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1 eestanding membrane of 2D materials inside a scanning electron microscope.
2 graphene using a nanomechanical device in a scanning electron microscope.
3 re of kiwifruits slices was examined using a Scanning Electron Microscope.
4 disk microelectrode arrays was inspected by scanning electron microscope.
5 zed by ATR-FTIR spectrometer, goniometer and scanning electron microscope.
6 old nanoparticles followed by imaging with a scanning electron microscope.
7 ith a "nanostressing stage" located within a scanning electron microscope.
8 zing a standardized segment of aorta using a scanning electron microscope.
9 al endothelial structure was examined with a scanning electron microscope.
11 polynuclear sulfur anions as confirmed from scanning electron microscope and energy dispersive X-ray
12 uct nanomechanical experiments in an in situ scanning electron microscope and show that micrometer-si
13 sis, through energy spectrometry utilizing a scanning electron microscope, and by fluorescent microsc
14 as characterized by Atomic force microscopy, Scanning electron microscope, and Raman spectroscopy.
15 ble optical cathodoluminescence emitted in a scanning electron microscope by nanoparticles with contr
16 ing of the nanobiosensor e.g. field emission scanning electron microscope, cyclic voltammetry and ele
17 ted by charge carrier mobility measurements, scanning electron microscope, electron diffraction study
18 essful combination of Raman spectroscopy and scanning electron microscope-energy dispersive X-rays th
24 lues is discussed in light of the results of scanning electron microscope examination of the soil sam
25 sing X-ray diffraction (XRD), field emission scanning electron microscope (FE-SEM) and field emission
26 try, cyclic voltammetry (CV), field emission scanning electron microscope (FE-SEM) imaging and energy
27 nt analytical techniques like field emission scanning electron microscope (FE-SEM) with an energy dis
37 rescence confocal, transmission electron and scanning electron microscope images show the preferentia
39 erspectral data sets and the high-resolution scanning electron microscope images were fused into a co
41 this technique show excellent agreement with scanning electron microscope images, high spatial resolu
46 scales by optical microscope, environmental scanning electron microscope, nano/microindentation, and
50 orphologies of BNNSs are characterized using scanning electron microscope (SEM) and high-resolution t
54 ogical and structural characterizations by a scanning electron microscope (SEM) and X-ray diffraction
58 tribution of particulates were measured from scanning electron microscope (SEM) images of the collect
60 mography (CT), plasma focused ion beam (FIB) scanning electron microscope (SEM) imaging and scanning
62 ng the secondary electron (SE) signal in the scanning electron microscope (SEM) is a technique gainin
66 nocomposites properties were accomplished by scanning electron microscope (SEM), electrochemical impe
67 bes in an atomic force microscope (AFM) or a scanning electron microscope (SEM), optical tweezers, an
68 d by X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM), quartz crystal micro
72 The continuous electron beam of conventional scanning electron microscopes (SEM) limits the temporal
73 d composition distribution were analyzed via scanning electron microscope(SEM) and energy dispersive
74 trast, advances in the spatial resolution of scanning electron microscopes (SEMs), which are by far t
75 ural surface analysis of the product under a scanning electron microscope showed an increasingly rigi
79 situ fracture-toughness measurements in the scanning electron microscope to characterize effects at
80 ackscatter diffraction (EBSD) technique in a scanning electron microscope to non-destructively charac
84 ibution can be observed in the environmental scanning electron microscope, which also reveals the pre
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