ライフサイエンスコーパス: ion beam

1 e surface is in sputter equilibrium with the ion beam.

2 eam would be similar to that expected for an ion beam.

3 gressive removal of material using a focused ion beam.

4 spectra were obtained using a Bi3(+) primary ion beam.

5 copy on cross-sections prepared by a focused ion beam.

6 layers were consecutively peeled off by the ion beam.

7 They are analyzed by a 500 eV Cs(+) primary ion beam.

8 or C60(2+) and, for comparison, an Ar2000(+) ion beam.

9 interrogated using a 40 keV C(60)(+) primary ion beam.

10 urfaces by TOF-SIMS using a Bi(3)(+) primary ion beam.

11 rs by removing the need to pulse the primary ion beam.

12 t transmission, and spot size of the primary ion beam.

13 film during its growth using a soft-landing ion beam.

14 glancing angles of incidence of the primary ion beam.

15 ion following continued bombardment with the ion beam.

16 sing acute exposures of monoenergetic single-ion beams.

17 stationary nuclei for nuclear reactions with ion beams.

18 reasing energy and, hence, efficiency of the ion beams.

19 during imaging experiments utilizing focused ion beams.

20 ment (SF5+) as compared to monatomic primary ion beams.

21 a function of depth by using cluster primary ion beams.

22 perturbation introduced by a focused lithium ion beam(12).

23 d by manufacturing, with the help of focused-ion-beam, a mum-scale device containing only one phase-T

24 d by scanning EM images generated by focused ion beam ablation.

25 d, which is the major distinctive feature of ion beam activation.

26 lical path surrounding the laser-accelerated ion beams, addresses these shortcomings simultaneously.

27 Ion beam analysis (IBA) is a cluster of techniques inclu

28 ents, e.g., multielemental analysis by other ion beam analysis (IBA) techniques, such as particle-ind

29 Here we present a novel application of two ion beam analysis (IBA) techniques: secondary ion mass s

30 FM), scanning electron microscopy (SEM), and ion beam analysis (IBA).

31 ion, an integrated study of ion irradiation, ion beam analysis and atomistic simulations are carried

32 We show how complementary ion beam analysis techniques, particle-induced X-ray emi

33 at were analyzed for elemental content using ion beam analysis techniques.

34 Using ion beam analysis through particle induced X-ray emissio

35 ly after spin-coating using ellipsometry and ion beam analysis, while using small angle neutron scatt

36 e-of-the-art electron microanalysis (focused ion beam and aberration-corrected transmission electron

37 ined lesions after sectioning with a focused ion beam and found that the spherical particles are comp

38 Recent work has demonstrated that focused ion beam and layer-by-layer electron-beam lithography ca

39 lter, a bending quadrupole that deflects the ion beam and prevents neutral molecules originating in t

40 ucture-cell membrane interface using focused ion beam and scanning electron microscopy (FIB-SEM).

41 cle dipping experimentation within a focused ion beam and scanning electron microscopy system, the ox

42 easing electrode tortuosity by using focused ion beam and scanning electron microscopy.

43 of the topography with regard to the primary ion beam and the electron beam azimuth.

44 tudy of the suitability of argon gas cluster ion beams (Ar-GCIBs) of general composition Ar(n)(+), wh

45 so most of the ions (>99.8%) in a continuous ion beam are lost.

46 erials that have been milled using a focused ion beam are presented.

47 High-energy ion beams are successfully used in cancer therapy and pr

48 depth profiles, especially the argon cluster ion beam, as it is characterized by a greater homogeneit

49 mination associated with thinning by focused ion beam, as well as those arising from gold fiducial ma

50 Uptake of MENPs was confirmed using focused-ion-beam assisted transmission electron microscopy (FIB-

51 nt responses over a wide spectrum by focused-ion-beam based patterning and folding of thin film nanos

52 The focused ion beam can also be used as a sculpting tool to create

53 caused during the erosion of a surface by an ion beam can lead to the formation of self-organized pat

54 reat impetus to the practical improvement of ion-beam cancer therapy and the development of more effi

55 ted into a commercial Ga(+) FIB-SEM (Focused Ion Beam combined with Scanning Electron Microscope) ins

56 r contribution measured for energetic carbon ion beams compared to proton beams can be considered an

57 Ion beams create radiation damage efficiently without ma

58 The focused and scanned ion beam creates an opportunity to analyze very small vo

59 The development of cryo-focused ion beam (cryo-FIB) for the thinning of frozen-hydrated

60 Cryo-focused-ion-beam (cryo-FIB) milling has been used to carve (micr

61 Sample thinning by cryo-focused ion beam (cryoFIB) milling has significantly expanded th

62 For (10)Be analysis, the AMS ion beam current is most adversely affected by the prese

63 tensity was revealed by comparing continuous ion beam current with the amplitude of the pulsed ion cu

64 rse and longitudinal emittance, laser-driven ion beams currently have limitations in terms of peak io

65 onal Laboratories (LLNL) indicating that AMS ion beam currents are impacted by certain elemental impu

66 der to minimize impurities that suppress AMS ion beam currents, we evaluate, using inductively couple

67 turn limited by the intensity of AMS stable ion beam currents.

68 ed on milling of materials where sub-surface ion beam damage does not inhibit device performance.

69 h vacuum (10(-7) mbar) using an electrospray ion beam deposition (ES-IBD) setup.

70 by mass-selective, soft-landing electrospray ion beam deposition and imaged by low-temperature scanni

71 e were prepared by soft-landing electrospray ion beam deposition, which allows chemical- and conforma

72 rge ratio selection in gas-phase, low-energy-ion-beam deposition into a (co-condensed) inert gas matr

73 re which determines the maximum instrumental ion beam diffusion under limited and controlled space ch

74 .3 pC/mum(2) shows a complex dependence upon ion beam dose.

75 ty amplifiers, (238)U(17)O2 and (238)U(18)O2 ion beams down to 1.6 fA have been monitored simultaneou

76 ii) the strong cell-killing effect of carbon-ion beams due to poor repair of carbon-ion beam-induced

77 Further we demonstrate that ion beams, due to their positive charging nature, may be

78 By incorporating the use of a focused ion beam during analysis, for the first time it is possi

79 progress in laser-driven quasi-monoenergetic ion beams enabled the production of uniformly heated war

80 Such ion beams exhibit unprecedented characteristics--short p

81 d by erosion of organic materials by cluster ion beams exhibits a strong dependence upon temperature.

82 dictions agree well with results from guided ion beam experiments, which find threshold energies of 1

83 Focused ion beam-extreme high-resolution scanning electron micro

84 collinear resonance ionisation at the ISOLDE ion-beam facility at CERN.

85 hy of Escherichia coli cells, that a focused ion beam (FIB) can be used to thin whole frozen-hydrated

86 terference fringes method (IFM), and focused ion beam (FIB) cross sectioning were employed as indepen

87 Focused ion beam (FIB) cutting of the apex of the ME was used to

88 Gas-Injection System (GIS) with the Focused Ion Beam (FIB) has a broad scope of applications in samp

89 milled into glass substrates with a focused ion beam (FIB) instrument, and the funnel design had a c

90 thylsiloxane (PDMS) upon exposure to focused ion beam (FIB) leading to ordered surface wrinkles.

91 single crystal of PdCoO(2) by use of focused ion beam (FIB) micro-machining, defining crystalline bal

92 le-stranded lambda-phage DNA through focused ion beam (FIB) milled nanochannels is described.

93 ryo-lamella preparation through cryo-focused ion beam (FIB) milling and correlative light microscopy

94 2)-10(3) cylindrical nanochannels by focused ion beam (FIB) milling and subsequently sandwiched betwe

95 >/=20 mum) microchannel features and focused ion beam (FIB) milling for smaller (</=10 mum) microwell

96 we describe a procedure, based upon focused ion beam (FIB) milling for the preparation of thin (200-

97 Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machi

98 pore radius (ra) were fabricated by focused ion beam (FIB) milling of silicon nitride (SiN) membrane

99 This is achieved by high-speed focused ion beam (FIB) milling though the application of a Xe(+)

100 insulate a gold-coated nanopipet and focused ion beam (FIB) milling to precisely expose a UME at the

101 ve been fabricated by postinsulation focused ion beam (FIB) milling.

102 ectro-polishing and room temperature focused ion beam (FIB) milling.

103 ray computed tomography (CT), plasma focused ion beam (FIB) scanning electron microscope (SEM) imagin

104 weakly hydrated minerals prepared as focused ion beam (FIB) sections is developed in order to combine

105 and distribution of nitrogen within focused ion beam (FIB) slices containing these nanoinclusions.

106 e detectors can be integrated into a focused ion beam (FIB) system which, assembled with scanning ele

107 e of a solid-state nanopore inside a focused-ion beam (FIB) system.

108 ulled micropipet is milled using the focused ion beam (FIB) technique to be smoother, better aligned,

109 The focused ion beam (FIB) technique was employed to precisely fabri

110 d via momentum transfer from a Xe(+) focused ion beam (FIB) to thin films of the group IV dopants pre

111 re milled into thin lamellae using a focused-ion beam (FIB).

112 particles are further analyzed with focused ion-beam (FIB) tomography, whereby a series of thin slic

113 Ion Beam Figuring (IBF), as a highly deterministic surfa

114 canning (SEM) Electron Microscopy on Focused Ion Beam foils.

115 pectrometry (TOF-SIMS) imaging using a Au(+) ion beam for analysis in conjunction with a C(60)(+) ion

116 s illustrate the successful use of a cluster ion beam for greatly enhancing the high-mass fragment io

117 for analysis in conjunction with a C(60)(+) ion beam for sputter depth profiling.

118 stals grown in viscous media using a focused ion beam for subsequent structure determination by Micro

119 Finally, the effectiveness of a C(60)(+) ion beam for use in 3D characterization of organic syste

120 r study shows feasibility to use high-energy ion beams for creation of cardiac lesions that chronical

121 the unique sputtering properties of cluster ion beams for molecular depth profiling.

122 nhance the yield and quality of laser-driven ion beams for practical applications.

123 Results showed that ion beams formed in wire sets, retained their shape with

124 d In(2)O(3)) created by direct-write focused ion beam (Ga(+)) implantation within an insulating oxide

125 ntation of proteins induced by a gas cluster ion beam (GCIB) leads to peptide cleavage producing frag

126 -micron structures, an Ar2500(+)-gas cluster ion beam (GCIB) sputter was recently engineered.

127 ToF-SIMS) using a (CO(2))(6k)(+) gas cluster ion beam (GCIB) was used to analyze Escherichia coli mut

128 tem, we demonstrate that imaging gas cluster ion beam (GCIB)-ToF-SIMS has the unique capability to si

129 onstrate the advantages of using gas cluster ion beams (GCIBs) in combination with trifluoracetic aci

130 S, through the implementation of gas cluster ion beams (GCIBs), now permit the analysis of higher mas

131 ion of new higher energy (40 kV) gas cluster ion beams (GCIBs), time-of-flight secondary ion mass spe

132 The instrument uses both helium and neon ion beams generated by a gas field ion source to irradia

133 ediated reactions, a prototype water cluster ion beam has been developed using supersonic jet expansi

134 s for the generation of ultra-high dose rate ion beams has been proposed as a prospective route.

135 t decade, buckminsterfullerene (C(60))-based ion beams have been utilized in surface analysis instrum

136 Cluster ion beams have revolutionized the analysis of organic su

137 The sharp high dose Bragg peak of a carbon-ion beam helps it to deliver the highest dosage to the m

138 al imaging approaches (including multiplexed ion beam imaging (MIBI) and imaging mass cytometry (IMC)

139 Multiplexed ion beam imaging (MIBI) is capable of analyzing up to 10

140 Combining our method with multiplexed ion beam imaging by time of flight (MIBI-TOF), we uncove

141 with spatial transcriptomics and multiplexed ion beam imaging from a series of human cSCCs and matche

142 entres in diamond nanostructures via focused ion beam implantation with approximately 32 nm lateral p

143 s sputter deposited on silver using an argon ion beam in order to investigate these parameters and to

144 the ions from the two sources into a single ion beam in the intermediate region after ion extraction

145 n-depth primer to the application of focused ion beams in biology, including a guide to the practical

146 and angiotensin II) by water cluster primary ion beams in comparison to argon cluster beams over a ra

147 Although carbon contamination induced by ion beams in target materials is a well-known issue in s

148 overed the coexistence of two isomers in the ion beam, including the one with the Al=Al double bond.

149 h periodic structure was deposited by helium ion beam induced deposition (IBID) on the surface of FNW

150 biSIMS boosts ionization yield and decreases ion-beam induced fragmentation, greatly improving the de

151 nic stopping excitations are responsible for ion beam-induced DNA damage by energetic protons and alp

152 arbon-ion beams due to poor repair of carbon-ion beam-induced DSBs regardless of EGFR mutation status

153 ionization efficiency and minimizing primary ion beam-induced fragmentation of analytes, ME-SIMS has

154 MRI and time-of-flight PET for staging, and ion beam-induced PET scanning and near-infrared fluoresc

155 nd samples may be relentlessly probed before ion-beam-induced molecular damage is observed.

156 directly in glass substrates with a focused ion beam instrument assisted by an electron flood gun.

157 e-pulse measurements, we have used a focused ion beam instrument to mill nanofluidic devices with 2,

158 closely spaced microchannels with a focused ion beam instrument, and the nanochannels had half-depth

159 In addition, low ion beam intensity counting statistics combined with Far

160 drift region, which modulates the continuous ion beam into spatially narrow packets.

161 t magnetic properties using low-dose focused ion beam irradiation is demonstrated for bilayers of two

162 ere, we report the effects of focused helium ion beam irradiation on the structural, optical and elec

163 Accelerator-based ion beam irradiation techniques have been used to study

164 Here, using a combination of ion beam irradiation, transmission electron microscopy a

165 III-V semiconductors (particularly GaSb) via ion beam irradiation.

166 on of self-organized patterns due to cluster ion beam irradiation.

167 direction perpendicular to the direction of ion beam irradiation.

168 The ion beam is generated with a microwave plasma gun instal

169 Specifically, the primary ion beam is operated as a continuous rather than a pulse

170 In this study a C60(2+) ion beam is used to depth profile a polystyrene film.

171 Here a focused ion beam is used to pattern multiple light windows on a

172 thin films by erosion with energetic cluster ion beams is a unique aspect of secondary ion mass spect

173 By multiplexing the ion beam, it is possible to successfully obtain drift ti

174 oach relies on the development of a parallel ion beam lithographic technique, which assures the time-

175 By combining template stripping with focused ion beam lithography, a variety of aperture-based near-f

176 Guided ion beam mass spectrometry (GIB-MS) employing a quadrupo

177 Evidence obtained by guided-ion-beam mass spectrometry experiments and density funct

178 Employing guided-ion-beam mass spectrometry, we identified a series of po

179 In addition, the C(60) ion beam may be focused to a spot of 1.5 microm in diame

180 rod arrays were fabricated using the focused ion beam method (denoted as fibAu_NR).

181 Here, we use a pulsed ion beam method to study defect dynamics in Si bombarded

182 Here, we use a pulsed-ion-beam method to study defect interaction dynamics in

183 Here, we use a novel pulsed-ion-beam method to study dynamic annealing in 4H-SiC ion

184 MS, accelerator MS, transmission EM, focused ion-beam microscopy, atom probe tomography, X-ray absorp

185 g of the local electric field, using focused ion beam milled defects in thin single crystal lamellae

186 r three-dimensional cryogenic SR and focused ion beam-milled block-face EM across entire vitreously f

187 Focused ion beam milling allows manipulation of the shape and si

188 structured arrays were fabricated by focused ion beam milling and their electrochemical response from

189 mydomonas cells were thinned by cryo-focused ion beam milling and then visualized by cryo-electron to

190 fects and limitations when thinning, focused ion beam milling can be used to fabricate custom geometr

191 Mapping plus focused ion beam milling combined with transmission electron mic

192 ll interior exposed by site-specific focused ion beam milling demonstrate that in-plane resolutions o

193 re formed at nanopores fabricated by focused ion beam milling of silicon nitride (SiN) membranes, ena

194 By combining cryo-focused ion beam milling of vitreous Chlamydomonas cells with cr

195 tor CeIrIn(5) We pattern crystals by focused ion beam milling to tailor the boundary conditions for t

196 lectron tomography coupled with cryo-focused ion beam milling, allowing the reconstruction of native-

197 Here, we applied cryo-focused ion beam milling, cryo-electron tomography and subtomogr

198 techniques including micromachining, focused ion beam milling, two-photon polymerization, and bottom-

199 data on cross sections, prepared by focused ion beam milling, were collected, using various electron

200 Focused ion beam milling-scanning electron microscopy showed tha

201 iconductor processing techniques and focused ion beam milling.

202 oducible plasmonic nanostructures by focused ion beam milling.

203 ricated over a glass substrate using focused ion beam milling.

204 ock, and for sequential data collection with ion beam milling; all this takes approximately 90 h.

205 f isotropic 8 nm voxels collected by focused ion-beam milling scanning electron microscopy.

206 on electron microscopy combined with focused ion-beam milling, electron diffractometry, and mu-Raman

207 ying sizes can be easily prepared by focused ion-beam milling.

208 electron microscope grid by gallium focused-ion-beam milling.

209 t equipped with an X-ray detector, a gallium-ion beam mills the particle, while the electron beam ima

210 not significantly influence parameters like ion-beam mixing or the altered-layer thickness.

211 two amino acids were detected using focused-ion-beam-modified ultrashort cantilevers.

212 The technique is based on pseudorandom ion beam modulation and three-dimensional ( x, y, t) ion

213 translate 3D-microscopy techniques (focused ion beam nanotomography, FIB-nt) typically used in the b

214 pability is not as good as large gas cluster ion beams, NO dosing comprises a useful low-cost alterna

215 The O2 gas cluster ion beam (O2-GCIB) exhibits an erosion rate comparable t

216 w nm, well below the diameter of the primary ion beam of the NanoSIMS instrument or even the best sup

217 s achieved either by ablation with a focused ion beam or by serial block face diamond knife microtomy

218 ritten in the substrate using either Focused Ion Beam or wet etching through a block co-polymer mask.

219 ive biological effectiveness (RBE) of carbon-ion beams over X-rays.

220 The introduction of polyatomic ion beams, particularly C60, for TOF-SIMS analysis has c

221 r irradiation parameters, and the subsequent ion-beam polishing enables further dimensional reduction

222 ompound into a new material using low-energy ion-beam preferential etching (IBPE).

223 nt Shubnikov-de Haas oscillations in focused-ion-beam-prepared microstructures of Cd3As2 that are con

224 Focused ion beams, previously restricted to the materials scienc

225 In order to characterize the effects of ion beam processing on the samples, we use a variety of

226 lized without the need for scanning electron/ion beam processing, UV exposure, or wet etching on targ

227 es as a technique to provide feedback on the ion beam profile.

228 An ion beam (radius approximately 50 nm) induces a picomete

229 The unique sputtering properties of the C60 ion beam result in successful molecular depth profiling

230 t]), negative pions (- pai), and helium (He) ion beams resulted in 10, 17 and 1.3 times larger Gd neu

231 Focused ion beam scanning electron microscopy (FIB-SEM) and seri

232 Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can auto

233 The recent emergence of focused ion beam scanning electron microscopy (FIB-SEM) has prov

234 e of Polykrikos kofoidii in 3D using focused ion beam scanning electron microscopy (FIB-SEM) in conju

235 , we used a combination of light and focused ion beam scanning electron microscopy (FIB-SEM) to deter

236 merging of parental genomes we used focused ion beam scanning electron microscopy (FIB-SEM) to study

237 nstrate that a new imaging modality, focused ion beam scanning electron microscopy (FIB-SEM), can be

238 l sections, electron tomography, and focused ion beam scanning electron microscopy (FIB-SEM).

239 as 'volume electron microscopy' or 'focused ion beam scanning electron microscopy (FIB/SEM)' applied

240 We demonstrate gas cluster ion beam scanning electron microscopy (SEM), in which wi

241 es, including three-dimensional (3D) focused ion beam scanning electron microscopy, we determined the

242 Focused-ion-beam scanning electron microscopy (FIB-SEM) has beco

243 Use of focused ion-beam scanning electron microscopy (FIB-SEM) to inves

244 Focused ion-beam scanning electron microscopy of infected cells

245 pecially carotenoids, and whole-cell focused ion-beam scanning-electron microscopy revealed a deficie

246 Focused ion beam, scanning and transmission electron microscopy

247 uired via e.g., nanoscale-resolution focused ion beam-scanning electron microscopy (FIB-SEM) nano-tom

248 In this paper, focused ion beam-scanning electron microscopy (FIB-SEM) nano-tom

249 /myelin-units in Anln-mutant mice by focused ion beam-scanning electron microscopy (FIB-SEM); myelin

250 Here we use two-photon imaging and focused ion beam-scanning electron microscopy to explore, at syn

251 Here, we have used focused ion beam-scanning electron microscopy to generate 3D rec

252 we demonstrate the use of dual-beam focused ion beam-scanning electron microscopy to make a complete

253 Transmission electron microscopy and focal ion beam-scanning electron microscopy with Annexin V imm

254 By utilizing focused ion beam-scanning electron microscopy with serial surfac

255 ions of mesophyll tissue obtained by focused ion beam-scanning electron microscopy.

256 Focused ion beam/scanning electron microscope tomography reveals

257 t the 3D reconstruction method using Focused Ion Beam/Scanning Electron Microscopy (FIB/SEM) can be a

258 lectron tomography, and large volume focused ion beam/scanning electron microscopy (FIB/SEM), we dete

259 Autoradiography and focused ion beam/scanning electron microscopy techniques were us

260 Here we introduce ion beam-sculpted microcantilevers that enable precise f

261 the guided etching of polymer films, focused ion-beam sculpting, and electron-beam lithography and tu

262 mical imaging of single cells by gas cluster ion beam secondary ion mass spectrometry (GCIB-SIMS) to

263 Gas cluster ion beam-secondary ion mass spectrometry (GCIB-SIMS) has

264 Incorporating gas cluster ion beam SEM into existing single-beam and multibeam SEM

265 ocumented using high-resolution cryo-focused ion beam-SEM serial imaging.

266 ather be their convolutions with the primary ion beam shape.

267 , CN(-), S(-), P(-)) due to a larger primary ion beam size.

268 or surface nanopatterned by normal incidence ion beam sputtering are age-dependent and slow down with

269 Ti-Ni-Cu ternary system were prepared using ion beam sputtering technique.

270 We report a regime of ion beam sputtering that occurs for sufficiently steep s

271 a range of materials, commonly used cluster ion beams such as C60(n+) do not yield useful depth prof

272 The introduction of polyatomic ion beams, such as C(60), has provided the associated ab

273 ed dissociation (CID) with Xe using a guided ion beam tandem mass spectrometer (GIBMS).

274 mino acids (AAs) are determined using guided ion beam tandem mass spectrometry techniques.

275 idomimetic bases are determined using guided ion beam tandem mass spectrometry techniques.

276 nd transmission electron microscopy, focused ion beam techniques, synchrotron infrared spectroscopy,

277 Recent advances in focused ion beam technology have enabled high-resolution, maskle

278 erdigital nanosized electrodes using focused ion beam technology.

279 e development of a unique 70 keV gas-cluster ion beam that consists of (CO(2) )(n) (+) (n>10 000) pro

280 robably naive to think that there will be an ion beam that will be applicable in all situations.

281 he "GCR Simulator" to generate a spectrum of ion beams that approximates the primary and secondary GC

282 Ion-beam therapy provides advances in cancer treatment,

283 r, and a quadrupole bender that deflects the ion beam, thereby preventing neutral contaminants from i

284 strain, lasers, electron injection, electron/ion beams, thermal loss of stoichiometry, and chemical t

285 We focus on using the ion beam to control the thickness of Bi2Se3 and to creat

286 nolayer MoS(2) using a sub-nm focused helium ion beam to deterministically create defects.

287 dified commercial cantilevers with a focused ion beam to optimize their properties for SMFS.

288 l and slice spacing) were acquired and (12)C ion beam treatment planning (optimal accelerator energie

289 n microscope equipped with a focused gallium ion beam, used to sequentially mill away the sample surf

290 Simultaneous detection of Fe isotope ion beams using multiple Faraday collectors facilitates

291 g and with sample cooling) and argon cluster ion beams (using Ar1500(+) ions at 5 keV).

292 ms of charged particles, such as protons and ion beams.Vortex electron beams are generated using sing

293 A C60+ ion beam was used with computer-controlled analyses and

294 e, by selectively exposing material with the ion beam, we demonstrate a simple yet highly tunable met

295 spectrometer (LIT-MS) via modulation of the ion beam with a linear frequency chirp.

296 be injected orthogonally into the analytical ion beam with independent control of both the ion and el

297 e experimental demonstration of laser-driven ion beams with narrow energy spread and energies up to 1

298 exciting applications, many of which require ion beams with simultaneous narrow energy spread and hig

299 Graphene was processed using a He(2+) ion-beam with a Gaussian distribution or by exposure to

300 time allows for the continuous selection of ion beams within a narrow range of mobilities that are f