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1 d by means of diffraction, optical and X-ray photoelectron spectroscopy.
2 including XRD, electron microscopy and X-ray photoelectron spectroscopy.
3  silicon substrate, as demonstrated by X-ray photoelectron spectroscopy.
4 croscopy, X-ray diffraction, Raman and X-ray photoelectron spectroscopy.
5  spin resonance, UV-vis-NIR, and ultraviolet photoelectron spectroscopy.
6 s decrease of Mn valence measured from X-ray photoelectron spectroscopy.
7 ing synchrotron-based ambient pressure X-ray photoelectron spectroscopy.
8 have been investigated by using negative ion photoelectron spectroscopy.
9 elative to more traditional methods based on photoelectron spectroscopy.
10 haracterized by Raman spectroscopy and X-ray photoelectron spectroscopy.
11 r transform infrared spectroscopy, and X-ray photoelectron spectroscopy.
12  the tethered catalysts, determined by X-ray photoelectron spectroscopy.
13 confirmed using elemental analysis and X-ray photoelectron spectroscopy.
14 potential of -0.75 V, as observed from X-ray photoelectron spectroscopy.
15 ements, optical/solvent exposures, and X-ray photoelectron spectroscopy.
16 n between Au and ZnO was manifested by X-ray photoelectron spectroscopy.
17 namely X-ray magnetic circular dichroism and photoelectron spectroscopy.
18 lk water, using either optical absorption or photoelectron spectroscopy.
19 determined using X-ray diffraction and X-ray photoelectron spectroscopy.
20 ized by contact angle measurements and X-ray photoelectron spectroscopy.
21 temperature-programmed desorption, and X-ray photoelectron spectroscopy.
22 red by quite different methods such as X-ray photoelectron spectroscopy.
23 NiO(x) membrane, which is confirmed by X-ray photoelectron spectroscopy.
24 ns, and synchrotron-based near ambient X-ray photoelectron spectroscopy.
25 l strain microscopy and sputter-etched X-ray photoelectron spectroscopy.
26  spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy.
27 n iron-deficient sulfide, according to X-ray photoelectron spectroscopy.
28 lms using photoluminescence, Raman and x-ray photoelectron spectroscopies.
29 crystal arrays is confirmed via infrared and photoelectron spectroscopies.
30        Nuclear magnetic resonance(11), X-ray photoelectron spectroscopy(12) and cryogenic transmissio
31                         Angle-resolved X-ray photoelectron spectroscopy analyses indicate that GNSs c
32          Evidence from high resolution X-ray photoelectron spectroscopy analyses indicated that the u
33                                        X-ray photoelectron spectroscopy analysis confirmed the presen
34                                    The X-ray photoelectron spectroscopy analysis confirms the presenc
35                                        X-ray photoelectron spectroscopy analysis of ABP and ACP confi
36 probable adsorption mechanism based on X-ray photoelectron spectroscopy analysis was also proposed in
37  calculations and further confirmed by X-ray photoelectron spectroscopy analysis.
38 d the reduction of Cr(VI) according to X-ray photoelectron spectroscopy analysis.
39                    Here, using time-resolved photoelectron spectroscopy and ab initio calculations, w
40  of a mixed B/Bi target and characterized by photoelectron spectroscopy and ab initio calculations.
41  we report the results obtained via combined photoelectron spectroscopy and ab initio studies of the
42 egradation mechanism of GaS(0.87) with X-ray photoelectron spectroscopy and annular dark-field scanni
43 ating voltage regions, as confirmed by X-ray photoelectron spectroscopy and atomic force microscopy e
44 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy and atomic force microscopy.
45 is hydrophobic ligand was confirmed by X-ray photoelectron spectroscopy and contact angle goniometry
46                       Here, a combined anion photoelectron spectroscopy and density functional theory
47 and 8-hydroxyquinoline molecules using anion photoelectron spectroscopy and density functional theory
48                                        X-ray photoelectron spectroscopy and electrochemistry confirm
49 fides has been evaluated by conducting X-ray photoelectron spectroscopy and electron microscopy studi
50 ion of oxygen defects as determined by X-ray photoelectron spectroscopy and electron paramagnetic res
51 ion, and characterized by a synergy of anion photoelectron spectroscopy and electronic structure calc
52                                  Using X-ray photoelectron spectroscopy and Fourier transform infrare
53      In the present study, we employed X-ray photoelectron spectroscopy and Fourier-transform infrare
54        Using operando ambient pressure X-ray photoelectron spectroscopy and high pressure scanning tu
55                 With the aid of experimental photoelectron spectroscopy and highly correlated ab init
56 itial CO loss as determined by in situ X-ray photoelectron spectroscopy and mass spectrometry.
57  Furthermore, valence band analysis by X-ray photoelectron spectroscopy and photoluminescence spectro
58 C-Pt-H(CO(2))](-) by a synergy between anion photoelectron spectroscopy and quantum chemical calculat
59 be H-Pt-CH(3) (-) by a synergy between anion photoelectron spectroscopy and quantum chemical calculat
60   The CoB18 (-) cluster was characterized by photoelectron spectroscopy and quantum chemistry calcula
61                                 Here, we use photoelectron spectroscopy and quantum chemistry calcula
62 on cluster (PrB7(-) ) are investigated using photoelectron spectroscopy and quantum chemistry.
63 ased on a combination of detailed core-level photoelectron spectroscopy and quantum-chemical calculat
64 (-) and ReB(2) O(-) and investigated them by photoelectron spectroscopy and quantum-chemical calculat
65 y infrared, electronic absorption, and X-ray photoelectron spectroscopy and revealed formation of a s
66 olled electron-impact irradiation with X-ray photoelectron spectroscopy and scanning electron microsc
67                                        X-ray photoelectron spectroscopy and scanning electron microsc
68 haracterized using Raman spectroscopy, X-ray photoelectron spectroscopy and scanning tunneling micros
69 ulating films of WO3 Here, we use hard X-ray photoelectron spectroscopy and spectroscopic ellipsometr
70 nd probed their structures and bonding using photoelectron spectroscopy and theoretical calculations.
71 rk, where temperature-dependent negative ion photoelectron spectroscopy and theoretical studies demon
72 r anions (Bn-) have allowed systematic joint photoelectron spectroscopy and theoretical studies, reve
73 roscopy, scanning electron microscopy, X-ray photoelectron spectroscopy and transmission electron mic
74 troscopy, powdered X-ray spectroscopy, X-ray photoelectron spectroscopy and UV-Vis diffused reflectan
75 ristics were assessed by TEM, SEM-EDX, X-ray photoelectron spectroscopy and vibrating sample magnetom
76  to bind with mercury as determined by X-ray photoelectron spectroscopy and X-ray absorption fine str
77 structural and transport measurements, X-ray photoelectron spectroscopy, and ab initio calculations a
78 ed by scanning tunneling spectroscopy, X-ray photoelectron spectroscopy, and complementary density fu
79 ere investigated by mass spectrometry, anion photoelectron spectroscopy, and computations.
80 rature scanning tunnelling microscopy, X-ray photoelectron spectroscopy, and density functional theor
81 y, grazing incident X-ray diffraction, X-ray photoelectron spectroscopy, and Fourier transform infrar
82 d using a quartz crystal microbalance, X-ray photoelectron spectroscopy, and infrared spectroscopy, s
83 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and ion-exchange measurement
84 on, by IR and Raman spectroscopy, XRD, X-ray photoelectron spectroscopy, and Mossbauer spectroscopy c
85 X-ray spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and nitrogen adsorption-deso
86  O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation of H
87 ectron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existence of v
88 heir intermediate phases of borophene; X-ray photoelectron spectroscopy, and scanning tunneling micro
89 ed reflection/absorption spectroscopy, X-ray photoelectron spectroscopy, and surface plasmon resonanc
90 uded size, surface charge, morphology, X-ray photoelectron spectroscopy, and transmission Fourier tra
91 nance spectroscopy, mass spectrometry, X-ray photoelectron spectroscopy, and X-ray absorption spectro
92 scopic images before and after growth, x-ray photoelectron spectroscopy, and x-ray diffraction invest
93 n microscopy, ultra violet-visible and X-ray photoelectron spectroscopy, and Zeta-potential.
94                 Using ambient-pressure X-ray photoelectron spectroscopy (AP-XPS), we studied the adso
95 IF) spectrometry, and ambient-pressure X-ray photoelectron spectroscopy (AP-XPS).
96                       Ambient-pressure X-ray photoelectron spectroscopy (APXPS) and high-pressure sca
97 um mechanics (QM) and ambient-pressure X-ray photoelectron spectroscopy (APXPS) experiments.
98    Here, we show that ambient pressure X-ray photoelectron spectroscopy (APXPS) with a conventional X
99 s was performed using ambient pressure X-ray photoelectron spectroscopy (APXPS), Fourier transform in
100 vanced in situ electron microscopy and X-ray photoelectron spectroscopy are used to demonstrate that
101 (23)Na solid-state NMR, Mossbauer, and X-ray photoelectron spectroscopies, are employed as probes of
102                               Angle-resolved photoelectron spectroscopy (ARPES) is used to study thes
103 icrographs, x-ray diffraction spectra, x-ray photoelectron spectroscopy, as well as TFT output and tr
104 al organic films was analyzed by ultraviolet photoelectron spectroscopy at room temperature.
105 immobilization, which was confirmed by X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and
106 ound molecules through high-resolution X-ray photoelectron spectroscopy, atomic force microscopy, and
107                                              Photoelectron spectroscopy confirms that Ag acts as a p-
108 ay diffraction, magnetic measurements, X-ray photoelectron spectroscopy, cyclic voltammetry, and dens
109  Temperature-programmed desorption and X-ray photoelectron spectroscopy data provide information abou
110    We employed microwave conductivity, X-ray photoelectron spectroscopy, diffuse reflectance spectros
111 eparation was directly proved by ultraviolet photoelectron spectroscopy, electrochemical impedance sp
112 mbining inelastic tunneling spectroscopy, UV photoelectron spectroscopy, electronic structure calcula
113                                        X-ray photoelectron spectroscopy, EPR, and magnetometry suppor
114                    UV-Vis, far-IR, and X-ray photoelectron spectroscopies evidence the reduction of H
115 xposed samples were investigated using X-ray photoelectron spectroscopy, Fourier transform infrared s
116 r at surfaces and interfaces, angle-resolved photoelectron spectroscopy has become a core technique i
117                                 Negative-ion photoelectron spectroscopy has shown the adiabatic detac
118 m interface, performed using liquid microjet photoelectron spectroscopy, has been interpreted to sugg
119 he trade include near-ambient-pressure X-ray photoelectron spectroscopy, high-pressure scanning tunne
120 ully studied by X-ray crystallography, X-ray photoelectron spectroscopy, hydrogen evolution experimen
121 reduced and characterized by Raman and X-ray photoelectron spectroscopies in addition to microscopies
122 y forming the Mo Se bond, confirmed by X-ray photoelectron spectroscopy, in which the formed MoSe(2)
123     Experiments using ambient pressure X-ray photoelectron spectroscopy indicate that methane dissoci
124                                        X-ray photoelectron spectroscopy indicated that the predominan
125 d by transmission electron microscopy, X-ray photoelectron spectroscopy, infrared spectra, ultraviole
126                 Using ambient pressure X-ray photoelectron spectroscopy interpreted with quantum mech
127                                        X-ray photoelectron spectroscopy invariably detected elemental
128 s of the foam were characterized using X-ray photoelectron spectroscopy, inverse gas chromatography,
129                        Recent angle-resolved photoelectron spectroscopy investigations provided insig
130 Combined with in situ ambient-pressure X-ray photoelectron spectroscopy, IR, and Raman spectroscopic
131                                   Hard-x-ray photoelectron spectroscopy is a valuable source of infor
132                               Finally, X-ray photoelectron spectroscopy is used to characterize the P
133              Here we report liquid jet X-ray photoelectron spectroscopy measurements that provide dir
134 A combination of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) and CO temperature-
135            Using near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) we show that a time
136 ctroscopy and by near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS).
137 lectrochemistry, synchrotron radiation-X-ray photoelectron spectroscopy, near edge X-ray absorption f
138 (-) anions were investigated by negative ion photoelectron spectroscopy (NIPES) along with high-resol
139 nvestigated in the gas phase by negative-ion photoelectron spectroscopy (NIPES), velocity-map imaging
140  in the AuNP suspensions, as judged by X-ray photoelectron spectroscopy, nuclear magnetic resonance e
141                                        X-ray photoelectron spectroscopy of C 1s and Br 3d core levels
142                                              Photoelectron spectroscopy of microjets expanded into va
143 quantum state specificity by high-resolution photoelectron spectroscopy of the vinylidene anions H2CC
144                                        X-ray photoelectron spectroscopy of these electrochemically tr
145                In situ, depth-resolved X-ray photoelectron spectroscopy of various graphene-coated tr
146                              Raman and X-ray photoelectron spectroscopy on BN films show no significa
147  by means of operando ambient-pressure X-ray photoelectron spectroscopy performed at the solid/liquid
148 ro charge by means of ambient pressure X-ray photoelectron spectroscopy performed under polarization
149 troscopy, scanning tunneling microscopy, and photoelectron spectroscopy provide unique information ab
150                                        X-ray photoelectron spectroscopy, Raman microscopy and spectro
151                                        X-ray photoelectron spectroscopy, Raman spectroscopy, together
152                      DFT calculations, X-ray photoelectron spectroscopy, Raman, and FTIR show that th
153                                        X-ray photoelectron spectroscopy recommends the chemical inter
154                                    The X-ray photoelectron spectroscopy results indicated that Fe(0)
155                          Moreover, the X-ray photoelectron spectroscopy results show that the valence
156 g and predominated the powder surface (X-ray photoelectron spectroscopy results) in both camel and bo
157 ay absorption spectroscopy and ex situ X-ray photoelectron spectroscopy reveal that PbO(2) is unpertu
158 nctional theory calculations and ultraviolet photoelectron spectroscopy reveal that the effective wor
159 oscopy together with ex situ Raman and X-ray photoelectron spectroscopy reveal the reversibility of m
160                                        X-ray photoelectron spectroscopy revealed significant core-lev
161                                        X-ray photoelectron spectroscopy revealed that an effective mo
162                                        X-ray photoelectron spectroscopy revealed that the hydroxyl gr
163                               Angle-resolved photoelectron spectroscopy reveals a quasi-1D valence ba
164                                        X-ray photoelectron spectroscopy reveals that, at pH </= 3.5,
165 upled with atomic force microscopy and X-ray photoelectron spectroscopy reveals the architectures to
166               In situ ambient pressure X-ray photoelectron spectroscopy reveals up to a fourfold enha
167  formation of the SAM was confirmed by X-ray photoelectron spectroscopy, scanning electron microscopy
168 urier transform infrared spectroscopy, X-ray photoelectron spectroscopy, scanning electron microscopy
169 s formation are elucidated by means of X-Ray photoelectron spectroscopy, scanning transmission electr
170 samples on SiC(000) combining angle-resolved photoelectron spectroscopy, scanning tunneling microscop
171 yst during the reaction, quasi in situ X-ray photoelectron spectroscopy showed that the surface is me
172                       Ambient-pressure x-ray photoelectron spectroscopy showed that water added to me
173 scopy (AFM), and synchrotron radiation-X-ray photoelectron spectroscopy (SR-XPS) were used to elucida
174 razing incidence x-ray diffraction and x-ray photoelectron spectroscopy studies indicating that the f
175      X-ray absorption spectroscopy and X-ray photoelectron spectroscopy studies of SNNO/LSMO heterost
176 aramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggest that the chem
177 aramagnetic resonance spectroscopy and X-ray photoelectron spectroscopy studies suggested that the ch
178                UV-vis spectroscopy and X-ray photoelectron spectroscopy suggest that a substituent's
179                                        X-ray photoelectron spectroscopy suggests that NaCu(4)Se(4) is
180 mined using a novel approach combining X-ray photoelectron spectroscopy, surface tension measurements
181          Through X-ray diffraction and X-ray photoelectron spectroscopy, the as-grown tungsten(VI) su
182 trospray ionization mass spectrometry, X-ray photoelectron spectroscopy, thermogravimetric analysis a
183 rcame this limitation by applying soft x-ray photoelectron spectroscopy to characterize excess electr
184 nization aerosol mass spectrometry and X-ray photoelectron spectroscopy to confirm these predictions.
185           We employed ambient pressure X-ray photoelectron spectroscopy to investigate the electronic
186 d X-ray diffraction, and Mossbauer and X-ray photoelectron spectroscopy to investigate their morpholo
187 8H8I2) produces m-C8H8 in gas phase; we used photoelectron spectroscopy to probe the first two electr
188 hanges in the physical properties of SAMs to photoelectron spectroscopy to unambiguously assign bindi
189 th temperature, temperature-programmed X-ray photoelectron spectroscopy (TP-XPS) experiments are perf
190          Scanning electron microscopy, X-ray photoelectron spectroscopy, transmission electron micros
191 e scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy, transmission infrared spectr
192 onal spectroscopy and ambient pressure X-ray photoelectron spectroscopy under catalytically relevant
193 mbient conditions and (ii) contactless X-ray photoelectron spectroscopy under ultrahigh vacuum.
194 evel offset (epsilon(h)(UPS)) by ultraviolet photoelectron spectroscopy (UPS) for CnT and CnDT SAMs a
195 asurements of epsilon(h)(UPS) by ultraviolet photoelectron spectroscopy (UPS) for OPT n and OPD n SAM
196 lectrical conductors and exhibit ultraviolet-photoelectron spectroscopy (UPS) signatures expected of
197  soft X-ray scattering (R-SoXS); ultraviolet photoelectron spectroscopy (UPS); Fourier transform-infr
198 X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, UV-vis absorption spectra, a
199                                        X-ray photoelectron spectroscopy was used to characterize the
200 properties with degree of functionalization, photoelectron spectroscopy was used to map the occupied
201 r the metallic glasses, measured using X-ray photoelectron spectroscopy, was higher by 0.2 eV to 0.4
202 ering beyond the dipole limit and hard X-ray photoelectron spectroscopy we establish the dual nature
203 circular dichroism, combined with hard X-ray photoelectron spectroscopy, we derived a complete pictur
204   Using femtosecond time-resolved two-photon photoelectron spectroscopy, we determine (i) the vertica
205 LTS reaction, as well as complementary X-ray photoelectron spectroscopy, we observed the activation a
206  using ambient-pressure X-ray absorption and photoelectron spectroscopy, we proved that the dominant
207                      Applying angle-resolved photoelectron spectroscopy, we show that the silicon sur
208 croscopy, X-ray diffraction, Raman and X-ray photoelectron spectroscopy were employed to characterize
209  transmission electron microscopy, and X-ray photoelectron spectroscopy were used to understand the n
210        A powerful approach is angle-resolved photoelectron spectroscopy, whereby the kinetic energy a
211  method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive).
212 layer on the surface, as determined by X-ray photoelectron spectroscopy, which likely prevented furth
213                  Here we apply time-resolved photoelectron spectroscopy with a seeded extreme ultravi
214       Here we combine ambient pressure X-ray photoelectron spectroscopy with quantum mechanics to exa
215                    In situ techniques (X-ray photoelectron spectroscopy, X-ray absorption spectroscop
216 mbination of powder X-ray diffraction, X-ray photoelectron spectroscopy, X-ray fluorescence spectrosc
217 ilms before and after the treatment by X-ray photoelectron spectroscopy (XPS) also evidencing the cor
218 y ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) analyses indicated bind
219                                        X-ray photoelectron spectroscopy (XPS) analysis results showed
220                                        X-ray photoelectron spectroscopy (XPS) analysis revealed that
221  Report, Nakamura et al argue that our x-ray photoelectron spectroscopy (XPS) analysis was affected b
222  as a valuable tool when combined with X-ray photoelectron spectroscopy (XPS) analysis.
223 t X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS) and atomic multiplet cl
224                                        X-ray photoelectron spectroscopy (XPS) and attenuated total re
225                                        X-ray photoelectron spectroscopy (XPS) and electrochemical imp
226 isms are also investigated in terms of X-ray photoelectron spectroscopy (XPS) and electrochemical mea
227 s of CMP are proposed according to the X-ray photoelectron spectroscopy (XPS) and electrochemical mea
228                                        X-ray photoelectron spectroscopy (XPS) and electron microprobe
229 led plasma-mass spectrometry (ICP-MS), X-ray photoelectron spectroscopy (XPS) and Fourier-transform i
230 cterization of the prepared samples by X-ray photoelectron spectroscopy (XPS) and optimization of the
231  substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiati
232 ystem performance is validated through X-ray photoelectron spectroscopy (XPS) and the spatial distrib
233 iosensor surfaces were optimized using X-ray photoelectron spectroscopy (XPS) and the ultra-high freq
234 ution interface, and observe with both X-ray photoelectron spectroscopy (XPS) and XUV-RA the existenc
235 scopy (FTIR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and zeta potential meas
236 entified by fitting of high-resolution X-ray photoelectron spectroscopy (XPS) C 1s and O 1s spectra.
237 nning electron microscopy (FE-SEM) and X-ray photoelectron spectroscopy (XPS) characterization result
238                                        X-ray photoelectron spectroscopy (XPS) characterized a transie
239 dded within the polymer matrix, whilst X-ray Photoelectron Spectroscopy (XPS) confirmed that they exi
240   Infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS) confirmed the role of p
241   Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate formation o
242   Nuclear magnetic resonance (NMR) and X-ray photoelectron spectroscopy (XPS) demonstrate the covalen
243  during the biosensor construction and X-ray photoelectron spectroscopy (XPS) experiments confirmed c
244 ure published data obtained by in situ X-ray photoelectron spectroscopy (XPS) for the concentration o
245  studied for their HER activity and by X-ray photoelectron spectroscopy (XPS) for the first time; MoB
246 g Microscopy (STM) in combination with X-ray Photoelectron spectroscopy (XPS) has been utilized to ch
247 electron microscopy (PEEM) and imaging X-ray photoelectron spectroscopy (XPS) have over the years bee
248                                        X-ray photoelectron spectroscopy (XPS) is one of the most used
249 IPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows estimation
250                                        X-ray photoelectron spectroscopy (XPS) measurements confirms n
251 asma-Mass Spectrometry (LA-ICP-MS) and X-ray photoelectron spectroscopy (XPS) measurements, which wer
252 sy carbon electrode (GCE), as shown by X-ray photoelectron spectroscopy (XPS) measurements.
253 ed here using a combination of SPR and X-ray photoelectron spectroscopy (XPS) measurements.
254                                Ex situ X-ray photoelectron spectroscopy (XPS) of the 2-ABT modified e
255                              Raman and X-Ray photoelectron spectroscopy (XPS) revealed that the synth
256 ) While surface characterization using X-ray photoelectron spectroscopy (XPS) showed the presence of
257 Fourier transform infrared (FTIR), and X-ray photoelectron spectroscopy (XPS) spectroscopy confirmed
258 cterizations by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) support the presence of
259  study were to evaluate the ability of X-ray photoelectron spectroscopy (XPS) to differentiate rice m
260 troscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) were employed for ligni
261        Zeta potential measurements and X-ray photoelectron spectroscopy (XPS) were used to analyse th
262 ray absorption spectroscopy (XAS), and X-ray photoelectron spectroscopy (XPS) were used to determine
263 y-dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and (10)B and (11)B so
264 ransmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS), and Nanoparticle Size
265 -ray spectroscopy (EDS), quasi in situ X-ray photoelectron spectroscopy (XPS), and operando X-ray abs
266 sion electron microscopy (HAADF-STEM), X-ray photoelectron spectroscopy (XPS), and powder X-ray diffr
267 , X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS), and Raman microscopy.
268 ysis, UV-vis, energy-dispersive X-ray, X-ray photoelectron spectroscopy (XPS), attenuated total refle
269            Various techniques, such as X-ray photoelectron spectroscopy (XPS), confirmed the occurren
270  spectroscopy, photoluminescence (PL), x-ray photoelectron spectroscopy (XPS), Fourier transform infr
271 ombination of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), in-field Mossbauer spe
272                Fluorescence detection, X-ray photoelectron spectroscopy (XPS), infrared spectra (FT-I
273 es have been determined by synchrotron X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorp
274 ional theory (DFT), ion chromatograph, X-ray photoelectron spectroscopy (XPS), particle size analysis
275 d triclosan in batch experiments using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, an
276 ochemical exposure in combination with X-ray photoelectron spectroscopy (XPS), scanning electron micr
277 odified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), scanning electron micr
278 riate MOFs (MTV-MOFs) were examined by X-ray photoelectron spectroscopy (XPS), ultraviolet-visible di
279 opy, X-ray diffraction analysis (XRD), X-ray photoelectron spectroscopy (XPS), UV-Vis-NIR spectroscop
280 ure characterization methods including X-ray photoelectron spectroscopy (XPS), V and S X-ray absorpti
281 erometry, cyclic voltammetry (CV), and X-ray photoelectron spectroscopy (XPS), we demonstrate that hi
282 ransmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD
283 ng was observed based on quasi in situ X-ray photoelectron spectroscopy (XPS).
284 ed by UV, circular dichroism (CD), and X-ray photoelectron spectroscopy (XPS).
285 ng electron microscopy (SEM) and Fe 2p X-ray photoelectron spectroscopy (XPS).
286 er (VSM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS).
287 ), surface plasmon resonance (SPR) and X-ray photoelectron spectroscopy (XPS).
288 mission electron microscopy (TEM), and X-ray photoelectron spectroscopy (XPS).
289 iO2 powder using near-ambient-pressure X-ray photoelectron spectroscopy (XPS).
290 smission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS).
291 mly modified columns were assessed via X-ray photoelectron spectroscopy (XPS).
292 aracterized by electrochemistry and by X-ray photoelectron spectroscopy (XPS).
293 -ray absorption spectroscopy (XAS) and X-ray photoelectron spectroscopy (XPS).
294 neling microscopy and spectroscopy and X-ray photoelectron spectroscopy (XPS).
295 flection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS).
296 n and Brunauer Emmett-Teller (BET) and X-ray Photoelectron Spectroscopy (XPS).
297 sform infrared spectroscopy (FTIR) and X-ray photoelectron spectroscopy (XPS).
298 ), powder X-ray diffraction (PXRD) and X-ray photoelectron spectroscopy (XPS).
299 ochemical mass spectrometry (OEMS) and X-ray photoelectron spectroscopy (XPS).
300 hment on the compacts was confirmed by X-ray photoelectron spectroscopy (XPS).

 
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