to study defect interaction dynamics in

169 Here, we use a novel pulsed-ion-beam method to study dynamic annealing in 4H-SiC ion

170 MS, accelerator MS, transmission EM, focused ion-beam microscopy, atom probe tomography, X-ray absorp

171 g of the local electric field, using focused ion beam milled defects in thin single crystal lamellae

172 Focused ion beam milling allows manipulation of the shape and si

173 structured arrays were fabricated by focused ion beam milling and their electrochemical response from

174 mydomonas cells were thinned by cryo-focused ion beam milling and then visualized by cryo-electron to

175 fects and limitations when thinning, focused ion beam milling can be used to fabricate custom geometr

176 Mapping plus focused ion beam milling combined with transmission electron mic

177 ll interior exposed by site-specific focused ion beam milling demonstrate that in-plane resolutions o

178 re formed at nanopores fabricated by focused ion beam milling of silicon nitride (SiN) membranes, ena

179 By combining cryo-focused ion beam milling of vitreous Chlamydomonas cells with cr

180 Here, we applied cryo-focused ion beam milling, cryo-electron tomography and subtomogr

181 techniques including micromachining, focused ion beam milling, two-photon polymerization, and bottom-

182 data on cross sections, prepared by focused ion beam milling, were collected, using various electron

183 oducible plasmonic nanostructures by focused ion beam milling.

184 ricated over a glass substrate using focused ion beam milling.

185 iconductor processing techniques and focused ion beam milling.

186 ock, and for sequential data collection with ion beam milling; all this takes approximately 90 h.

187 f isotropic 8 nm voxels collected by focused ion-beam milling scanning electron microscopy.

188 electron microscope grid by gallium focused-ion-beam milling.

189 ying sizes can be easily prepared by focused ion-beam milling.

190 t equipped with an X-ray detector, a gallium-ion beam mills the particle, while the electron beam ima

191 not significantly influence parameters like ion-beam mixing or the altered-layer thickness.

192 The technique is based on pseudorandom ion beam modulation and three-dimensional ( x, y, t) ion

193 translate 3D-microscopy techniques (focused ion beam nanotomography, FIB-nt) typically used in the b

194 pability is not as good as large gas cluster ion beams, NO dosing comprises a useful low-cost alterna

195 The O2 gas cluster ion beam (O2-GCIB) exhibits an erosion rate comparable t

196 w nm, well below the diameter of the primary ion beam of the NanoSIMS instrument or even the best sup

197 al cells were irradiated with 290 MeV carbon ion beams of approximately 110 keV/ micro m or 4 MV X-ra

198 s achieved either by ablation with a focused ion beam or by serial block face diamond knife microtomy

199 ritten in the substrate using either Focused Ion Beam or wet etching through a block co-polymer mask.

200 ive biological effectiveness (RBE) of carbon-ion beams over X-rays.

201 The introduction of polyatomic ion beams, particularly C60, for TOF-SIMS analysis has c

202 r irradiation parameters, and the subsequent ion-beam polishing enables further dimensional reduction

203 ompound into a new material using low-energy ion-beam preferential etching (IBPE).

204 nt Shubnikov-de Haas oscillations in focused-ion-beam-prepared microstructures of Cd3As2 that are con

205 Focused ion beams, previously restricted to the materials scienc

206 In order to characterize the effects of ion beam processing on the samples, we use a variety of

207 lized without the need for scanning electron/ion beam processing, UV exposure, or wet etching on targ

208 es as a technique to provide feedback on the ion beam profile.

209 An ion beam (radius approximately 50 nm) induces a picomete

210 A primary ion beam (ReO4-) was fired on axis through the ion trap,

211 The unique sputtering properties of the C60 ion beam result in successful molecular depth profiling

212 Focused ion beam scanning electron microscopy (FIB-SEM) and seri

213 Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can auto

214 , we used a combination of light and focused ion beam scanning electron microscopy (FIB-SEM) to deter

215 nstrate that a new imaging modality, focused ion beam scanning electron microscopy (FIB-SEM), can be

216 l sections, electron tomography, and focused ion beam scanning electron microscopy (FIB-SEM).

217 as 'volume electron microscopy' or 'focused ion beam scanning electron microscopy (FIB/SEM)' applied

218 es, including three-dimensional (3D) focused ion beam scanning electron microscopy, we determined the

219 Focused-ion-beam scanning electron microscopy (FIB-SEM) has beco

220 Use of focused ion-beam scanning electron microscopy (FIB-SEM) to inves

221 Focused ion beam, scanning and transmission electron microscopy

222 Here we use two-photon imaging and focused ion beam-scanning electron microscopy to explore, at syn

223 Here, we have used focused ion beam-scanning electron microscopy to generate 3D rec

224 we demonstrate the use of dual-beam focused ion beam-scanning electron microscopy to make a complete

225 Transmission electron microscopy and focal ion beam-scanning electron microscopy with Annexin V imm

226 ions of mesophyll tissue obtained by focused ion beam-scanning electron microscopy.

227 Focused ion beam/scanning electron microscope tomography reveals

228 lectron tomography, and large volume focused ion beam/scanning electron microscopy (FIB/SEM), we dete

229 Autoradiography and focused ion beam/scanning electron microscopy techniques were us

230 Here we introduce ion beam-sculpted microcantilevers that enable precise f

231 We show that ion-beam sculpting can be used to fashion an analogous s

232 We call the method "ion-beam sculpting", and apply it to the problem of fabr

233 the guided etching of polymer films, focused ion-beam sculpting, and electron-beam lithography and tu

234 Gas cluster ion beam-secondary ion mass spectrometry (GCIB-SIMS) has

235 ocumented using high-resolution cryo-focused ion beam-SEM serial imaging.

236 , CN(-), S(-), P(-)) due to a larger primary ion beam size.

237 or surface nanopatterned by normal incidence ion beam sputtering are age-dependent and slow down with

238 We report a regime of ion beam sputtering that occurs for sufficiently steep s

239 a range of materials, commonly used cluster ion beams such as C60(n+) do not yield useful depth prof

240 The introduction of polyatomic ion beams, such as C(60), has provided the associated ab

241 e any more low-mass fragments than any other ion beam system does.

242 C60 is shown to be a very favorable ion beam system for TOF-SIMS, delivering high yield, clo

243 A buckminsterfullerene (C60)-based primary ion beam system has been developed for routine applicati

244 The ion beam system is described, and its performance is cha

245 ed dissociation (CID) with Xe using a guided ion beam tandem mass spectrometer (GIBMS).

246 A guided-ion beam tandem mass spectrometer is used to study the r

247 Guided ion beam tandem mass spectrometry techniques are used to

248 mino acids (AAs) are determined using guided ion beam tandem mass spectrometry techniques.

249 idomimetic bases are determined using guided ion beam tandem mass spectrometry techniques.

250 of M(+)(AAA) with Xe is studied using guided ion beam tandem mass spectrometry.

251 An ion beam technique has been developed that combines some

252 nd transmission electron microscopy, focused ion beam techniques, synchrotron infrared spectroscopy,

253 Recent advances in focused ion beam technology have enabled high-resolution, maskle

254 robably naive to think that there will be an ion beam that will be applicable in all situations.

255 terned into discrete islands using a focused ion beam, the clamping effect is significantly reduced,

256 se results provide an implication that heavy ion beam therapy could be superior to conventional photo

257 Ion-beam therapy provides advances in cancer treatment,

258 r, and a quadrupole bender that deflects the ion beam, thereby preventing neutral contaminants from i

259 We focus on using the ion beam to control the thickness of Bi2Se3 and to creat

260 dified commercial cantilevers with a focused ion beam to optimize their properties for SMFS.

261 of laser produced proton, neutron, and heavy ion beams, together with isotope and isomer production.

262 l and slice spacing) were acquired and (12)C ion beam treatment planning (optimal accelerator energie

263 n microscope equipped with a focused gallium ion beam, used to sequentially mill away the sample surf

264 Simultaneous detection of Fe isotope ion beams using multiple Faraday collectors facilitates

265 g and with sample cooling) and argon cluster ion beams (using Ar1500(+) ions at 5 keV).

266 ms of charged particles, such as protons and ion beams.Vortex electron beams are generated using sing

267 A C60+ ion beam was used with computer-controlled analyses and

268 e, by selectively exposing material with the ion beam, we demonstrate a simple yet highly tunable met

269 spectrometer (LIT-MS) via modulation of the ion beam with a linear frequency chirp.

270 be injected orthogonally into the analytical ion beam with independent control of both the ion and el

271 veloped buckminsterfullerene (C(60)) primary ion beam with time-of-flight secondary ion mass spectrom

272 e experimental demonstration of laser-driven ion beams with narrow energy spread and energies up to 1

273 exciting applications, many of which require ion beams with simultaneous narrow energy spread and hig

274 Graphene was processed using a He(2+) ion-beam with a Gaussian distribution or by exposure to

275 time allows for the continuous selection of ion beams within a narrow range of mobilities that are f