ライフサイエンスコーパス: secondary ion mass spectrometry

1 one by electron energy loss spectroscopy and secondary ion mass spectrometry.

2 ion, desorption electrospray ionization, and secondary ion mass spectrometry.

3 terial, analogous to the sputtering yield in secondary ion mass spectrometry.

4 have been studied as primary ions for use in secondary ion mass spectrometry.

5 hotoelectron spectroscopy and time-of-flight secondary ion mass spectrometry.

6 ction products as NGLs by in situ TLC/liquid secondary ion mass spectrometry.

7 cent neoglycolipids, and sequenced by liquid secondary-ion mass spectrometry.

8 T and stable isotope labelling by nano-scale secondary ion mass spectrometry ((15)NH(3) assimilation)

9 An extraterrestrial origin is inferred from secondary ion mass spectrometry (18)O/(16)O and (17)O/(1

10 Argon cluster secondary ion mass spectrometry analyses of the reaction

11 mbined fluorescent in situ hybridization and secondary ion mass spectrometry analyses, to identify an

12 ebeck effect, Hall effect and time-of-flight secondary ion mass spectrometry analysis.

13 Time-of-flight secondary-ion mass spectrometry analysis was used to det

14 as performed using 15 keV Ga+ time-of-flight secondary ion mass spectrometry and grazing incidence in

15 ntal imaging platform combining coregistered secondary ion mass spectrometry and high resolution seco

16 fficacy of ILs as matrices in time-of-flight secondary ion mass spectrometry and in mass spectrometri

17 Time-of-flight secondary ion mass spectrometry and multivariate statist

18 alysis of organic surfaces in time-of-flight secondary ion mass spectrometry and opened up new capabi

19 Using time-of-flight secondary ion mass spectrometry and Raman spectroscopy,

20 ical analysis, scanning electron microscopy, secondary ion mass spectrometry and SDS-PAGE indicate th

21 sured by isotope-ratio mass spectrometry and secondary ion mass spectrometry) and redox-sensitive det

22 sing high-pressure freezing, high-resolution secondary ion mass spectrometry, and transmission electr

23 secondary ion mass spectrometry, high-energy secondary ion mass spectrometry, and X-ray photoelectron

24 n spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, and X-ray photoelectron

25 elucidated by disaccharide analysis, liquid secondary-ion mass spectrometry, and 1H/13C NMR spectros

26 An important application field of secondary ion mass spectrometry at the nanometer scale (

27 ell-defined neural network, were imaged with secondary ion mass spectrometry, C(60)-SIMS.

28 Cluster secondary ion mass spectrometry (cluster SIMS) employing

29 ance over random sampling is demonstrated on secondary ion mass spectrometry data, making it an inter

30 Dynamic secondary ion mass spectrometry (DSIMS) and TEM are used

31 Dynamic liquid secondary ion mass spectrometry (dyn-LSIMS) was employed

32 id-phase drug, was studied by time-of-flight secondary ion mass spectrometry employing 15-keV Ga+ and

33 Time-of-flight secondary ion mass spectrometry employing an SF5+ polyat

34 try or thermal-ionization mass spectrometry, secondary ion mass spectrometry enables one to determine

35 ition method is effective for time-of-flight secondary ion mass spectrometry examination of polymers.

36 ble to perform molecular depth profiling via secondary ion mass spectrometry experiments.

37 e in situ hybridization coupled to nanoscale secondary ion mass spectrometry (FISH-NanoSIMS), we dire

38 The feasibility of using cluster secondary ion mass spectrometry for depth profiling of d

39 , imaging technique based on nanometer-scale secondary ion mass spectrometry for mapping the 3D eleme

40 boratories participated using time-of-flight secondary-ion mass spectrometry for analysis, three of t

41 Gas cluster ion beam-secondary ion mass spectrometry (GCIB-SIMS) has shown th

42 Secondary ion mass spectrometry has been identified as a

43 Secondary-ion mass spectrometry has extremely high later

44 ssisted laser desorption, and time-of-flight secondary ion mass spectrometry have been explored as po

45 Recent advances in secondary ion mass spectrometry have improved sensitivit

46 For the first time, time-of-flight secondary ion mass spectrometry, high-energy secondary i

47 chemical images created from time of flight-secondary ion mass spectrometry images from a patterned

48 Using single-cell-resolution nanometer secondary ion mass spectrometry images of 15N incorporat

49 We report that time-of-flight secondary ion mass spectrometry images of mating Tetrahy

50 Time-of-flight secondary ion mass spectrometry imaging is a rapidly evo

51 e in situ hybridization with high-resolution secondary ion mass spectrometry imaging to characterize

52 This is particularly true of time-of-flight secondary ion mass spectrometry imaging where recent adv

53 signal in CSI, as supported by histology and secondary ion mass spectrometry imaging.

54 ic force microscopy) and chemical (nanoscale secondary ion mass spectrometry) imaging on the same sam

55 ll as fluoride and chloride) was analyzed by secondary ion mass spectrometry in apatite [Ca(5)(PO(4))

56 species within intact mammalian cells using secondary ion mass spectrometry, including the simultane

57 Time-of-flight secondary ion mass spectrometry, infrared reflection spe

58 methodologies with the latest generation of secondary ion mass spectrometry instrumentation, we show

59 Secondary ion mass spectrometry is a powerful method for

60 Time-of-flight secondary ion mass spectrometry is capable of molecule-s

61 A variant of secondary ion mass spectrometry is presented where the s

62 secondary ion clusters using time-of-flight secondary ion mass spectrometry is reported for the firs

63 Time-of-flight secondary ion mass spectrometry is utilized to character

64 l particles has been achieved using ion trap secondary ion mass spectrometry (IT-SIMS).

65 the target peptides were analyzed by liquid secondary ion mass spectrometry (LSIMS) and subjected to

66 e nearly simultaneous capabilities of liquid secondary ion mass spectrometry (LSIMS), matrix-assisted

67 lyzed by fast-atom bombardment (FAB), liquid secondary ion mass spectrometry (LSIMS), or electrospray

68 Matrix-enhanced secondary ion mass spectrometry (ME-SIMS) has overcome o

69 ethod has been developed for matrix-enhanced-secondary ion mass spectrometry (ME-SIMS) to investigate

70 ironmental temperature, further supported by secondary ion mass spectrometry measurements of in situ

71 In addition, the secondary ion mass spectrometry measurements yield spati

72 However, secondary-ion mass spectrometry measurements show that o

73 Nano-scale secondary ion mass spectrometry (nanoSIMS) analyses of i

74 table isotope probing coupled with nanoscale secondary ion mass spectrometry (nanoSIMS) and fluoresce

75 ter at the submicrometer scale, such as Nano Secondary Ion Mass Spectrometry (NanoSIMS) and Scanning

76 We present a combination of Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS) approach and

77 In this study, we demonstrate that Nano Secondary Ion Mass Spectrometry (NanoSIMS) can be used t

78 Here, we used nanoscale secondary ion mass spectrometry (NanoSIMS) imaging, in c

79 Using nanometre-scale secondary ion mass spectrometry (NanoSIMS) we visualized

80 (13)C and (15)N uptake with high-resolution secondary ion mass spectrometry (NanoSIMS).

81 ray fluorescence (S-XRF) and high-resolution secondary ion mass spectrometry (NanoSIMS).

82 the nominal spatial resolution of nanoscale secondary ion mass spectrometry (NanoSIMS, 50-100 nm).

83 isted laser desorption/ionization and liquid secondary ion mass spectrometry of the first of two majo

84 sis required to obtain high depth resolution secondary ion mass spectrometry profiles from multiple G

85 nd infrared spectroscopy, and time-of-flight secondary ion mass spectrometry provided evidence for th

86 Matrix effects in secondary ion mass spectrometry render quantitative anal

87 With data obtained using secondary ion mass spectrometry, scanning electron micro

88 Nanoscale secondary ion mass spectrometry showed a strong S enrich

89 Time-of-flight secondary ion mass spectrometry showed that relative int

90 on of fluorescence in situ hybridization and secondary ion mass spectrometry shows that cells belongi

91 Region-of-interest sensitive secondary-ion mass spectrometry shows that a cathode-ele

92 Secondary ion mass spectrometry (SIMS) allows for high s

93 ased ion gun has been widely utilized in the secondary ion mass spectrometry (SIMS) analysis of organ

94 Secondary ion mass spectrometry (SIMS) analysis of trans

95 Secondary ion mass spectrometry (SIMS) and confocal Rama

96 two powerful characterization tools, in situ secondary ion mass spectrometry (SIMS) and ex situ surfa

97 to prepare polymer bevel cross sections for secondary ion mass spectrometry (SIMS) applications was

98 We present secondary ion mass spectrometry (SIMS) data obtained fro

99 acquisition during sputtering (e.g., dynamic secondary ion mass spectrometry (SIMS) depth profiling).

100 irradiation was used to greatly enhance the secondary ion mass spectrometry (SIMS) detection of Cs(+

101 etic cluster ion beams is a unique aspect of secondary ion mass spectrometry (SIMS) experiments.

102 Dynamic secondary ion mass spectrometry (SIMS) has been widely u

103 e then used to direct subsequent microscopic secondary ion mass spectrometry (SIMS) imaging and tande

104 Secondary ion mass spectrometry (SIMS) imaging confirmed

105 In this context, three-dimensional secondary ion mass spectrometry (SIMS) imaging was used

106 characterized with condensation figures and secondary ion mass spectrometry (SIMS) imaging.

107 layer on glycine were examined with cluster secondary ion mass spectrometry (SIMS) in the event-by-e

108 Secondary ion mass spectrometry (SIMS) is a very surface

109 Secondary ion mass spectrometry (SIMS) is performed usin

110 Imaging with cluster secondary ion mass spectrometry (SIMS) is reaching a mat

111 Secondary ion mass spectrometry (SIMS) is used to probe

112 doses much larger than the so-called static secondary ion mass spectrometry (SIMS) limit and demonst

113 m interference device (SQUID) microscopy and secondary ion mass spectrometry (SIMS) of sulfur isotope

114 drug and show, for the first time, that the secondary ion mass spectrometry (SIMS) positive ionizati

115 Organic depth profiling using secondary ion mass spectrometry (SIMS) provides valuable

116 Secondary ion mass spectrometry (SIMS) run in the event-

117 roduced during the Trinity nuclear test by a secondary ion mass spectrometry (SIMS) scanning ion imag

118 eeded to reach the peak of the corresponding secondary ion mass spectrometry (SIMS) signal response i

119 We report here the use of secondary ion mass spectrometry (SIMS) to image the chol

120 Secondary ion mass spectrometry (SIMS) was used to monit

121 , X-ray photoelectron spectrometry (XPS) and secondary ion mass spectrometry (SIMS) were used to exam

122 er-resolution chemical images obtained using secondary ion mass spectrometry (SIMS) with the high-res

123 om positron annihilation spectroscopy (PAS), secondary ion mass spectrometry (SIMS), and deep level t

124 it is demonstrated that, when combined with secondary ion mass spectrometry (SIMS), it can provide c

125 In static secondary ion mass spectrometry (SIMS), quantification a

126 e regarded as a specialized form of scanning secondary ion mass spectrometry (SIMS), referred to here

127 In secondary ion mass spectrometry (SIMS), the beneficial e

128 amples were also analyzed by 25 keV Bi(3)(+) secondary ion mass spectrometry (SIMS), with the negativ

129 by mass resolution/mass range in the case of secondary ion mass spectrometry (SIMS).

130 iling of polymer films and multilayers using secondary ion mass spectrometry (SIMS).

131 profiling of some spin-cast polymer films by secondary ion mass spectrometry (SIMS).

132 ms was quantitatively analyzed using dynamic secondary ion mass spectrometry (SIMS).

133 l images generated by optical microscopy and secondary ion mass spectrometry (SIMS).

134 distribution of bound and unbound cations by secondary ion mass spectrometry (SIMS).

135 It combines the high spatial resolution of secondary ion mass spectrometry (SIMS; under 200 nm for

136 C60+ results in high quality time-of-flight secondary ion mass spectrometry spectra, even during ion

137 The positive-ion liquid secondary ion mass spectrometry spectrum also showed a m

138 Using high-resolution nano-scale secondary ion mass spectrometry stable isotope imaging (

139 synchrotron infrared spectroscopy, and nano-secondary ion mass spectrometry studies of these diamond

140 An imaging secondary ion mass spectrometry system has been develope

141 We present a high-resolution imaging secondary ion mass spectrometry technique to reveal the

142 In secondary ion mass spectrometry, the molecular environme

143 (C(60)) primary ion beam with time-of-flight secondary ion mass spectrometry to create molecule-speci

144 The experiments utilize secondary ion mass spectrometry to detect molecular ions

145 In this work, we have used high-resolution secondary ion mass spectrometry to directly map the dist

146 Here we use time-of-flight secondary ion mass spectrometry to identify and chemical

147 We have developed a method that uses secondary ion mass spectrometry to image antibodies tagg

148 ted this hypothesis by using high-resolution secondary ion mass spectrometry to image the distributio

149 Here we make use of considerable advances in secondary ion mass spectrometry to obtain improved limit

150 We employ imaging time-of-flight secondary ion mass spectrometry to perform high-throughp

151 , atomic force microscopy and time-of-flight secondary ion mass spectrometry to provide structural in

152 Here we use secondary-ion mass spectrometry to provide the first vis

153 surements of worn surfaces by time-of-flight-secondary ion mass spectrometry (TOF-SIMS) accompanied f

154 Time of flight-secondary ion mass spectrometry (TOF-SIMS) allows us to

155 Three-spatial-dimension (3D) time-of-flight-secondary ion mass spectrometry (TOF-SIMS) analysis can

156 nables in situ reactivity and time-of-flight secondary ion mass spectrometry (TOF-SIMS) analysis of s

157 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) analysis, sen

158 ere performed primarily using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic fo

159 urface of a fingerprint using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and desorptio

160 ptake batch experiments using time of flight-secondary ion mass spectrometry (ToF-SIMS) and detailed

161 th traditional MS techniques: time-of-flight secondary ion mass spectrometry (ToF-SIMS) and electrosp

162 Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) and laser abl

163 In this study, we used time-of-flight secondary ion mass spectrometry (TOF-SIMS) and scanning

164 analytical techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray pho

165 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray pho

166 lopment of 3D imaging cluster Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) as a label-fr

167 on the future exploitation of time of flight-secondary ion mass spectrometry (TOF-SIMS) as a surface

168 k), characterized directly by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) at liquid nit

169 We show that imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) can be used t

170 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) can be utiliz

171 crospots were correlated with time-of-flight secondary ion mass spectrometry (TOF-SIMS) chemical stat

172 that multivariate analysis of time-of-flight secondary ion mass spectrometry (TOF-SIMS) data can be u

173 atterns were analyzed using a time-of-flight secondary ion mass spectrometry (ToF-SIMS) equipped with

174 he performance of traditional time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments f

175 1, 2) primary ions in static time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments w

176 artilage environment, we used time-of-flight secondary ion mass spectrometry (TOF-SIMS) for label-fre

177 A new protocol using time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been deve

178 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been util

179 Although time-of-flight secondary ion mass spectrometry (ToF-SIMS) has proven us

180 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has received

181 Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) has the advan

182 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has unique ca

183 display of three-dimensional time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging data

184 as cluster ion beams (GCIBs), time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging is no

185 We use time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging to in

186 elution time was obtained by time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging using

187 One such technique, time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging, has

188 ric materials, if analyzed by time-of-flight secondary ion mass spectrometry (ToF-SIMS) in dual beam

189 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) instruments a

190 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high per

191 Time of flight secondary ion mass spectrometry (ToF-SIMS) is a powerful

192 Although imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful

193 Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) is a surface

194 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a well-est

195 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an establi

196 In this work, time-of-flight secondary ion mass spectrometry (TOF-SIMS) is used to pr

197 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is utilized t

198 Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) mass spectra

199 ectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) now permit mo

200 e reports a detailed study of time-of-flight-secondary ion mass spectrometry (TOF-SIMS) positive ion

201 Whole section time-of-flight-secondary ion mass spectrometry (TOF-SIMS) scans and mul

202 id mixtures from single-pixel time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra in mo

203 d for interpreting the static time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of ad

204 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of mi

205 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of po

206 ssibility, as corroborated by time-of-flight secondary ion mass spectrometry (TOF-SIMS) sputter depth

207 Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) surface analy

208 ectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) to analyze th

209 Herein, we used time-of-flight secondary ion mass spectrometry (TOF-SIMS) to analyze th

210 tes the first reported use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to assess phy

211 d samples were analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS) to characteri

212 lls were depth profiled using time-of-flight secondary ion mass spectrometry (ToF-SIMS) to examine ch

213 We use time-of-flight secondary ion mass spectrometry (TOF-SIMS) to image and

214 n this work, we have employed time-of-flight secondary ion mass spectrometry (ToF-SIMS) to image chem

215 hotoelectron spectroscopy and time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigat

216 We have used static time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigat

217 n films was investigated with time-of-flight secondary ion mass spectrometry (TOF-SIMS) using 10 keV

218 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) using buckmin

219 Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) was performed

220 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used for

221 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used in a

222 electron microscopy (SEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) were used to

223 an be difficult to achieve in time-of-flight secondary ion mass spectrometry (TOF-SIMS) when the anal

224 Imaging using time-of-flight secondary ion mass spectrometry (TOF-SIMS) with buckmini

225 ucture spectroscopy (NEXAFS), time-of-flight secondary ion mass spectrometry (TOF-SIMS), and surface

226 infrared spectroscopy (FTIR), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and transmis

227 maged without labels by using time-of-flight secondary ion mass spectrometry (TOF-SIMS), quantifying

228 nsgenic AD mouse brains using time-of-flight secondary ion mass spectrometry (ToF-SIMS), simultaneous

229 y introducing GCIB sputter to time-of-flight secondary ion mass spectrometry (TOF-SIMS), we analyzed

230 ning tunneling microscopy and time-of-flight secondary ion mass spectrometry (ToF-SIMS).

231 ry (ATR-FTIR Kretschmann) and time-of-flight secondary ion mass spectrometry (ToF-SIMS).

232 ion formation probability in time-of-flight secondary ion mass spectrometry (TOF-SIMS).

233 s was performed by 25-keV Ga+ time-of-flight-secondary ion mass spectrometry (TOF-SIMS).

234 dylcholine lipids with static time-of-flight secondary ion mass spectrometry (TOF-SIMS).

235 ntration of an additive using time-of-flight secondary ion mass spectrometry (TOF-SIMS).

236 s those obtained with imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS).

237 ectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS).

238 escence microscopy and liquid time-of-flight secondary ion mass spectrometry (TOF-SIMS).

239 ringent response, by means of time-of-flight-secondary ion mass spectrometry (TOF-SIMS).

240 c Force Microscopy (AFM), and Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS).

241 ass spectral imaging data via time-of-flight secondary ion mass spectrometry (TOF-SIMS).

242 ithin single HeLa cells using time-of-flight secondary ion mass spectrometry (TOF-SIMS).

243 cyclic voltammetry (CV), and time-of-flight-secondary ion mass spectrometry (TOF-SIMS).

244 By using Time-of-Flight Secondary Ion Mass Spectrometry- (ToF-SIMS) based imagin

245 Argon cluster ion sources for sputtering and secondary ion mass spectrometry use projectiles consisti

246 lselenophene), P3HS, was measured by dynamic secondary ion mass spectrometry using a model bilayer st

247 In this study, time-of-flight secondary ion mass spectrometry was used to measure the

248 techniques (electron microprobe analysis and secondary ion mass spectrometry), we show that some heav

249 Additionally, using metal-assisted secondary ion mass spectrometry, we are the first to dir

250 instrumental neutron activation analysis and secondary ion mass spectrometry, we have observed system

251 imaging the same regions with time-of-flight secondary-ion-mass spectrometry, we correlate this photo

252 was performed in situ by combining 2-keV Cs+ secondary ion mass spectrometry with FT-ICR detection of

253 1] surfaces was studied using time-of-flight secondary-ion mass spectrometry, X-ray photoelectron spe