ライフサイエンスコーパス: transmission electron microscope

1 o prepare individual nanostructures inside a transmission electron microscope.

2 r graphene by in situ Joule-heating inside a transmission electron microscope.

3 images obtained in the tilted-beam mode of a transmission electron microscope.

4 ior to immunolabeling and observation in the transmission electron microscope.

5 to collect low-dose data using an FEI Tecnai transmission electron microscope.

6 alloy particles during in situ heating in a transmission electron microscope.

7 on electron interferometer in a conventional transmission electron microscope.

8 bon to make a replica for examination in the transmission electron microscope.

9 ing in situ nanoindentation experiments in a transmission electron microscope.

10 at sub-angstrom resolution in a mid-voltage transmission electron microscope.

11 n and imaged at cryogenic temperature in the transmission electron microscope.

12 in has an apparent diameter of 9-12 A in the transmission electron microscope.

13 lectron irradiation at high temperature in a transmission electron microscope.

14 tilevered, multiwalled carbon nanotubes in a transmission electron microscope.

15 ach-Zehnder geometry in an unmodified 200 kV transmission electron microscope.

16 ectrometry, scanning electron microscopy and transmission electron microscope.

17 ctron energy loss spectroscopy in a scanning transmission electron microscope.

18 and electron diffraction in an environmental transmission electron microscope.

19 10T high magnetic field were analysed by the transmission electron microscope.

20 stern blot, flow cytometry, and confocal and transmission electron microscope.

21 itu heating metallic glass nanorods inside a transmission electron microscope.

22 ing annular dark field imaging in a scanning transmission electron microscope.

23 six Sprague-Dawley rats were acquired with a transmission electron microscope.

24 obtained at 80 kV in an aberration-corrected transmission electron microscope.

25 ting from the incident electron beam using a transmission electron microscope.

26 energy-loss spectroscopy in an environmental transmission electron microscope.

27 MOF nanocrystals under compression within a transmission electron microscope.

28 le, realize wavelength-scale resolution in a transmission electron microscope.

29 after creation using an aberration-corrected transmission electron microscope.

30 g both conventional and aberration corrected transmission electron microscopes.

31 and Auger microprobes as well as scanning or transmission electron microscopes.

32 f the latest generation aberration-corrected transmission electron microscopes allow the vast majorit

33 ased on in situ nanoindentation studies in a transmission electron microscope and corresponding molec

34 With a scanning transmission electron microscope and electron energy los

35 Transmission electron microscope and extended X-ray abso

36 ion of quantitative in situ compression in a transmission electron microscope and finite-element anal

37 simple in-situ electrochemical cell for the transmission electron microscope and use it to track lit

38 ACNT/PVC composites were characterized using transmission electron microscope and X-ray diffraction,

39 Combining transmission electron microscopes and density functional

40 ow, by using in situ Kr ion irradiation in a transmission electron microscope at room temperature, th

41 during the straining of molybdenum inside a transmission electron microscope at room temperature.

42 he superior spatial resolution of a scanning transmission electron microscope combined with electron

43 a nanoscale electrochemical device inside a transmission electron microscope--consisting of a single

44 High-resolution transmission electron microscope data indicate there are

45 Study with transmission electron microscope demonstrated significan

46 ngineered nanotubes inside a high-resolution transmission electron microscope demonstrated the antici

47 nition for the depth resolution for scanning transmission electron microscope depth sectioning and pr

48 s been in-situ observed experimentally using transmission electron microscope during studies of their

49 gle annular dark field imaging in a scanning transmission electron microscope, elemental analysis, ce

50 We used a transmission electron microscope equipped with an in sit

51 e have used the novel environmental scanning transmission electron microscope (ESTEM) with 0.1 nm res

52 retical prediction is confirmed by real-time transmission electron microscope experimental observatio

53 ctron microscope (FE-SEM) and field emission transmission electron microscope (FE-TEM) respectively.

54 rom a single-crystal silicon cantilever on a transmission electron microscope grid by gallium focused

55 Particles were collected on transmission electron microscope grids fitted on the las

56 Photomicrographs of transmission electron microscope grids from the impactor

57 w that Z-contrast tomography in the scanning transmission electron microscope has been developed to d

58 ctron energy-loss spectroscopy (EELS) in the transmission electron microscope have been investigated

59 itative mechanical tests in an environmental transmission electron microscope, here we demonstrate th

60 We show, using ultra-high-resolution transmission electron microscope (HRTEM) images of natur

61 n on nano-twinned Ag under a high resolution transmission electron microscope (HRTEM) reveals the dyn

62 er an electron beam within a high-resolution transmission electron microscope (HRTEM).

63 lectron microscope (SEM) and high-resolution transmission electron microscope (HRTEM).

64 Scanning tunnelling and transmission electron microscope images of monolayer-pro

65 combination with single particle analysis of transmission electron microscope images of negative-stai

66 Transmission electron microscope images of thin films fr

67 -ray diffraction spectra and high resolution transmission electron microscope images prove the high e

68 Transmission electron microscope images revealed that th

69 Transmission electron microscope images were obtained of

70 minima in fibril width in negatively stained transmission electron microscope images).

71 gh-resolution, high-angle annular dark-field transmission electron microscope images, thanks to the d

72 ar dynamics of polymeric film systems, using transmission electron microscope imaging (TEM) and nucle

73 the tumor samples together with TUNEL assay, transmission electron microscope imaging and Western blo

74 dy, a thermophoretic sampling and subsequent transmission electron microscope imaging were applied to

75 orce microscopy, lattice-resolution scanning transmission electron microscope imaging, and energy dis

76 A thorough characterization by scanning transmission electron microscope in high angle annular d

77 Analysis of leaf sections using a transmission electron microscope indicated a 2-fold decr

78 he spatial resolution and flexibility of the transmission electron microscope, it would open up the s

79 ion of in situ fracture experiments inside a transmission electron microscope, large-scale atomistic

80 Scanning transmission electron microscope measurements of mass-pe

81 Transmission electron microscope micrographs have confir

82 Here we report, by using an in situ transmission electron microscope nanoindentation tool, t

83 ollowed by monodansylcadaverine staining and transmission electron microscope observation.

84 We report in situ dynamic transmission electron microscope observations of nanocry

85 However, transmission electron microscope observations of numerou

86 Transmission electron microscope observations of the All

87 Transmission electron microscope observations showed tha

88 We report transmission electron microscope observations that provi

89 We performed in situ indentation in a transmission electron microscope on Al-TiN multilayers w

90 Under a transmission electron microscope, only the M1 layer of t

91 imaging in an aberration-corrected scanning transmission electron microscope optimized for low volta

92 by using in situ heavy ion irradiation in a transmission electron microscope, pre-introduced nanovoi

93 ns of the probe-forming lens in the scanning transmission electron microscope provides not only a sig

94 }Al/AlN/TiN multilayers in a high-resolution transmission electron microscope revealed the z-AlN to w

95 itative in situ nanocompression testing in a transmission electron microscope reveals that the streng

96 carried out while imaging within an in situ transmission electron microscope show that the electric

97 situ tensile experiments inside scanning and transmission electron microscopes show that penta-twinne

98 imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direc

99 The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a

100 ectron microscope (SEM) imaging and scanning transmission electron microscope (STEM) tomography.

101 dark-field (HAADF) imaging within a scanning transmission electron microscope (STEM).

102 berration-corrected high-resolution scanning transmission electron microscope (STEM).

103 cells were imaged in liquid with a scanning transmission electron microscope (STEM).

104 d out using an aberration-corrected scanning transmission electron microscope (STEM).

105 graphic tilt series acquired in the scanning transmission electron microscope (STEM).

106 Transmission electron microscope studies showed clear ch

107 High-resolution transmission electron microscope (TEM) and scanning TEM

108 often too fast to observe in a conventional transmission electron microscope (TEM) and too slow for

109 ation between a SERRS/fluorescence map and a transmission electron microscope (TEM) collage of the sa

110 displacement measurement capabilities in the transmission electron microscope (TEM) for in situ quant

111 terials interactions at the nanoscale in the transmission electron microscope (TEM) has been demonstr

112 st a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited

113 ver nanoparticles using aberration-corrected transmission electron microscope (TEM) imaging and monoc

114 The transmission electron microscope (TEM) imaging, UV-vis s

115 idence from both scattering measurements and transmission electron microscope (TEM) measurements sugg

116 Transmission electron microscope (TEM) observation revea

117 Measurements with a transmission electron microscope (TEM) show that nano-Se

118 Scanning electron microscope (SEM) and transmission electron microscope (TEM) showed cell membr

119 A systematic transmission electron microscope (TEM) study revealed a

120 XRD), scanning electron microscopy (SEM) and transmission electron microscope (TEM) techniques were u

121 Here, we describe how to use Transmission Electron Microscope (TEM) to obtain Electro

122 with scanning electron microscope (SEM) and transmission electron microscope (TEM), as well as the n

123 Observed with the transmission electron microscope (TEM), CLDIs were bound

124 ultrathin, freeze-substituted sections in a transmission electron microscope (TEM), combined with co

125 ission scanning electron microscopy (FESEM), transmission electron microscope (TEM), energy dispersiv

126 nyltetrazolium chloride (TTC) staining and a transmission electron microscope (TEM).

127 ghts, were comparable to those determined by transmission electron microscope (TEM).

128 nce of lycopene crystals when observed under Transmission Electron Microscope (TEM).

129 ectly observed using an aberration-corrected transmission electron microscope (TEM).

130 ent drive cycles, have been characterized by transmission-electron-microscope (TEM) image analysis.

131 esolution have been determined using 300-keV transmission electron microscopes (TEMs).

132 to collect cryo-EM data using an FEI Tecnai transmission electron microscope that can subsequently b

133 Under a transmission electron microscope, the NP-RNA complex app

134 situ indentation of TiN in a high-resolution transmission electron microscope, the nucleation of full

135 At the sizes visible within transmission electron microscope they appear nearly immo

136 am dark-field images can be obtained on many transmission electron microscopes, this work should faci

137 ctron energy loss spectroscopy in a scanning transmission electron microscope to around ten millielec

138 persive spectroscopy mapping with a scanning transmission electron microscope to confirm the transiti

139 Here we use in situ heating in a scanning transmission electron microscope to observe the transfor

140 Off-axis electron holography in the transmission electron microscope was used to correlate t

141 in situ nanocompression experiments inside a transmission electron microscope we can directly observe

142 Using a transmission electron microscope, we detected a 5.7-elec

143 icles during in situ annealing in a scanning transmission electron microscope, we directly discern fi

144 imaging in an aberration-corrected scanning transmission electron microscope, we find that a single

145 By growing III-V nanowires in a transmission electron microscope, we measured the local

146 ing the electron energy-loss spectrum in the transmission electron microscope, we quantified the opti

147 in situ straining in an aberration-corrected transmission electron microscope, we report on the salie

148 current with in situ electrical biasing in a transmission electron microscope, we show that electroni

149 drogenated aluminium inside an environmental transmission electron microscope, we show that hydrogen

150 ng in situ Kr ion irradiation technique in a transmission electron microscope, we show that nanoporou

151 loaded Pt thin films under a high-resolution transmission electron microscope, we show that the plast

152 ing tomographic and holographic methods in a transmission electron microscope, we show that the three

153 d aberration correction system in a scanning transmission electron microscope, which is less sensitiv

154 a fifth-order aberration-corrected scanning transmission electron microscope, which provides a facto

155 ed using the electron beam of a conventional transmission electron microscope; which can strip away m