コーパス検索結果 (1語後でソート)
  通し番号をクリックするとPubMedの該当ページを表示します
  
   1  the tethered catalysts, determined by X-ray photoelectron spectroscopy.                             
     2 confirmed using elemental analysis and X-ray photoelectron spectroscopy.                             
     3 potential of -0.75 V, as observed from X-ray photoelectron spectroscopy.                             
     4 ements, optical/solvent exposures, and X-ray photoelectron spectroscopy.                             
     5 n between Au and ZnO was manifested by X-ray photoelectron spectroscopy.                             
     6 namely X-ray magnetic circular dichroism and photoelectron spectroscopy.                             
     7 lk water, using either optical absorption or photoelectron spectroscopy.                             
     8 determined using X-ray diffraction and X-ray photoelectron spectroscopy.                             
     9 ized by contact angle measurements and X-ray photoelectron spectroscopy.                             
    10 temperature-programmed desorption, and X-ray photoelectron spectroscopy.                             
    11 red by quite different methods such as X-ray photoelectron spectroscopy.                             
    12 ce, which was probed by angle-resolved X-ray photoelectron spectroscopy.                             
    13 OCCO) was observed and investigated by anion photoelectron spectroscopy.                             
    14 y transmission electron microscopy and X-ray photoelectron spectroscopy.                             
    15  spin resonance, UV-vis-NIR, and ultraviolet photoelectron spectroscopy.                             
    16 s-pyridinyltetrazine, as determined by X-ray photoelectron spectroscopy.                             
    17 spectroscopy, fluorescence imaging and X-ray photoelectron spectroscopy.                             
    18 clic voltammetry as well as UV/Vis and X-ray photoelectron spectroscopy.                             
    19 bamates, with Cu(+) ions elucidated by X-ray photoelectron spectroscopy.                             
    20 was probed in situ by ambient-pressure X-ray photoelectron spectroscopy.                             
    21 lus energy dispersive spectroscopy and X-ray photoelectron spectroscopy.                             
    22 s decrease of Mn valence measured from X-ray photoelectron spectroscopy.                             
    23 ing synchrotron-based ambient pressure X-ray photoelectron spectroscopy.                             
    24 have been investigated by using negative ion photoelectron spectroscopy.                             
    25 elative to more traditional methods based on photoelectron spectroscopy.                             
    26 haracterized by Raman spectroscopy and X-ray photoelectron spectroscopy.                             
    27 r transform infrared spectroscopy, and X-ray photoelectron spectroscopy.                             
    28 lms using photoluminescence, Raman and x-ray photoelectron spectroscopies.                           
  
  
  
  
  
  
  
  
    37 ike structures of CoB16(-), characterized by photoelectron spectroscopy and ab initio calculations.  
    38  of a mixed B/Bi target and characterized by photoelectron spectroscopy and ab initio calculations.  
    39  we report the results obtained via combined photoelectron spectroscopy and ab initio studies of the 
    40 ating voltage regions, as confirmed by X-ray photoelectron spectroscopy and atomic force microscopy e
    41 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy and atomic force microscopy. 
    42 a measurements in DMSO and H2O, negative ion photoelectron spectroscopy and binding constant determin
    43 is hydrophobic ligand was confirmed by X-ray photoelectron spectroscopy and contact angle goniometry 
  
  
    46 fides has been evaluated by conducting X-ray photoelectron spectroscopy and electron microscopy studi
  
  
    49  PhOH, and Me2NOH or Et2NOH) are examined by photoelectron spectroscopy and M06-2X and CCSD(T) comput
  
  
    52   The CoB18 (-) cluster was characterized by photoelectron spectroscopy and quantum chemistry calcula
  
  
    55 ased on a combination of detailed core-level photoelectron spectroscopy and quantum-chemical calculat
  
  
    58 olled electron-impact irradiation with X-ray photoelectron spectroscopy and scanning electron microsc
    59 haracterized using Raman spectroscopy, X-ray photoelectron spectroscopy and scanning tunneling micros
    60 tal dichalcogenides by using microbeam X-ray photoelectron spectroscopy and scanning tunnelling micro
    61 ulating films of WO3 Here, we use hard X-ray photoelectron spectroscopy and spectroscopic ellipsometr
    62 atite) that combining ambient-pressure X-ray photoelectron spectroscopy and standing-wave photoemissi
    63 n bonding in gold(I)-alkynyl complexes using photoelectron spectroscopy and theoretical calculations.
    64 rk, where temperature-dependent negative ion photoelectron spectroscopy and theoretical studies demon
  
    66 roscopy, scanning electron microscopy, X-ray photoelectron spectroscopy and transmission electron mic
  
    68  to bind with mercury as determined by X-ray photoelectron spectroscopy and X-ray absorption fine str
    69 orption mechanisms were assessed using X-ray photoelectron spectroscopy and X-ray absorption spectros
    70 sing in situ, time- and depth-resolved X-ray photoelectron spectroscopy, and complementary grand cano
  
    72 rature scanning tunnelling microscopy, X-ray photoelectron spectroscopy, and density functional theor
    73 IR reflection absorption spectroscopy, X-ray photoelectron spectroscopy, and electrochemical impedanc
    74 y, grazing incident X-ray diffraction, X-ray photoelectron spectroscopy, and Fourier transform infrar
    75 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and ion-exchange measurement
    76  and acetonitrile electrolytes, UV and X-ray photoelectron spectroscopy, and Kelvin force microscopy 
    77 on, by IR and Raman spectroscopy, XRD, X-ray photoelectron spectroscopy, and Mossbauer spectroscopy c
    78 X-ray spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and nitrogen adsorption-deso
    79  O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation of H 
    80 ectron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existence of v
    81 ron X-ray reflectivity, angle-resolved X-ray photoelectron spectroscopy, and spectroelectrochemistry.
    82 ed reflection/absorption spectroscopy, X-ray photoelectron spectroscopy, and surface plasmon resonanc
    83 ransform infrared (FTIR) spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary
    84 uded size, surface charge, morphology, X-ray photoelectron spectroscopy, and transmission Fourier tra
    85 nance spectroscopy, mass spectrometry, X-ray photoelectron spectroscopy, and X-ray absorption spectro
    86  report electrochemical, in situ electrical, photoelectron spectroscopy, and X-ray diffraction measur
  
  
  
  
    91    Through the use of ambient pressure X-ray photoelectron spectroscopy (APXPS) and a single-sided so
  
    93 tructure (NEXAFS) and ambient-pressure X-ray photoelectron spectroscopy (APXPS) under catalytically r
    94    Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventional X
    95 s was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transform in
    96 vanced in situ electron microscopy and X-ray photoelectron spectroscopy are used to demonstrate that 
  
    98 g the PbS(111) facets, consistent with x-ray photoelectron spectroscopy as well as other spectroscopi
    99 icrographs, x-ray diffraction spectra, x-ray photoelectron spectroscopy, as well as TFT output and tr
  
   101 immobilization, which was confirmed by X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and 
  
   103 ear-edge X-ray absorption fine structure and photoelectron spectroscopy complemented by theoretical m
  
   105  Temperature-programmed desorption and X-ray photoelectron spectroscopy data provide information abou
   106 er transform infrared spectroscopy and X-ray photoelectron spectroscopy data reveal that carboxylic a
   107    We employed microwave conductivity, X-ray photoelectron spectroscopy, diffuse reflectance spectros
   108 eparation was directly proved by ultraviolet photoelectron spectroscopy, electrochemical impedance sp
   109 mbining inelastic tunneling spectroscopy, UV photoelectron spectroscopy, electronic structure calcula
  
  
   112 y coupled plasma mass spectrometry and X-ray photoelectron spectroscopy for quantitative analysis of 
  
   114 m interface, performed using liquid microjet photoelectron spectroscopy, has been interpreted to sugg
   115 he trade include near-ambient-pressure X-ray photoelectron spectroscopy, high-pressure scanning tunne
   116     Experiments using ambient pressure X-ray photoelectron spectroscopy indicate that methane dissoci
  
   118  Cyclic voltammetry and angle resolved X-ray photoelectron spectroscopy indicated that the SAMs deriv
   119  altered N-CNT surface chemistry, with X-ray photoelectron spectroscopy indicating addition of Cl, lo
   120 ed by low-energy electron diffraction, X-ray photoelectron spectroscopy, infrared reflection-absorpti
   121 d by transmission electron microscopy, X-ray photoelectron spectroscopy, infrared spectra, ultraviole
  
  
   124 s of the foam were characterized using X-ray photoelectron spectroscopy, inverse gas chromatography, 
  
   126 Combined with in situ ambient-pressure X-ray photoelectron spectroscopy, IR, and Raman spectroscopic 
  
  
  
  
  
  
  
  
  
  
   137 (-) anions were investigated by negative ion photoelectron spectroscopy (NIPES) along with high-resol
   138  in the AuNP suspensions, as judged by X-ray photoelectron spectroscopy, nuclear magnetic resonance e
  
  
  
   142 quantum state specificity by high-resolution photoelectron spectroscopy of the vinylidene anions H2CC
  
   144 ared spectroscopy, and high resolution X-ray photoelectron spectroscopy of TPI-carbons to elucidate t
  
  
   147  by means of operando ambient-pressure X-ray photoelectron spectroscopy performed at the solid/liquid
   148 ro charge by means of ambient pressure X-ray photoelectron spectroscopy performed under polarization 
  
  
  
   152      The SAMs were characterized using X-ray photoelectron spectroscopy, reflection-absorption infrar
   153 C16)2DDP SAMs were characterized using X-ray photoelectron spectroscopy, reflection-absorption infrar
  
  
  
  
  
  
  
  
  
   163 upled with atomic force microscopy and X-ray photoelectron spectroscopy reveals the architectures to 
  
   165 in detail by X-ray powder diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy
   166  formation of the SAM was confirmed by X-ray photoelectron spectroscopy, scanning electron microscopy
   167 samples on SiC(000) combining angle-resolved photoelectron spectroscopy, scanning tunneling microscop
   168 X-ray diffraction and ambient-pressure X-ray photoelectron spectroscopy showed that the crystal struc
   169 yst during the reaction, quasi in situ X-ray photoelectron spectroscopy showed that the surface is me
   170  X-ray spectroscopy (SXS) techniques such as photoelectron spectroscopy, soft X-ray absorption spectr
   171 utherford backscattering spectrometry, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, 
   172 scopy (AFM), and synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) were used to elucida
   173 razing incidence x-ray diffraction and x-ray photoelectron spectroscopy studies indicating that the f
   174      X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of SNNO/LSMO heterost
  
   176 ve characterization techniques such as X-ray photoelectron spectroscopy suffer from sensitivity and q
   177 hy, X-ray absorption spectroscopy, and X-ray photoelectron spectroscopy suggest that reduction of 1 a
   178 and surface oxygen concentrations from X-ray photoelectron spectroscopy suggests that surface sites g
   179 mined using a novel approach combining X-ray photoelectron spectroscopy, surface tension measurements
   180 troscopy, X-ray emission spectroscopy, X-ray photoelectron spectroscopy, synchrotron radiation circul
  
  
  
   184 cause of a P-based coating detected by X-ray photoelectron spectroscopy, the zeta potential of the fo
   185 trospray ionization mass spectrometry, X-ray photoelectron spectroscopy, thermogravimetric analysis a
   186 ation of the new phase is presented by X-ray photoelectron spectroscopy, thermogravimetry, zeta poten
   187 tammetry, UV-vis absorption, and ultraviolet photoelectron spectroscopy to characterize hole energy l
   188 nization aerosol mass spectrometry and X-ray photoelectron spectroscopy to confirm these predictions.
  
   190 8H8I2) produces m-C8H8 in gas phase; we used photoelectron spectroscopy to probe the first two electr
  
   192 e scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy, transmission infrared spectr
   193 ngle measurements, X-ray reflectivity, X-ray photoelectron spectroscopy, ultraviolet photoelectron sp
   194 onal spectroscopy and ambient pressure X-ray photoelectron spectroscopy under catalytically relevant 
  
   196 lectrical conductors and exhibit ultraviolet-photoelectron spectroscopy (UPS) signatures expected of 
   197 -ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy (UPS), cyclic voltammetry, an
   198 o BN isosteres of indole using a combined UV-photoelectron spectroscopy (UV-PES)/computational chemis
   199 X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, UV-vis absorption spectra, a
  
  
   202 properties with degree of functionalization, photoelectron spectroscopy was used to map the occupied 
  
   204     Chemical derivatization coupled to X-ray photoelectron spectroscopy was utilized to quantify spec
   205     By using infrared spectroscopy and X-ray photoelectron spectroscopy we demonstrate that airborne 
   206 circular dichroism, combined with hard X-ray photoelectron spectroscopy, we derived a complete pictur
   207   Using femtosecond time-resolved two-photon photoelectron spectroscopy, we determine (i) the vertica
   208 LTS reaction, as well as complementary X-ray photoelectron spectroscopy, we observed the activation a
   209  using ambient-pressure X-ray absorption and photoelectron spectroscopy, we proved that the dominant 
   210 nsient absorption spectroscopy and gas-phase photoelectron spectroscopy, we show that hexane, a commo
  
   212 nfrared spectroscopy, ellipsometry and X-ray photoelectron spectroscopy were used to follow the stepw
   213  method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive).
   214 layer on the surface, as determined by X-ray photoelectron spectroscopy, which likely prevented furth
  
   216 mbination of powder X-ray diffraction, X-ray photoelectron spectroscopy, X-ray fluorescence spectrosc
   217 ilms before and after the treatment by X-ray photoelectron spectroscopy (XPS) also evidencing the cor
  
   219 y ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicated bind
  
  
   222  Report, Nakamura et al argue that our x-ray photoelectron spectroscopy (XPS) analysis was affected b
  
  
   225 py, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) and compared with a pro
   226 nt and aggregate size, as confirmed by X-ray photoelectron spectroscopy (XPS) and dynamic light scatt
  
   228 isms are also investigated in terms of X-ray photoelectron spectroscopy (XPS) and electrochemical mea
   229 s of CMP are proposed according to the X-ray photoelectron spectroscopy (XPS) and electrochemical mea
  
   231 led plasma-mass spectrometry (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-transform i
   232 nd adsorption spectroscopy techniques [X-ray photoelectron spectroscopy (XPS) and near edge X-ray ads
   233 cterization of the prepared samples by X-ray photoelectron spectroscopy (XPS) and optimization of the
  
   235  substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiati
   236 iosensor surfaces were optimized using X-ray photoelectron spectroscopy (XPS) and the ultra-high freq
  
   238 nning electron microscopy (FE-SEM) and X-ray photoelectron spectroscopy (XPS) characterization result
  
   240 dded within the polymer matrix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that they exi
  
   242  during the biosensor construction and X-ray photoelectron spectroscopy (XPS) experiments confirmed c
  
   244 ure published data obtained by in situ X-ray photoelectron spectroscopy (XPS) for the concentration o
   245  studied for their HER activity and by X-ray photoelectron spectroscopy (XPS) for the first time; MoB
   246  and fibronectin (FN) were measured by X-ray photoelectron spectroscopy (XPS) in ultrahigh vacuum at 
  
   248 IPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows estimation
  
  
   251 orm infrared spectroscopy (FT-IR), and X-ray photoelectron spectroscopy (XPS) showed that the nanowir
   252 Fourier transform infrared (FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy confirmed 
  
   254 cterizations by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) support the presence of
   255  study were to evaluate the ability of X-ray photoelectron spectroscopy (XPS) to differentiate rice m
   256 troscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for ligni
   257 m infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS) were used to characteri
   258 ray absorption spectroscopy (XAS), and X-ray photoelectron spectroscopy (XPS) were used to determine 
   259 Comparing elemental depth-profiling by X-ray photoelectron spectroscopy (XPS) with detailed modeling 
  
   261 ction absorption spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), and contact angles of 
   262 opy-energy dispersive X-ray (SEM-EDX), X-ray photoelectron spectroscopy (XPS), and Fourier transform 
   263 IAXRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and scanning transmiss
   264 ectron microscopy (TEM), Raman spectroscopy, photoelectron spectroscopy (XPS), and SQUID magnetometry
   265 ansform infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS), and x-ray diffraction 
   266 by the MIP cavities was monitored with X-ray photoelectron spectroscopy (XPS), as manifested by a neg
   267 ysis, UV-vis, energy-dispersive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total refle
   268  new nanoparticle was characterized by X-ray photoelectron spectroscopy (XPS), dynamic light scatteri
   269  spectroscopy, photoluminescence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transform infr
   270 ombination of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbauer spe
   271 d triclosan in batch experiments using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, an
   272 ransmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Re K-edge X-ray absorp
   273 ochemical exposure in combination with X-ray photoelectron spectroscopy (XPS), scanning electron micr
   274 odified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), scanning electron micr
   275 ansform infrared spectroscopy (FT-IR), X-ray photoelectron spectroscopy (XPS), thermogravimetric anal
   276 irrors and AgNPs was confirmed through X-ray photoelectron spectroscopy (XPS), transmission electron 
   277 riate MOFs (MTV-MOFs) were examined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visible di
   278 ransmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), UV-vis diffuse reflect
   279  copolymer layer were characterized by X-ray photoelectron spectroscopy (XPS), water contact angle, e
   280  dispersive spectroscopy (SEM-EDS) and X-ray photoelectron spectroscopy (XPS), whereas the precise qu
   281 the sensor surface was monitored using X-ray photoelectron spectroscopy (XPS), while the binding of c
   282 ransmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
WebLSDに未収録の専門用語(用法)は "新規対訳" から投稿できます。